【Patent Obtained Probe】 High Current, Narrow Pitch Compatible Probe 'Stacked Probe'

The stacked probe can accommodate a minimum pitch of 0.05 mm. It also demonstrates performance as a probe for power semiconductors that apply large currents. [Catalog with case studies available]

In recent years, as products have become smaller, the components used have also been miniaturized year by year. However, isn't it becoming difficult to measure and analyze these miniaturized components with existing probes? The "stacked probe" can handle a minimum pitch of 0.05 mm, which conventional probes cannot accommodate, and it also performs well as a probe for power semiconductors that require high current. This means that even small semiconductors that could not be measured before can now be measured. 【Features】 - Achieves precise measurements due to stable contact resistance - Capable of handling high current and high voltage - Supports narrow pitches of up to 0.05 mm, etc. *For more details, please download the PDF or contact us.

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