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Probe Product List and Ranking from 155 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 08, 2025～Nov 04, 2025
This ranking is based on the number of page views on our site.

Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 08, 2025～Nov 04, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テイエスエスジャパン Tokyo//Industrial Electrical Equipment
  3. ウェーブクレスト Saitama//Industrial Electrical Equipment
  4. 4 日本オートマティック・コントロール 電子システム部 Tokyo//Industrial Electrical Equipment
  5. 4 TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
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Probe Product ranking

Last Updated： Aggregation Period:Oct 08, 2025～Nov 04, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社
  5. 5 AC Current Probe "CWT Mini50HF" 日本オートマティック・コントロール 電子システム部

Probe Product List

631～645 item / All 665 items

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RF MEMS Probe "TPD40-Vertical Series"

RF MEMS Probe "TPD40-Vertical Series"

Insertion loss (GSGSG-150um pitch typ.) is -0.8dB! Probe repair and tip chip replacement are possible.

We would like to introduce our RF_MEMS probe, the 'TPD40-Vertical Series'. The frequency range is DC to 40GHz, with a characteristic impedance of 50 ohms. The connector is 2.92mm/F (K/F), and the probe configuration is GSSG or GSGSG. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000 um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TPD50-Vertical Series"

RF MEMS Probe "TPD50-Vertical Series"

Crosstalk (typ. GSGSG-150um pitch) is -35.0dB! Introducing products with a frequency range of DC to 50GHz.

We would like to introduce our RF_MEMS probe, the 'TPD50-Vertical Series.' The connector is 2.4mm/F, and it supports pitches from 50 to 1000um, featuring a low-loss, low-reflection air coplanar probe design. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low-loss, low-reflection air coplanar probe design ■ Small probe footprint ■ Available in probe pitches of 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TPD67-Angle Series"

RF MEMS Probe "TPD67-Angle Series"

The connector is 1.85mm/F (V/F)! It features a low-loss, low-reflection air coplanar probe design.

We would like to introduce our RF_MEMS probe, the 'TPD67-Angle Series.' The crosstalk (GSGSG-150um pitch typ.) is -35.0dB, the characteristic impedance is 50 ohms, and the frequency range is DC to 67GHz. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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Olympus OMCL-AC240TM equivalent AFM probe

Olympus OMCL-AC240TM equivalent AFM probe

For those looking for an alternative of equivalent quality to the Olympus OMCL series, which has been discontinued! This is the most versatile AFM probe/cantilever.

The product is a compatible item for the discontinued Olympus OMCL-AC240TM. Therefore, it can be used just like the conventional Olympus AFM probes. <Features of SPM-AC240S-AP> 1. Platinum-coated probe for precise electrical property evaluation This cantilever is ideal for electrical property evaluations such as EFM, KFM, and SCM. The probe side is coated with platinum, providing stable conductivity. 2. Sharpness and conductivity combined The design with low resistance achieves high conductivity. Additionally, by finishing the probe tip to a sharp point, it enables high-resolution observation of the fine structures on the sample surface and highly sensitive measurements of electrical properties.

  • Other microscopes

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AC Current Probe "CWT Mini50HF"

AC Current Probe "CWT Mini50HF"

AC current probe with frequency characteristics supporting up to 50MHz.

The "CWT Mini50HF" is a Rogowski coil-type current probe with a frequency response of 50MHz (-3dB). Its tip is detachable, making it easy to wrap around conductors, and it is made of a soft, thin, and easily bendable material, making it very user-friendly. Just because it is easy to use does not mean it has poor performance; it can accurately monitor fast current waveforms, sine waves, quasi-sine waves, and pulse waveforms. It is battery-operated for easy handling, but it can also be powered by an AC adapter. Please feel free to contact us.

  • EMC countermeasure products
  • relay

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Provision of evaluation technology for wire probes.

Provision of evaluation technology for wire probes.

Introduction to Theoretical Analysis of Wire Probe Wear

I worked for six years as a director and executive officer at a manufacturer of wire probes, promoting the research and development of inspection jigs. While operating independently as "Process D&T Lab," I have conducted original research and development on durability issues and plastic deformation of wire probes. Regarding durability, I found that the durability deteriorates more in powered tests than in non-powered tests, and I investigated the cause of this fact. As a result, I believe I have nearly identified the cause of power degradation. From this result, a new design policy for probes has been established. I am considering providing this analysis method. Website: https://www.process-d-and-t-lab.com/ Please refer to "Design & Tools."

  • probe
  • Tester
  • Semiconductor inspection/test equipment

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How digital proximity systems improve the reliability of rotating and reciprocating machinery.

How digital proximity systems improve the reliability of rotating and reciprocating machinery.

How digital proximity systems work: An introduction to various industries!

Proximity systems are used to monitor the vibration, position, and speed of fluid film bearing machines. They are also used to measure the wear of the rider band in reciprocating compressors and as a phase measurement source for machine diagnostic systems and condition monitoring systems. Due to the damping of fluid film bearing machines, rotor vibrations often do not transmit to the casing. Proximity probes that monitor radial and axial movements of the shaft provide the necessary information to accurately assess the condition of the machine. *For more detailed information, please refer to the related links. For further details, you can download the PDF or feel free to contact us.*

  • bearing
  • Vibration Monitoring

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[Research Material] Global Market for FISH Testing Probes

[Research Material] Global Market for FISH Testing Probes

World Market for FISH Test Probes: Single Color, Dual Color, Multi Color, Cancer, Genetic Diseases

This research report (Global FISH Testing Probes Market) investigates and analyzes the current status and outlook for the global market of FISH testing probes over the next five years. It includes information on the overview of the global FISH testing probes market, trends of major companies (sales, selling prices, market share), market size by segment, market size by major regions, and distribution channel analysis. The segments by type in the FISH testing probes market include single-color, dual-color, and multi-color, while the segments by application focus on cancer and genetic diseases. The regional segments are categorized into North America, the United States, Europe, Asia-Pacific, Japan, China, India, South Korea, Southeast Asia, South America, the Middle East, and Africa to calculate the market size of FISH testing probes. It also includes the market share of major companies in the FISH testing probes market, product and business overviews, and sales performance.

  • Other services

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[Research Material] The Global Market for High Voltage Differential Probes

[Research Material] The Global Market for High Voltage Differential Probes

World Market for High Voltage Differential Probes: 0-50MHz, 50-100MHz, 100-200MHz, 200-300MHz, 300MH...

This research report (Global High Voltage Differential Probe Market) investigates and analyzes the current status and outlook for the global high voltage differential probe market over the next five years. It includes information on the overview of the global high voltage differential probe market, trends of major companies (sales, selling prices, market share), market size by segment, market size by major regions, and distribution channel analysis. The segments by type in the high voltage differential probe market include 0-50MHz, 50-100MHz, 100-200MHz, 200-300MHz, and above 300MHz, while the segments by application cover electrical engineering, electronic communication technology, aerospace, and others. The regional segments are divided into North America, the United States, Europe, Asia-Pacific, Japan, China, India, South Korea, Southeast Asia, South America, the Middle East, and Africa to calculate the market size of high voltage differential probes. The report also includes the market share of major companies in the high voltage differential probe market, product and business overviews, and sales performance.

  • Other services

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Probe diameter φ0.1 - Pitch contact probe

Probe diameter φ0.1 - Pitch contact probe

The previous process requires a tighter pitch and stable electrical performance compared to the subsequent process. We also accept orders for the production of probe cards!

At Seiken, we offer a lineup of vertical probes compatible with P=150um. The tip is made of a well-regarded alloy known for its contact with solder and is also compatible with crown cuts, allowing for stable contact with bumps. By using a specially shaped spring to maintain a constant load, the contact with bumps is better than that of probes using standard springs with the same pitch. 【Features】 ■ Lineup of vertical probes compatible with P=150um ■ Alloy compatible with crown cuts ■ Stable contact with bumps ■ Maintains a constant load using a specially shaped spring ■ Good contact with bumps *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other electronic parts
  • Inspection fixture

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Contact probes for semiconductor testing, IC sockets, probe cards

Contact probes for semiconductor testing, IC sockets, probe cards

Flexible design and manufacturing tailored to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring to inspection.

Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ▼ Contact Probes We offer not only standard products but also flexible solutions tailored to testing conditions. ▼ Probe Cards and IC Sockets We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suited to the inspection targets at low costs. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: High frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 ▼ Contact Probes - Reduces the hassle of replacement. Durable "rare metal probes." - Revised internal structure. "New bias probes" for stable resistance value measurement. ▼ IC Sockets - Non-magnetic sockets, high heat resistance sockets. ▼ Probe Cards - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

  • Other semiconductors

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Temperature and humidity meter probe / Model number MD34SMF-2716T

Temperature and humidity meter probe / Model number MD34SMF-2716T

Temperature and humidity meter probe (smartphone wireless connection)

It can be used remotely, and you can also use calculation functions for dew point, wet bulb, BTU/h, etc., in the app. It is suitable for measuring ducts, air handlers, and dehumidifiers.

  • Thermo-hygrometer

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Probes for oscilloscopes compatible with temperature-controlled chambers, ideal for temperature reliability testing.

Probes for oscilloscopes compatible with temperature-controlled chambers, ideal for temperature reliability testing.

A must-see for electronic component designers! A probe capable of probing waveforms in a constant temperature chamber with a temperature range of -55℃ to 155℃.

This is a passive voltage probe for oscilloscopes used in reliability testing of products developed by semiconductor and electronic component manufacturers (and those that use them), including development and quality assurance. Temperature-based quality assurance is essential for the design of electronic components whose characteristics change with temperature. Engineers in electrical fields such as automotive, aviation, and railways are particularly challenged by temperature issues. If you are struggling with reliability testing and quality assurance at high and low temperatures due to low data reliability, inability to withstand temperature changes, or inability to capture signals, this is a must-see. 【Features】 - Operating temperature range: -55°C to 155°C, usable in a temperature-controlled chamber - Attenuation ratio: 10:1 - Maximum input voltage: 400Vrms (transient voltage: 1,250V) *For more details, please download the catalog or feel free to contact us.

  • oscilloscope
  • probe
  • Thermostatic chamber

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Custom order for contact probes

Custom order for contact probes

We will design probes according to the measurement temperature as a response to high temperatures. It is also possible to accommodate as a unit.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measuring special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks

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