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Probe - メーカー・企業154社の製品一覧とランキング

更新日： 集計期間:Oct 15, 2025～Nov 11, 2025
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Probeのメーカー・企業ランキング

更新日： 集計期間:Oct 15, 2025～Nov 11, 2025
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  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テイエスエスジャパン Tokyo//Industrial Electrical Equipment
  3. ウェーブクレスト Saitama//Industrial Electrical Equipment
  4. 4 テクノプローブ Chiba//Testing, Analysis and Measurement
  5. 5 TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
企業ランキングへ

Probeの製品ランキング

更新日： 集計期間:Oct 15, 2025～Nov 11, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Examples of probes for electromagnetic and eddy current thickness gauges.
  5. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

Probeの製品一覧

241～255 件を表示 ／ 全 664 件

表示件数
Contact Probe

Contact Probe

Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!

We offer a wide variety of "contact probes," including high-frequency compatible probes, heat-resistant probes, coaxial probes, and ultra-fine probes (φ0.2 and above). Additionally, we can manufacture custom-made probes that are optimal for the shape of your device, so please feel free to consult us if you have any requests. 【Product Lineup】 ■ KHP-001 to 30 Series ■ KHS Series ■ KH-007 Series ■ KH-700 Series ■ KH-2000 Series, etc. *For more details, please download the PDF or feel free to contact us.

  • probe

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Vane-type wind speed smart probe 'testo410i' [Rental]

Vane-type wind speed smart probe 'testo410i' [Rental]

Wireless probe capable of measuring and recording wind speed and temperature via Bluetooth communication.

Equipped with convenient calculation modes for various applications such as duct air volume measurement, it allows for easy input of duct information. 【Features】 ■ Displays measurement values on Android/iOS devices (smartphones and tablets) ■ Connects up to 6 probes with a single device for simultaneous measurements ■ Capable of graphing measurement data, saving (Android only), and sending via email ■ Easy setting of duct information in air volume calculation mode ■ Dedicated app available for download from Google Play and the App Store (free)

  • Wind Speed/Volume Meter

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Electromagnetic Thickness Probe 'Fe-20' for Film Thickness Gauge SWT [Rental]

Electromagnetic Thickness Probe 'Fe-20' for Film Thickness Gauge SWT [Rental]

This is an electromagnetic probe for SWT-8000-2, 9000, and 8200-2.

Measurement range: 0 to 20mm

  • Coating thickness gauge

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Contract assembly and processing of semiconductors: LED chip probe

Contract assembly and processing of semiconductors: LED chip probe

We measure electrical characteristics, brightness, wavelength, and ESD. Inspections are conducted in wafer and sheet states, accommodating various specifications such as top surfaces and upper and lower electrodes!

Measurement of electrical characteristics, brightness, wavelength, and ESD. Depending on the supply form, inspections can be conducted in wafer or sheet state, accommodating various specifications such as top surface and upper and lower electrodes. Additionally, if probe testing is required from mass production to small quantities of prototypes, please feel free to consult us. 【Overview】 ■ Top surface and upper/lower electrodes: 2 to 4 inches ■ Back surface: 2 to 4 inches ■ Integrating sphere: 2 to 4 inches *For more details, please refer to the PDF document or feel free to contact us.

  • Chip type LED

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Oscilloscope Probe OP-022 sets

Oscilloscope Probe OP-022 sets

It is a 10:1 passive voltage probe with a bandwidth of 100MHz.

It is a 10:1 passive voltage probe for 100MHz.

  • others

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"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

From narrow pitch measurements of 0.05 mm to high current power semiconductors.

The stacked probe, being a single part, has no structural conductive loss, allowing for direct measurement of current values and achieving stable contact resistance values. Additionally, it can accommodate a minimum pitch of 0.05 mm, enabling Kelvin measurements using narrow pitches and ensuring stable measurements. The excellent characteristics of the stacked probe not only allow for the arrangement of probes in narrow pitches but also demonstrate performance as a probe for power semiconductors that apply large currents. 【Features】 ■ Stable contact resistance values provide powerful precision measurements. ■ Capable of handling large currents and high voltages, contributing to application and measurement for power semiconductors. ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch). ■ Adjustable contact load. 【Examples】 ◎ Contacting in narrow pitches and multiple points. ◎ Ensures reliable contact with BGA for stable Kelvin measurements. ◎ Provides stable contact with lead frames of solder plating. ◎ Suitable for narrow spaces (for LED inspection equipment). *You can view examples from the PDF. Please feel free to contact us for more details.

  • probe

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Special Probe "Sure Turn Probe"

Special Probe "Sure Turn Probe"

Solve issues such as variations in resistance values!

This is an original probe that utilizes innovative technology. Conventional general straight probes have a simple internal structure, which often leads to significant variations in resistance values during circuit measurements on printed circuit boards, and sometimes even causes momentary disconnections. It is said to be one of the causes of frequent troubles during tens of thousands or hundreds of thousands of tests. The SureTurn probe is a product developed to address this issue. *For more details, please download the PDF or contact us.

  • probe

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Special Probe "Zebra Type Probe"

Special Probe "Zebra Type Probe"

Revolutionary simple probe! Enables high-capacity device measurements at 20GHz!

This is an original probe that utilizes innovative technology. With the increase in signal capacity of electronic devices, it has become difficult to measure using conventional methods. By challenging this limitation and conducting extensive research, we have succeeded in bringing this product to market. Previously, when inspection jigs deteriorated or broke, they had to be disassembled and repaired. However, the zebra-type probe allows for easy extraction and replacement of the probe without disassembling fixtures, and it is a groundbreaking simple probe that enables 20GHz measurements for high-capacity signal devices. *For more details, please download the PDF or contact us.*

  • probe

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Layered probe "High current, multi-point layered probe (patented technology)"

Layered probe "High current, multi-point layered probe (patented technology)"

As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.

This is a probe developed with innovative technology, featuring excellent characteristics. We have developed a multi-point laminated probe specifically for power semiconductors, applying the characteristics of a laminated structure consisting of metal plates (probes) and insulators. 【Features】 - The probe tip is shaped like a wave, allowing contact with the semiconductor at multiple points. This disperses the amount of current and voltage applied, reducing the burden on the semiconductor. - It can move vertically by about 1 millimeter, minimizing contact marks. - Its compact design makes it easy to secure installation space. *For more details, please download the PDF or contact us.

  • probe

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High-frequency (millimeter wave) probe "coaxial shield probe"

High-frequency (millimeter wave) probe "coaxial shield probe"

For partial electrode support such as probe cards!

We offer probes designed with consideration for the conditions of high-frequency measurements, enabling highly accurate measurements. With the increasing circuit density of semiconductor devices, there is particularly growing demand for high-frequency measurements in the MHz range. They are said to be suitable for partial electrode applications such as probe cards and are widely used, with orders now being placed in various fields, including medical applications. *For more details, please download the PDF or contact us.*

  • probe

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High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

It is possible to reduce high-frequency loss and direct current resistance values!

We provide a probe designed with considerations for high-frequency measurement conditions, allowing for high-precision measurements. This probe is a developed product that facilitates inspection with unprecedented small pitch intervals for high-frequency measurements. It can reduce high-frequency loss and DC resistance values, and the impedance can also be set as needed. *For more details, please download the PDF or contact us.*

  • probe

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Sensitive Probe (Series 16-300) *CAD data available

Sensitive Probe (Series 16-300) *CAD data available

A unique structure of a sensitive probe that supports high-precision measurement!

High-precision measurement compatible! A rich lineup of sensitive probes! This catalog features the unique structure of the "Sensitive Probe Series" designed for high-precision measurements. The coil spring is made of piano wire with gold plating, providing stable load and excellent durability, and is designed to apply moderate force to the tip of the plunger, ensuring the necessary contact force between the barrel inner wall and the plunger. Additionally, the resistance stabilizer (metal ball) is made of steel with gold plating, which, when pressure is applied to the plunger, adheres to the barrel inner wall, allowing current to flow through the barrel instead of the coil spring, resulting in stable contact resistance. [Contents] ■ Series 16 ■ Series 20 ■ Series 30 ■ Series 48 ■ Series 48A, etc. *For more details, please download the PDF or feel free to contact us.

  • Contract manufacturing
  • probe

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Unique structure of a sensitive probe compatible with high-precision measurement.

Unique structure of a sensitive probe compatible with high-precision measurement.

With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!

Introducing the unique structure of a sensitive probe that supports high-precision measurements of inks. At Inks, we have developed a proprietary internal structure that employs a resistance stabilizer (metal pole) to achieve low and stable resistance values. Furthermore, by applying gold plating with excellent conductivity to the plunger, we can achieve an even lower and more stable resistance value, reaching an ideal state. 【Features】 ■ Coil Spring - Stable load and excellent durability - Designed to provide the necessary contact force between the barrel inner wall and the plunger - Excellent heat resistance, maintaining stable spring pressure even at high temperatures ■ Resistance Stabilizer - Achieves stable contact resistance - Minimizes the influence of inductance from the coil spring ■ Plunger - Designed to stabilize internal contact resistance - Various tip shapes are available ■ Barrel - Made from materials with excellent conductivity - Prevents material changes due to corrosion and other factors *For more details, please refer to the external link page or feel free to contact us.

  • probe

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Comparison of contact resistance values of sensitive probes with other companies.

Comparison of contact resistance values of sensitive probes with other companies.

We are introducing a comparison of contact resistance values between our products and overseas products from other companies.

Introduction to the comparison test of contact resistance values between Inks' IP130B-2C probe and probes from other manufacturers. The test conditions used the JCM GP035-50R contact resistance measurement device for both the IP probe and the other (overseas) probes, with an applied current of 5A and an application time of 0.1 seconds. The insertion depth was 5.2mm for the IP probe and 4.3mm for the other (overseas) probes. As a result, the IP probe exhibited a more stable contact resistance value within a narrower range. The average value was also lower, indicating very good performance. [Test Results (Partial)] ■ Contact Resistance Values (mΩ) *Measured 3000 times 　・IP Probe (Sample 1) 　　　Max: 11.6 　　　Min: 8.6 　　　Ave: 9.4 　・Other Manufacturer's Probe (Sample 1) 　　　Max: 200.4 　　　Min: 15.7 　　　Ave: 92.7 *For more details, please refer to the external link page or feel free to contact us.

  • probe

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Layered probe with stable contact resistance value.

Layered probe with stable contact resistance value.

A probe capable of achieving a stable contact resistance value according to the shape of the target object.

The "laminated probe" has been developed with innovative technology and possesses excellent features. Unlike conventional spring probes, which consist of multiple parts, it achieves a structurally stable contact resistance value through contact with a single metal plate. Even when the inspected object is not smooth, the spring properties of each probe allow it to conform to the shape of the object, enabling a stable contact resistance value. 【Features】 ■ Wiping action occurs due to the structure ■ Contact position is displaced ■ Contact can be made while removing oxide films and foreign substances from the object ■ Stable contact can be achieved *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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