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Probe Product List and Ranking from 153 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated: Aggregation Period:Aug 26, 2026~Sep 22, 2026
This ranking is based on the number of page views on our site.

Probe Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Aug 26, 2026~Sep 22, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テクネ計測 Kanagawa//Testing, Analysis and Measurement
  3. テクノプローブ Chiba//Testing, Analysis and Measurement
  4. 4 ヴァイサラ Tokyo//Testing, Analysis and Measurement
  5. 5 テイエスエスジャパン Tokyo//Industrial Electrical Equipment

Probe Product ranking

Last Updated: Aggregation Period:Aug 26, 2026~Sep 22, 2026
This ranking is based on the number of page views on our site.

  1. Connection terminal TA series サンケイエンジニアリング 本社
  2. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  3. Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社
  4. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社
  5. 5 Screw-mounted contact probe CPM series サンケイエンジニアリング 本社

Probe Product List

751~752 item / All 752 items

Displayed results

AFM/SPM Probes and Cantilevers for Polymer Material Research and Development

Suitable for high polymer materials with a slightly lower spring constant than conventional non-contact tapping mode probes.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for polymer material research and development. For tapping mode measurements of polymers with relatively soft surfaces, soft tapping probes are ideal. Additionally, we offer colloid probes suitable for localized viscoelastic measurements, friction force measurements, and modulation response measurements, which have been in high demand in recent years. 【Features】 The NanoWorld Pointprobe NCL is designed for non-contact mode and tapping mode. It combines a low spring constant, high measurement stability, excellent sensitivity, and high-speed measurement capabilities. The tip shape is a polygon close to a pyramid. *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device
  • Probe

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AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials

Introducing a conductive film coat probe suitable for measuring the electrical properties of various materials.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for measuring the electrical properties of nanomaterials. For localized electrical property measurements, probes with metal film coatings are preferable. While platinum coating is the standard, you can also use platinum silicide or conductive diamond-coated types that enhance wear resistance during contact. 【Features】 ■ For measuring the electrical properties of nanomaterials ■ Probes with metal film coatings are suitable for localized electrical property measurements ■ Platinum silicide and conductive diamond-coated types are also available *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device
  • Probe

Added to bookmarks

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