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Probe×精研 - List of Manufacturers, Suppliers, Companies and Products

Probe Product List

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High heat-resistant probe capable of inspection up to nearly 300℃.

We also offer probes that use springs with a heat resistance of 300 degrees, one rank higher than SUS material!

The spring material for general contact probes is piano wire. Essentially, it is designed for use at room temperature, but piano wire can also be used in environments around 100 degrees without significant loss of load. However, when the temperature exceeds 150 degrees, the load may decrease due to heat, which can result in an inability to achieve the specified contact pressure. In such cases, using springs made of SUS material can improve the situation, but when temperatures exceed 200 degrees, even this material can experience a decrease in load. At Seiken, we also offer probes that use springs rated for 300 degrees heat resistance, which is a step up from SUS material. Not only does the measurement environment involve high temperatures, but the high heat-resistant springs also contribute to stable measurements against the heat generated by passing large currents through the probes themselves. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe

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Contact probes for semiconductor testing, IC sockets, probe cards

Flexible design and manufacturing tailored to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring to inspection.

Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ▼ Contact Probes We offer not only standard products but also flexible solutions tailored to testing conditions. ▼ Probe Cards and IC Sockets We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suited to the inspection targets at low costs. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: High frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 ▼ Contact Probes - Reduces the hassle of replacement. Durable "rare metal probes." - Revised internal structure. "New bias probes" for stable resistance value measurement. ▼ IC Sockets - Non-magnetic sockets, high heat resistance sockets. ▼ Probe Cards - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

  • Other semiconductors

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