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Probe Product List and Ranking from 41 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Aug 27, 2025～Sep 23, 2025
This ranking is based on the number of page views on our site.

Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Aug 27, 2025～Sep 23, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社　＆　GEエナジー・ジャパン株式会社 Tokyo//Testing, Analysis and Measurement
  3. ヴァイサラ Tokyo//Testing, Analysis and Measurement
  4. 4 ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement
  5. 5 精研 本社 Tokyo//Electronic Components and Semiconductors
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Probe Product ranking

Last Updated： Aggregation Period:Aug 27, 2025～Sep 23, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社
  4. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社
  5. 5 Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社

Probe Product List

226～240 item / All 657 items

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Bear Board Tester Probe "C-0.38 Series"

Bear Board Tester Probe "C-0.38 Series"

Introducing contact probes compatible with a 0.7mm pitch, highly regarded worldwide!

At Nippon Denshin, we mainly manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" provide highly reliable products to the electronics industry, backed by many years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-0.38 series' is a probe for bare board testers compatible with a 0.7mm pitch. 【Features】 ■ Compatible with 0.7mm pitch ■ Five types of tip shapes ■ Lead wire processing for sockets is also possible ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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Probe for Bear Board Tester "C-0.72 Series"

Probe for Bear Board Tester "C-0.72 Series"

Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!

At Nippon Denshin, we primarily manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" supply highly reliable products to the electronics industry, backed by years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-0.72 series' is a probe for bare board testers compatible with a 1.27mm pitch. 【Features】 ■ Compatible with 1.27mm pitch ■ 9 types of tip shapes ■ Thorough quality control ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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Selection Guide "Probe Selection Method"

Selection Guide "Probe Selection Method"

We are currently offering a guide that clearly explains the method for selecting probes with illustrations.

Japan Electric Needle offers a variety of contact probes for printed circuit board inspection, ranging from ultra-fine types to large types, and is distributing a "Probe Selection Method." 【Selection Procedure】 1. Check the pitch 2. Confirm the total length and distance to the target 3. Choose the tip shape 4. Determine the spring pressure We provide clear explanations with illustrations and tables. *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Inspection fixture
  • Processing Jig

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High current probe "HC100 series" with a rated current of 12A.

High current probe "HC100 series" with a rated current of 12A.

Introducing a high current probe compatible with a 2.54mm pitch and rated for a current of 12A.

This is a new product from Nippon Denshin Co., Ltd., which has contributed to the development of the electronics industry, including contact probes, through years of experience, achievements, and a wealth of accumulated technology. It has a rated current of 12A and a shape similar to the commonly used 100mil probes. 【Specifications】 <Material and Surface Treatment> ■ Plunger: BeCu with Ni undercoating and Au plating ■ Spring: SUS ■ Sleeve: Phosphor bronze with Ni undercoating and Au plating ■ Socket: BST or Pb with Ni undercoating / Au plating <Compatible Sockets> ■ C-07-S8-N ■ C-1.37Q-S-1A Au *For more details, please request documentation or view the PDF data available for download.

  • Processing Jig
  • probe

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Wire Probe "NW Series"

Wire Probe "NW Series"

Supports a minimum pitch of 0.11mm. Specification changes to match the shape of the device are also acceptable.

The "NW Series" is a wire probe designed for ultra-narrow pitch contacts. We offer three types: Φ0.07mm, Φ0.09mm, and Φ0.11mm. It strokes through "flexibility" and does not have a complex mechanism, enabling contact in narrow pitches that are difficult to achieve with spring probes. We also accommodate specification changes to match the shape of the device. It can be provided as a single unit or as a complete set with fixtures. 【Features】 ■ Compatible with wiring extraction ■ Two types of tip shapes available ■ Wide range of needs addressed from design to manufacturing *For more details, please refer to the documentation. Feel free to contact us with any inquiries.

  • others

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Needle Probe [For Printed Circuit Boards and Semiconductor Package Continuity Testing Tool!]

Needle Probe [For Printed Circuit Boards and Semiconductor Package Continuity Testing Tool!]

Needle probes suitable for continuity testing fixtures for substrates (printed circuit boards and semiconductor packages)! Precision machining with a focus on quality!

The "NP (Needle Probe)" is a probe used for continuity testing fixtures of substrates (printed circuit boards and semiconductor packages). We offer a wide variety of tip shapes backed by reliable processing technology. Additionally, we have applied a plating treatment that is resistant to peeling. 【Features】 ■ Meticulous fine processing ■ Sharp edges ■ Step coating that pursues uniqueness (optional) *For more details, please request our materials or view the PDF data available for download.

  • probe

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Contact Probe

Contact Probe

Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!

We offer a wide variety of "contact probes," including high-frequency compatible probes, heat-resistant probes, coaxial probes, and ultra-fine probes (φ0.2 and above). Additionally, we can manufacture custom-made probes that are optimal for the shape of your device, so please feel free to consult us if you have any requests. 【Product Lineup】 ■ KHP-001 to 30 Series ■ KHS Series ■ KH-007 Series ■ KH-700 Series ■ KH-2000 Series, etc. *For more details, please download the PDF or feel free to contact us.

  • probe

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Vane-type wind speed smart probe 'testo410i' [Rental]

Vane-type wind speed smart probe 'testo410i' [Rental]

Wireless probe capable of measuring and recording wind speed and temperature via Bluetooth communication.

Equipped with convenient calculation modes for various applications such as duct air volume measurement, it allows for easy input of duct information. 【Features】 ■ Displays measurement values on Android/iOS devices (smartphones and tablets) ■ Connects up to 6 probes with a single device for simultaneous measurements ■ Capable of graphing measurement data, saving (Android only), and sending via email ■ Easy setting of duct information in air volume calculation mode ■ Dedicated app available for download from Google Play and the App Store (free)

  • Wind Speed/Volume Meter

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Contract assembly and processing of semiconductors: LED chip probe

Contract assembly and processing of semiconductors: LED chip probe

We measure electrical characteristics, brightness, wavelength, and ESD. Inspections are conducted in wafer and sheet states, accommodating various specifications such as top surfaces and upper and lower electrodes!

Measurement of electrical characteristics, brightness, wavelength, and ESD. Depending on the supply form, inspections can be conducted in wafer or sheet state, accommodating various specifications such as top surface and upper and lower electrodes. Additionally, if probe testing is required from mass production to small quantities of prototypes, please feel free to consult us. 【Overview】 ■ Top surface and upper/lower electrodes: 2 to 4 inches ■ Back surface: 2 to 4 inches ■ Integrating sphere: 2 to 4 inches *For more details, please refer to the PDF document or feel free to contact us.

  • Chip type LED

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"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

From narrow pitch measurements of 0.05 mm to high current power semiconductors.

The stacked probe, being a single part, has no structural conductive loss, allowing for direct measurement of current values and achieving stable contact resistance values. Additionally, it can accommodate a minimum pitch of 0.05 mm, enabling Kelvin measurements using narrow pitches and ensuring stable measurements. The excellent characteristics of the stacked probe not only allow for the arrangement of probes in narrow pitches but also demonstrate performance as a probe for power semiconductors that apply large currents. 【Features】 ■ Stable contact resistance values provide powerful precision measurements. ■ Capable of handling large currents and high voltages, contributing to application and measurement for power semiconductors. ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch). ■ Adjustable contact load. 【Examples】 ◎ Contacting in narrow pitches and multiple points. ◎ Ensures reliable contact with BGA for stable Kelvin measurements. ◎ Provides stable contact with lead frames of solder plating. ◎ Suitable for narrow spaces (for LED inspection equipment). *You can view examples from the PDF. Please feel free to contact us for more details.

  • probe

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Special Probe "Sure Turn Probe"

Special Probe "Sure Turn Probe"

Solve issues such as variations in resistance values!

This is an original probe that utilizes innovative technology. Conventional general straight probes have a simple internal structure, which often leads to significant variations in resistance values during circuit measurements on printed circuit boards, and sometimes even causes momentary disconnections. It is said to be one of the causes of frequent troubles during tens of thousands or hundreds of thousands of tests. The SureTurn probe is a product developed to address this issue. *For more details, please download the PDF or contact us.

  • probe

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Special Probe "Zebra Type Probe"

Special Probe "Zebra Type Probe"

Revolutionary simple probe! Enables high-capacity device measurements at 20GHz!

This is an original probe that utilizes innovative technology. With the increase in signal capacity of electronic devices, it has become difficult to measure using conventional methods. By challenging this limitation and conducting extensive research, we have succeeded in bringing this product to market. Previously, when inspection jigs deteriorated or broke, they had to be disassembled and repaired. However, the zebra-type probe allows for easy extraction and replacement of the probe without disassembling fixtures, and it is a groundbreaking simple probe that enables 20GHz measurements for high-capacity signal devices. *For more details, please download the PDF or contact us.*

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Layered probe "High current, multi-point layered probe (patented technology)"

Layered probe "High current, multi-point layered probe (patented technology)"

As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.

This is a probe developed with innovative technology, featuring excellent characteristics. We have developed a multi-point laminated probe specifically for power semiconductors, applying the characteristics of a laminated structure consisting of metal plates (probes) and insulators. 【Features】 - The probe tip is shaped like a wave, allowing contact with the semiconductor at multiple points. This disperses the amount of current and voltage applied, reducing the burden on the semiconductor. - It can move vertically by about 1 millimeter, minimizing contact marks. - Its compact design makes it easy to secure installation space. *For more details, please download the PDF or contact us.

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High-frequency (millimeter wave) probe "coaxial shield probe"

High-frequency (millimeter wave) probe "coaxial shield probe"

For partial electrode support such as probe cards!

We offer probes designed with consideration for the conditions of high-frequency measurements, enabling highly accurate measurements. With the increasing circuit density of semiconductor devices, there is particularly growing demand for high-frequency measurements in the MHz range. They are said to be suitable for partial electrode applications such as probe cards and are widely used, with orders now being placed in various fields, including medical applications. *For more details, please download the PDF or contact us.*

  • probe

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