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Probe×精研 - List of Manufacturers, Suppliers, Companies and Products

Probe Product List

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Metal and resin precision machining contract services

Metal and resin precision machining contract services

We provide advanced processing technology cultivated through the production of contact probes and various inspection jigs.

Our company is a manufacturer of contact probes used for inspecting various electronic components, as well as inspection fixtures that utilize these probes. The technology required in these fields is at an extremely high level, characterized by "ultra-high precision" and "ultra-fine" specifications. Our technology, which has been refined over many years to meet these demands, has solved various challenges not only in inspection-related areas but also across a wide range of applications. We also offer this technology as a processing contract service. *For more details, please download the PDF or contact us.*

  • plastic
  • Processing Contract

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Non-magnetic contact probe for tests that dislike magnetism.

Non-magnetic contact probe for tests that dislike magnetism.

Achieving a pitch of P=0.2mm! Active in environments that require strict non-magnetic properties. Uses materials suitable for lead-free electrodes.

To non-magnetize contact probes, it is essential to review the materials and surfaces, but in practice, that alone is not sufficient for the product to be viable. It is only natural that they should be non-magnetic when measuring non-magnetic devices, but they must also possess performance tailored to the characteristics of the electrodes being inspected. Our company offers a lineup of "non-magnetic probes" that are suitable for lead-free electrodes, provide load control for contact probes, and achieve a pitch of P=0.2mm. [Features] ■ Materials suitable for lead-free electrodes ■ Load control for contact probes ■ Achieves pitch compatibility of P=0.2mm *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other electronic parts
  • Inspection fixture

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Apex P = 80μ~ with two-point contact! Kelvin contact probe

Apex P = 80μ~ with two-point contact! Kelvin contact probe

By bringing the tip of the contact probe closer to the outside, the gap between the two points can be minimized without changing the thickness of the pin. Pin pitch between 0.4mm and...

The "Kelvin Probe" has its tip positioned right at the edge of the probe's outer shape. By moving the tip outward, it is possible to minimize the gap between two points without changing the thickness of the pin. This allows for stable contact at a fixed position and the maintenance of load. Special board processing is required for use. Our company offers the fabrication of fixtures that can be installed according to the measuring equipment used by our customers. 【Features】 ■ The tip is positioned right at the edge of the probe's outer shape. ■ It can minimize the gap between two points without changing the thickness of the pin. ■ Stable contact at a fixed position. ■ It can maintain load. *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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For tests requiring stable contact resistance values. Bias probe.

For tests requiring stable contact resistance values. Bias probe.

We respond to the need to minimize the variability in resistance values specific to contact probes as much as possible.

By using a bias structure and inserting a ball, we were able to increase the contact pressure on the inner wall of the pipe; however, this also resulted in significant damage to the inner wall, leading to issues such as probe sticking when used repeatedly. To address these disadvantages, Seiken combined parts using precision machining technology instead of balls, thereby reducing damage to the inner wall of the pipe while maintaining the characteristics obtained through bias. Furthermore, by miniaturizing the parts, we can also create a bias structure compatible with P=0.4mm. We respond to the need to minimize variations in resistance values specific to contact probes, such as in low-resistance measurements. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe
  • Other electronic parts
  • Inspection fixture

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Contact probe for improving contact with lead-free solder.

Contact probe for improving contact with lead-free solder.

Compared to conventional BeCu products, it is equivalent or even superior, so wear resistance is not a concern.

At Seiken, in addition to our approach to surface treatment, we have re-evaluated the materials themselves. Traditionally, we used BeCu (beryllium copper), which required surface treatment. However, we have processed an alloy that excels in solder contact properties, allowing it to be used as is without any surface treatment. Even when cleaning the pin tips, the plating thickness is at most 1-2 micrometers, but since the alloy is used in its solid form, there is no risk of plating peeling that would expose the base material and degrade performance. Additionally, the hardness is comparable to or greater than that of traditional BeCu, so wear resistance is not a concern. This material can also be processed for probes in the P=80 micrometer class. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe

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We will match the inspection conditions! Contact probe (custom-made)

We will match the inspection conditions! Contact probe (custom-made)

In semiconductor testing, probe cards and IC sockets are often custom-made. We solve issues that cannot be addressed with standard probe products.

We offer a one-sided movable probe as a standard probe in our catalog. However, when trying to match it to equipment used for electrical testing, it may not meet the specifications. We can suggest existing probes tailored to the products or equipment conditions you wish to test, but if there is no suitable probe available, we can manufacture a custom one. In addition to partially manufacturing new parts based on existing probes, we can also create all parts from scratch. Therefore, if you need a replacement or compatible probe due to the discontinuation of a probe manufactured by another company, we may be able to assist you. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe
  • Other electronic parts
  • Inspection fixture

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Contact probes for semiconductor testing, IC sockets, probe cards

Contact probes for semiconductor testing, IC sockets, probe cards

Flexible design and manufacturing according to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring, to inspection.

Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ☆Contact Probes☆ We can flexibly accommodate not only standard products but also special specifications tailored to testing conditions. ☆Probe Cards and IC Sockets☆ We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suitable for the inspection target at a low cost. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: high frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 <Contact Probes> - Reduces replacement hassle. "Rare metal probes" with excellent durability. - Revised internal structure. "New bias probes" for stable resistance value measurement. <IC Sockets> - Non-magnetic compatible sockets. - High heat resistant sockets. <Probe Cards> - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.*

  • Other semiconductors

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I would like to know again "How to use contact probes" *Free materials are currently being offered.

I would like to know again "How to use contact probes" *Free materials are currently being offered.

A specialized manufacturer of contact probes explains! How to use and replace standard probes and both-end probes.

We would like to introduce the usage of the "Contact Probe" that we handle. The "Standard Contact Probe (Single-End Probe)" is basically used in pairs with a socket due to the ease of replacement and wiring. The general method of using a contact probe involves drilling a hole in the resin, embedding a socket (receptacle) in it, and connecting the lead wires for wiring. Finally, the contact probe is inserted into the socket to complete the setup. Additionally, our website also provides information on "How to Use a Double-End Contact Probe" and "Replacing a Double-End Probe." [Content Included] ■ How to Use the Standard Probe ■ How to Use the Double-End Probe ■ Replacing the Double-End Probe *For more details, please refer to the PDF materials or visit our website.

  • probe

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Contact probe

Contact probe

Contact probe, pitch 0.45mm and above, long lifespan, high quality, available for purchase from Misumi starting from one piece.

【Product Catalog】【Usage Instruction Materials】 Contact probes (also known as pogo pins or test probes) have been used for continuity testing of electronic components. Our company has over 30 years of experience as a specialized manufacturer of probe pins. The structure consists of a spring inside a tube, and the tip (the plunger) makes contact with the electrode being tested with the appropriate load by stroking. The product catalog offers a lineup of 15 types for each pitch (the spacing between probes). Each series has multiple tip shapes available. Our probe pins are manufactured in-house, from processing the parts to assembly. Therefore, we can produce custom specifications to meet various requirements. 【We also accept resin board processing】 In addition to providing probes, we also offer processing of the resin that secures the probes. Furthermore, we can provide the probes with sockets integrated into the board and wiring to connectors. We also accept requests for resin processing only, so please feel free to contact us. *For more details, please download the PDF or contact us.

  • Other electronic parts
  • Other FA equipment
  • Inspection fixture

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Semiconductor inspection probe tip material and tip shape... various selections available.

Semiconductor inspection probe tip material and tip shape... various selections available.

A semiconductor testing probe that can be customized with various selections for the probe tip material, surface treatment, tip shape, etc., to match the measurement target device!

Probes for semiconductor testing can be selected according to the measurement environment. - Probes made from our unique alloy material that enhance contact performance for lead-free applications. - Heat-resistant probes that utilize special springs to avoid load reduction due to thermal effects. - High-level non-magnetic material probes that can also be used for testing magnetic sensor components. - Short high-frequency probes that maximize signal transmission characteristics. We respond to various user requests. 【Features】 ■ Excellent quality backed by years of experience ■ A wide range of products ■ Various selections available for probe tip material, surface treatment, tip shape, etc., tailored to the measurement target device ■ Custom specifications are also available, allowing for arbitrary settings of total length, tip diameter, and spring pressure beyond standard specifications. *For details, please request materials or view the PDF data available for download.

  • Semiconductor inspection/test equipment

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Semiconductor Testing [Contact Probes, IC Sockets, Probe Cards]

Semiconductor Testing [Contact Probes, IC Sockets, Probe Cards]

Support for inspection of various electronic components! Precision research of TOTAL TEST SOLUTION!

This is an introduction to Seiken Co., Ltd., which handles contact probes used for electrical testing, semiconductor wafer inspection probe cards, and IC sockets. We offer a lineup of products including "contact probes" that cater to both standard and special specifications, "IC sockets" that can be configured with housing materials suited to specific applications, and "probe cards" that accommodate various inspection conditions, including narrow pitch through fine processing technology. Examples of inspection conditions: - Support for narrow pitch (MIN P=80μ) - High current testing (pre-process testing of IGBT devices) - Non-magnetic testing (probes made from non-magnetic materials) Leveraging the technology we have cultivated over many years, we continue to develop solutions that provide a more efficient inspection environment and meet more detailed requests. An overview of our products is available in the documentation. [Contents] ■ Introduction ■ Product and technology introduction (Contact Probes) - Introduction of new product technology ■ Technology introduction (IC sockets, probe cards) ■ Other various products and services (precision processing, etc.) *For more details, please refer to the PDF document or feel free to contact us.

  • Other semiconductors

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Narrow pitch contact probe (dual end pins) with P=0.4 or less.

Narrow pitch contact probe (dual end pins) with P=0.4 or less.

Make contact by bringing one side of the plunger into contact with the electrodes or relay pins of the relay board! L=20mm to 1.5mm, φ1mm to φ0.1mm.

This is an introduction to our "Contact Probe (Dual Pin)" that we handle. We offer two types: one with movable plungers on both sides and one with a movable plunger on only one side. The sizes range from long and thick ones with an overall length of 20mm and a thickness of approximately φ1.0mm, to shorter and thinner ones with an overall length of L=1.5mm and a thickness of φ0.1mm. The tip shape can be selected similarly to standard contact probes. 【Features】 ■ Two types are available: one with movable plungers on both sides and one with a movable plunger on only one side ■ The tip shape can be selected similarly to standard contact probes ■ The plunger on one side makes contact with the electrode of the relay board ■ Wiring is also possible using enamel wire attached to metal terminals ■ When in use, 2 to 3 boards are utilized *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other electronic parts
  • Inspection fixture

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Increase the allowable current per unit. CNT probe (high current probe)

Increase the allowable current per unit. CNT probe (high current probe)

We were able to significantly improve the performance of the probes even in high current measurements! It is also possible to increase the allowable current value, including the housing.

Recently, the conditions for inspection targets have become stricter, such as lead-free solder, contact with aluminum electrodes, and high current measurements, leading to cases where traditional processing is insufficient in performance. CNTs are strong against current and heat and have features that improve contact with aluminum. By incorporating them into the gold plating of probes, we have successfully enhanced the electrical performance of the gold plating. As a result, even when the contact probe is in contact with aluminum electrodes, it can maintain stable contact for a longer period. Additionally, in high current measurements where traditional pins would physically break due to current overload, we have significantly improved the performance of the probes. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe

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Advanced tips. Durable rare metal bonding contact probes.

Advanced tips. Durable rare metal bonding contact probes.

We were able to incorporate rare metals into the components of a probe that requires complex processing! Please consider the contact with the hard terminals.

The needle-shaped probe itself is processed from a metal with good machinability, and we have succeeded in bonding rare metals such as iridium and rhodium to its tip. This technology has enabled us to incorporate rare metals, which could only be shaped into simple forms through polishing, into components of probes that require complex machining. The hardness of BeCu (beryllium copper), which is the material commonly used for probes, is about HV400, while iridium and rhodium have hardness exceeding HV1000. In addition to their hardness, these materials also exhibit excellent electrical properties. Therefore, they can maintain stable contact with electrodes of various materials for an extended period, allowing for an extended maintenance cycle. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe
  • Other electronic parts
  • Inspection fixture

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Probe diameter φ0.1 - Pitch contact probe

Probe diameter φ0.1 - Pitch contact probe

The previous process requires a tighter pitch and stable electrical performance compared to the subsequent process. We also accept orders for the production of probe cards!

At Seiken, we offer a lineup of vertical probes compatible with P=150um. The tip is made of a well-regarded alloy known for its contact with solder and is also compatible with crown cuts, allowing for stable contact with bumps. By using a specially shaped spring to maintain a constant load, the contact with bumps is better than that of probes using standard springs with the same pitch. 【Features】 ■ Lineup of vertical probes compatible with P=150um ■ Alloy compatible with crown cuts ■ Stable contact with bumps ■ Maintains a constant load using a specially shaped spring ■ Good contact with bumps *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other electronic parts
  • Inspection fixture

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