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Probe Product List and Ranking from 154 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テイエスエスジャパン Tokyo//Industrial Electrical Equipment
  3. ウェーブクレスト Saitama//Industrial Electrical Equipment
  4. 4 テクノプローブ Chiba//Testing, Analysis and Measurement
  5. 5 TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
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Probe Product ranking

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Examples of probes for electromagnetic and eddy current thickness gauges.
  5. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

Probe Product List

271～285 item / All 664 items

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High-resolution type super sharp probe for AFM/SPM

High-resolution type super sharp probe for AFM/SPM

AFM/SPM probe for high-resolution measurements with a tip curvature radius of less than 3 nm.

This is a probe for atomic force microscopy and scanning probe microscopy. We offer two types of probes: one with an ultra-fine DLC tip extended at the tip's end, and another with a tip sharpened to about 2 nm. - Super Sharp DLC Probe: A probe equipped with a DLC tip at the tip's end that has a curvature radius of less than about 3 nm. Due to the DLC, it boasts high durability and long lifespan. - Super Sharp SS Probe: A probe with the tip's end sharpened to a curvature radius of about 2 nm.

  • Other microscopes
  • Analytical Equipment and Devices
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Colloidal probe for AFM/SPM with spherical tip type

Colloidal probe for AFM/SPM with spherical tip type

This is a probe equipped with colloidal spheres instead of a standard tip. Colloidal spheres can be selected from multiple sizes.

This is a probe for atomic force microscopy and scanning probe microscopy. It is a contact mode probe with spherical particles fixed to a chipless cantilever, used for studying colloidal interactions between two surfaces and quantifying interaction characteristics. ● Applications - Direct measurement of surface forces - Colloidal interactions at the single particle - particle level - Direct measurement of cellular mechanics - Adhesion force measurement - Study of colloidal interactions between particles and surfaces

  • Other microscopes
  • Analytical Equipment and Devices
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SNOM probe

SNOM probe

A SNOM measurement probe with a tiny aperture formed at the probe tip. Five types of transmission wavelengths are available, ranging from 400 to 1600 nm.

This is a SNOM-specific probe made from high-quality single-mode optical fiber. The probe tip is coated with aluminum and has a small aperture, allowing it to be used in all current modes of SNOM measurement (transmission, reflection, collection). We offer five types with different operating wavelength ranges within the wavelength range of 400 to 1600 nm. They are provided in sets of 10.

  • Other microscopes
  • Other laboratory equipment and containers
  • Optical microscope

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Stainless Steel Double Pipe Grain Needle 'OSK 491UU SS'

Stainless Steel Double Pipe Grain Needle 'OSK 491UU SS'

Excellent durability! Sampling granular materials such as grains and seeds from the bag.

The "OSK 491UU SS" is a stainless steel grain probe (sampling probe) suitable for inspections and sample collection during storage in warehouses, grain trucks, and railway freight transport. It features a sophisticated double combination structure made of an outer tube and an inner tube, allowing the opening to be opened one by one based on the rotation angle of the inner tube, enabling uniform filling throughout the entire length of the sampling probe. Made of durable AISI304/304L stainless steel, it has a non-slip handle for stable and secure operation. 【Specifications (partial)】 ■OSK-491UU-SS-A 　・Model number: SS2510 　・Material: 25 　・Tube diameter (mm): 1.5 　・Total length (m): 4 　・Weight (kg): 2 *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices

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Stainless Steel Double Pipe Grain Needle 'OSK 491BQ01'

Stainless Steel Double Pipe Grain Needle 'OSK 491BQ01'

Made of durable AISI304/304L stainless steel! Introducing our products.

The "OSK 491BQ01" is a stainless steel grain probe designed for sampling granular materials such as grains and seeds from bulk bags. It is suitable for inspections and sample collection during storage warehouse checks, grain truck operations, and railway freight transport. With a sophisticated double combination structure consisting of an outer tube and an inner tube, the opening can be sequentially opened one by one by adjusting the rotation angle of the inner tube, allowing for uniform sampling throughout the entire length of the sampling probe. 【Features】 - Made of durable AISI304/304L stainless steel - Available in three lengths and two diameters, allowing selection based on sample or bulk bag size - Cone-shaped tip for easy insertion into samples *For more details, please download the PDF or feel free to contact us.

  • probe

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AFMSPM Cantilever "qp Series"

AFMSPM Cantilever "qp Series"

Significantly suppresses the variation of spring constant and resonance frequency! Can be used as an alternative to silicon nitride probes.

The "uniqprobe series" features probes that have smaller dimensional specifications and material-specific warping and bending compared to Si probes and SiN probes. The variation in the cantilever's resonance frequency and spring constant is significantly lower, making it very effective for repeated measurements that require high reproducibility. We offer "qp-CONT/qp-SCONT," which is suitable for contact mode measurements in atmospheric and liquid environments, and "qp-BioAC/qp-BioAC-CI," which is optimal for tapping mode (AC mode) measurements in liquid. 【Features】 ■Significantly suppresses variation in spring constant and resonance frequency ■Low drift, making it suitable for liquid measurements ■Cantilevers and deep probes are made from quartz-like materials ■Deep probes have a hyperbolic side profile ■Can be used as an alternative to silicon nitride probes *For more details, please refer to the PDF materials or feel free to contact us.

  • probe

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AFM/SPM probes and cantilevers for roughness measurement of various industrial materials.

AFM/SPM probes and cantilevers for roughness measurement of various industrial materials.

Cost measures and wear prevention products! NanoWorld probes with a high track record for everyday measurements.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for measuring the roughness of various industrial materials. These products are suitable for customers using AFM/SPM for nano-level surface management of materials. Please use the NCH probes, which have a proven track record worldwide, the BudgetSensors probes, which are cost-effective, and the nanotools probes, which enhance tip wear resistance and allow for long-duration measurements. 【Features】 ■ For measuring the roughness of various industrial materials ■ Suitable for customers using AFM/SPM for nano-level surface management of materials ■ Enhanced tip wear resistance allows for long-duration measurements *For more details, please refer to the related link page or feel free to contact us.

  • Other microscopes
  • Other physicochemical equipment
  • 3D measuring device

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Colloidal Probe for Viscoelastic Measurement in the Polymer Industry

Colloidal Probe for Viscoelastic Measurement in the Polymer Industry

The colloidal probe with a rounded tip is used for measuring viscoelasticity and modulation.

We would like to introduce our viscoelasticity measurement SPMAFM probes and cantilevers for the polymer industry. Our lineup includes the calibrated "biosphere series," as well as the "NanoSensors SD-sphere series" and "sQube CP series." In recent years, there has been an increasing demand for local viscoelasticity measurements and friction force measurements. For these applications, please use our colloid probes with a rounded tip. 【Features】 〈biosphere series〉 ■ Controlled radius of curvature ■ Calibrated ■ HDC/DLC hardness ■ Gold-coated reflection *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device

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Data presentation! "Basics of AFM/SPM Probes"

Data presentation! "Basics of AFM/SPM Probes"

Introducing the probes used in scanning probe microscopy and atomic force microscopy! We will clearly explain the names of each part of the probe!

This document explains the probes used in scanning probe microscopy and atomic force microscopy. The probes used for measurements are consumables, and many types are available for different measurement needs. They are typically made of silicon or silicon nitride and are manufactured using semiconductor processes. Additionally, quartz material probes from the "qp series" are available from NanoSensors. 【Contents】 ■ Names of each part ■ Variations of tips (probes) ■ Variations of cantilevers (spring plates) ■ Variations of support tips ■ Variations of coatings *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Other physicochemical equipment

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Semiconductor Inspection Resistance Measurement 4-Probe (Contact Probe)

Semiconductor Inspection Resistance Measurement 4-Probe (Contact Probe)

We offer high-quality probe heads with top-class dynamic performance!

Micro Point Pro Co., Ltd. is a leading supplier of Four Point Probe (4PP) heads for measuring the resistivity of wafers and conductive thin films, equipped with 40 years of experience and expertise. All probe part head assemblies (body, wiring, needles) are manufactured in-house using proprietary high-precision customized equipment, and are assembled and tested internally. 【Features】 ■ High-quality probe heads with top-class dynamic performance ■ High precision and reproducibility ■ Strict QC/QA approach *If you have any questions about the products or require support after implementation, please feel free to contact the person in charge below.

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Contact Probe for Resistance Measurement for Semiconductor Testing

Contact Probe for Resistance Measurement for Semiconductor Testing

Introduction of a wide lineup of 4-probe probes for achieving high resistivity measurements. Comprehensive product support available. *Materials provided.

Micro Point Pro's "4-Needle Probe (Contact Probe)" features high-quality high-speed steel, characterized by extremely low resistance values. The tip uses carbide and osmium alloys, allowing for choices in durability and electrical contact properties. The probe body offers a reliable solution for resistivity measurement with the "Fell Probe (Chrome-Plated Body)," as well as two other types: "Disposable Probe (Plastic Body)" and "Al Probe (Aluminum Body)." 【Features】 ■ Low-friction upper guide ■ Wide selection of probe tip radii ■ Individual needle pressure adjustment ■ High breakdown voltage and low leakage

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InlineTasty | Sampling Port and Probe

InlineTasty | Sampling Port and Probe

Sampling from the air transport line.

Sampling from air transport lines often poses challenges for companies. REMBE Kersting has addressed such challenges by developing InlineTasty within its "Sampling Port & Probe" product range. It can be used in almost all industrial sectors, including food and feed. ▶ Benefits of Use ▸ Mounting on horizontal or vertical pipelines ▸ Suitable for a wide range of applications ▸ Flexible sampling: manual opening of the sampler is possible ▸ Usable in air transport lines

  • Company：REMBE
  • Price：Other
  • Other measurement, recording and measuring instruments

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High-performance microwave probe for RF probing

High-performance microwave probe for RF probing

Quick and accurate positioning of RF probes such as SP-67A (coplanar probe) and S-M40/90 series RF positioners.

Our company offers a variety of RF positioners used in probe systems. Example: SP-67A Equipped with a flexible chip, it achieves an insertion loss of less than 1.1 dB and a return loss exceeding 14 dB at 67 GHz using low-loss coaxial technology. It features an independent spring-loaded chip that ensures reliable contact with the probing surface, and the flexibility of the chip minimizes circuit damage and extends probe life. Additionally, it can be mounted with various adapters for use with standard microwave probe stations. Customization of the mounting is available. 【Features】 ■ Durable RF probe ■ Independent spring-loaded contact ■ Wide range of footprints ■ Coaxial design ■ Available in 13 types of adapter styles, etc. *For more details, please download the PDF or feel free to contact us.

  • probe

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THz-Raman(R) Spectroscopy Probe

THz-Raman(R) Spectroscopy Probe

Raman probe for low wavenumber region measurement manufactured by Coherent (formerly Ondax)

We handle Raman probes for low wavenumber region measurements manufactured by Coherent (formerly Ondax). Peaks appear in the fingerprint region, which is called 200 to 1800 cm-1, representing the molecular structure of substances, including functional groups, geometric isomers, conformations, hydrogen bonding, and the state of chemical structures. The region below 200 cm-1 is referred to as the low wavenumber region. Peaks that represent structural information, such as the crystal form of compounds, appear, and it is known that in the low wavenumber region, the intensity of Raman scattered light is stronger than that in the fingerprint region. 【Applications of THz-Raman(R) Probe】 - Evaluation of physical properties such as polymorphism of pharmaceutical active ingredients - Evaluation of content uniformity of active ingredients in formulations - Crystal transformation of active ingredients - Co-crystal screening - Evaluation of polymorphism in fats and oils *For more details, please download the PDF or feel free to contact us.

  • Analytical Equipment and Devices

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Wide-area Raman probe

Wide-area Raman probe

It is effective for measuring the Raman spectrum of samples with uneven dispersion of components.

In 2019, Raman spectroscopy was included in the seventeenth revision of the Japanese Pharmacopoeia as "Raman Spectral Measurement Method." This spectroscopy is known to be effective for the quantitative evaluation of active ingredients in a non-contact and non-destructive manner. In recent years, in addition to reflection methods, there have been numerous reports indicating its effectiveness in transmission methods and in evaluating the polymorphism of active ingredients. While there are reports suggesting that near-infrared spectroscopy is effective for process management, particularly in the quantification of active ingredients, there are also reports indicating that it is difficult to quantitatively evaluate active ingredients that are unevenly dispersed. Therefore, we conducted an evaluation and examination of the practicality of a wide-area Raman probe capable of collecting Raman scattered light from a broad range of areas for the quantitative evaluation of multiple crystal forms of active ingredients.

  • Spectroscopic Analysis Equipment

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