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Probe Product List and Ranking from 154 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テイエスエスジャパン Tokyo//Industrial Electrical Equipment
  3. ウェーブクレスト Saitama//Industrial Electrical Equipment
  4. 4 テクノプローブ Chiba//Testing, Analysis and Measurement
  5. 5 TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
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Probe Product ranking

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Examples of probes for electromagnetic and eddy current thickness gauges.
  5. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

Probe Product List

256～270 item / All 664 items

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Support for narrow pitch in stacked probes

Support for narrow pitch in stacked probes

It is possible to accommodate Kelvin measurements in a narrow range by utilizing a narrow pitch!

We would like to introduce our company's "stacked probes" and their compatibility with narrow pitch applications. The "stacked probes" can handle stable resistance values, high voltage, and current. Furthermore, they can make contacts at a minimum pitch of 0.05mm with closely arranged contacts, semiconductor lead parts, and connector contacts, enabling narrow pitch compatibility that was not achievable with conventional spring probes. 【Features】 ■ Stable resistance values, high voltage, and current compatibility ■ Contact possible at a minimum pitch of 0.05mm ■ Compatible with Kelvin measurements ■ Two-terminal measurements for each measurement point *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Stable contact with BGA.

Stable contact with BGA.

Introducing examples of layered probes. Coating applied to the probe tip achieves extended lifespan.

We would like to introduce stable contact for BGA "laminated probes" handled by our company. For spherical BGA (solder), contact using needle-type probes, including spring probes, has resulted in slippage, making stable contact difficult. By using laminated probes for Kelvin contact, we achieve stable contact. Additionally, since BGA primarily consists of tin, applying a coating to the probe tip that suppresses tin transfer can also extend its lifespan. 【Features of Laminated Probes】 ■ Stable contact resistance values ■ Effective for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitches ■ Load for contact can be adjusted *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Q&A on Layered Probes

Q&A on Layered Probes

We will answer five representative questions about layered probes.

In this document, we will introduce questions regarding the "stacked probe" of the probe business handled by Inks Corporation. Q: Is non-magnetic compatibility possible? A: Yes, it is possible. The probe is made of non-magnetic beryllium copper, and the holder that holds the probe can also be made of non-magnetic materials such as aluminum or resin. Additionally, we have experience with contacts to magnetic sensor packages. We have answered five questions, including the following: - Is non-magnetic compatibility possible? - Can it be used in the previous process (wafer inspection)? - I would like to install it on the machine I am currently using; is that possible? - How should maintenance be performed? - What would the estimated schedule be until delivery? *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Layered Probe: Response to High Current and High Temperature

Layered Probe: Response to High Current and High Temperature

We have a track record of producing laminated probes compatible with 2000A! Introducing our solutions for handling high current and high temperatures.

The "laminated probe" does not use coil springs and instead utilizes the characteristics of leaf springs for contact, making it resistant to degradation of spring properties due to heat. The insulating film (polyimide) also has a heat resistance rating of 300°C for regular use and long-term heat resistance. It can accommodate measurement environments at high temperatures, allowing contact with power semiconductors including SiC. 【Features】 ■ Utilizes the characteristics of leaf springs ■ Resistant to degradation of spring properties due to heat ■ Can accommodate measurement environments at high temperatures ■ Allows contact with power semiconductors including SiC *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Wavelength 1.1-17μm, fiber detachable ATR optical fiber probe

Wavelength 1.1-17μm, fiber detachable ATR optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The sterilizable ATR fiber probe is art's new product, FlexiSpec. This series is compatible with all types of ATR (Attenuated Total Reflection) elements and can be used with any FTIR spectrometer. The unique Shaft-in-Shaft design makes FlexiSpec the ideal tool for bioprocesses that require sterilization while taking advantage of the benefits of mid-infrared FTIR spectroscopy.

  • probe

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Wavelength 0.19-2.2μm - Reflective optical fiber probe

Wavelength 0.19-2.2μm - Reflective optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) art photonics offers a variety of reflection and fluorescence probes. Based on a fiber branching structure, one leg transmits light from the light source to the sample for illumination, while the other leg transmits the reflected light to the spectrometer for reading. Unlike the previous "6+1" bundle configuration of reflection probes, art offers a "7+1" configuration, which dramatically improves the signal-to-noise ratio (SNR). For special applications, a "7+12" design is also available, consisting of 7 illumination fibers and 12 random reading fibers. Additionally, the illumination leg fibers are metal-coated, further enhancing the SNR compared to those with polymer coatings. Two models are available: "Round-to-Round (R/R)" design and "Round-to-Line (R/L)" design.

  • probe
  • Other inspection equipment and devices

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World's longest 10m ATR fiber probe

World's longest 10m ATR fiber probe

We have manufactured an ATR fiber probe of unprecedented length in the mid-infrared range.

Manufacturer: art photonics (Germany) ATR spectroscopy in the mid-infrared spectral range (λ = 2~18 μm) is the most efficient method for remote inline monitoring of molecular composition in field labs. This is due to the deep relationship of many molecular vibrations with this spectral range. art photonics has developed the world's longest ATR fiber probe that corresponds to the wavelength range of 6~16 μm.

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  • probe

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Flat Chip Diamond ATR Fiber Probe

Flat Chip Diamond ATR Fiber Probe

The diamond ATR chip at the probe tip is flat, making contact measurement easy and cleaning simple.

Manufacturer: art photonics (Germany) The probe tip is a flat type diamond crystal. It can make firm contact with samples that have a flat surface. Cleaning is also easy. The mid-infrared fiber ATR probe can be used with all types of FTNIR, FTIR, and other infrared spectrometers, spectrophotometers, infrared LEDs, or sensors for quantum cascade lasers. ------------------------------------------------- Features ------------------------------------------------- The diamond ATR chip at the probe tip is flat High throughput across the near-infrared and mid-infrared range Compatible with all spectrometers and automatic process interfaces ------------------------------------------------- Probe Type ------------------------------------------------- Di-ATR (Diamond)

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  • probe

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Total cell density & biomass monitoring probe BioVIS

Total cell density & biomass monitoring probe BioVIS

Using the BioVIS probe, you can directly measure cell growth and total biomass from the bioreactor.

Since sampling is not required, contamination in cell culture can be avoided. At the same time, high-resolution information about the cell growth profile can be obtained, providing valuable insights that help optimize the cell culture process. The plug-and-play design of the probe is suitable for use in any bioreactor and can be used as a single portable unit. Therefore, it can be used in bioreactors ranging from small to large capacity, and with BioVIS multiplex, it can monitor total cell density in real-time across multiple bioreactors and all other parallel culture vessels. By using data log options, temperature and pH monitoring capabilities can be further integrated.

  • Analytical Equipment and Devices
  • Other measurement, recording and measuring instruments

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コンタクトプローブ

コンタクトプローブ

高集積化に伴う狭ピッチ化やエリアアレイへの対応に優れたプローブピンをご紹介！

『コンタクトプローブ』は、狭ピッチ電極の電子部品検査に適した超極細径 のワイヤプローブです。 導体部には、パラジウム合金や、銅銀合金、タングステン、レニウムタング ステン、ベリリウム銅などを使用。 当社独自のコーティング製法と剥離製法により、優れた絶縁性とコーティング 境界面のシャープ化を実現しています。 【特長】 ■当社独自の製法により、極小部位への先端加工を実現 ■当社独自のコーティング製法と剥離製法により、優れた絶縁性とコーティング 　境界面のシャープ化を実現 ■特殊な表面処理により、絶縁コーティング表面の滑性を向上 ■パラジウム合金は、導体が酸化しにくい特長があり、接触抵抗の安定性が向上 ■酸化を嫌う半導体検査などに好適 ■30μmの極細径から対応可能 ※詳しくは外部リンクページをご覧いただくか、お気軽にお問い合わせ下さい。

  • probe
  • Other electronic parts
  • Terminal Blocks

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TITAN T26P RF High-Power Probe Head

TITAN T26P RF High-Power Probe Head

Affordable pricing for RF high power measurements from DC to 26GHz!

The probe chip, thanks to MPI's unique MEMS technology, has very high visibility, making probing easy for anyone. The high-precision and robust chips, which are on par with competitors, offer a long lifespan and affordable pricing, resulting in a high cost-performance ratio. Agent in Japan: Vector Semicon Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

  • probe

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Processing and sales of industrial harnesses

Processing and sales of industrial harnesses

Leave it to us for contact probes and industrial harnesses!

Our company participates in product development with customers from the planning stage, leveraging our processing know-how to connect to mass production. We always prioritize quality and aim to be a company that can grow together with our customers. Additionally, we believe that our production being entirely manual is a key point that allows us to accommodate small lots of various products. 【Other Products We Handle】 ■ Contact Probes ■ Labor-saving Equipment and Electrical Components *For more details, please feel free to contact us.

  • Harness
  • Processing Contract
  • Electrical equipment parts

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[Long lifespan, high durability type] Diamond probe for AFM/SPM

[Long lifespan, high durability type] Diamond probe for AFM/SPM

AFM/SPM probes boasting long lifespan and high durability with diamond coatings and single crystal diamonds.

This is a probe for atomic force microscopy and scanning probe microscopy. It features a diamond coating on the tip, or the tip itself is made of single crystal diamond, providing high stability, wear resistance, and durability for a long-lasting probe. ● Diamond Coated Probes - DCP Series: Probes with conductivity due to nitrogen-doped diamond coating. - HA_DCP Series: Probes with cantilevers at both ends of the chip and two different diamond-coated tips. ● Single Crystal Diamond Probes - DEP Series: Probes with conductivity, treated with boron-doped diamond coating on single crystal diamond. - DRP Series, DPRS Series: Probes designed for applications involving high mechanical loads and scratch tests. - FD Series: Probes that are insensitive to static electricity on the sample surface, making them easy to approach and suitable for topography imaging.

  • Other microscopes
  • Analytical Equipment and Devices
  • probe

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