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Microprobe Product List and Ranking from 5 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.

Microprobe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.

  1. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  2. アズサイエンス Nagano//Trading company/Wholesale 松本本社
  3. Toki Commercial Co., Ltd. Tokyo//Trading company/Wholesale
  4. 4 テイエスエスジャパン Tokyo//Industrial Electrical Equipment
  5. 5 マイクロサポート Shizuoka//Testing, Analysis and Measurement 本社営業部・開発部
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Microprobe Product ranking

Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.

  1. Imaging XPS Microprobe "ESCALAB Xi+" サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  2. Field Emission Auger Microprobe アズサイエンス 松本本社
  3. Nano probe for SEM-FIB, micro probe for optical microscope Toki Commercial Co., Ltd.
  4. 4 MFA-R 0.2-75 (Magnetic Field Microprobe) テイエスエスジャパン
  5. 5 MFA 01 Set (Active Magnetic Field Probe) テイエスエスジャパン

Microprobe Product List

1～11 item / All 11 items

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Nano probe for SEM-FIB, micro probe for optical microscope

Nano probe for SEM-FIB, micro probe for optical microscope

The self-driving nano-probe robot 'miBot', which is different from conventional manipulators!

This innovative nano-probing system can control up to eight miBot nano-probers and can be offered with various configurations and options. Customization is possible to meet application-specific requirements and installation conditions for the equipment. The compact and lightweight platform for miBot can be adapted to various electron microscopes and can be mounted on sample stages such as SEM or introduced into the sample chamber via a load lock. It also supports high-resolution imaging using semi-in-lens objective lenses, enabling nano-probing tests under high-resolution imaging at low acceleration voltages below 0.5 kV using the new FE-SEM. Additionally, it is possible to tilt the entire nano-probing system using the tilt mechanism of the SEM sample stage. This allows for circuit modification with FIB and nano-probing to be performed in the same environment, resulting in faster and more accurate failure analysis results. *For more details, please refer to the PDF document or feel free to contact us.*

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  • probe

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Imaging XPS Microprobe "ESCALAB Xi+"

Imaging XPS Microprobe "ESCALAB Xi+"

Quantitative imaging and multifunctional surface analysis! Achieved ultimate high sensitivity and energy resolution.

The "ESCALAB Xi+" is an imaging XPS microprobe that achieves ultimate high sensitivity and energy resolution through the adoption of advanced technology. A wide variety of options are available to meet diverse needs. From system control to data measurement, data analysis, and report generation, various functions are seamlessly integrated by the Thermo Scientific Avantage data system, enabling easy operation and high productivity. 【Features】 ■Ultimate performance ■Efficient operation ■Flexible design *For more details, please refer to the PDF document or feel free to contact us.

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  • probe
  • Analytical Equipment and Devices

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Freely move the collected 2μm-sized foreign matter to a disk for analysis.

Freely move the collected 2μm-sized foreign matter to a disk for analysis.

Optimal for the collection of "falling and adhering foreign substances" under a microscope.

■This is a tungsten probe (needle) optimized for handling micro-sized objects. ■You can choose the size according to the condition of the sample, ensuring stable operation at all times. ■Probes with a tip diameter of less than 1μm are particularly optimized for use with micromanipulators. ■It also has flexibility, allowing the tip to be bent for use. *For bending, the use of a probe bender is recommended. *For more details, please contact us via the link below.

  • Other electronic parts

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Microprobe for optical microscopes

Microprobe for optical microscopes

The self-driving nano-probe robot 'miBot' is different from conventional manipulators!

This innovative nano-probing system can control up to eight miBot nano-probers and can be offered with various configurations and options. Customization is possible to meet application-specific requirements and installation conditions for the equipment. The compact and lightweight platform for miBot can accommodate various electron microscopes and can be mounted on sample stages such as SEM or introduced into the sample chamber via a load lock. It also supports high-resolution imaging using semi-in-lens objective lenses, enabling nano-probing tests under high-resolution imaging at low acceleration voltages below 0.5 kV using the new FE-SEM. Additionally, the entire nano-probing system can be tilted using the tilt mechanism of the SEM sample stage. This allows for circuit modifications using FIB and nano-probing to be performed in the same environment, resulting in faster and more accurate failure analysis results. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe

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Field Emission Auger Microprobe

Field Emission Auger Microprobe

High-spec OJE electronic spectrometer

Japan Electronics Corporation JAMP-9510F Field Emission Auger Microprobe is a high-spec Auger electron spectroscopy device equipped with a stable high-current field emission electron gun, which is also used in EPMA, and enables high-throughput analysis of chemical bonding states in the nano to micro range. It achieves versatility that does not depend on the sample, providing compositional information from metallic samples to insulating samples, as well as chemical information. 〇 Features - High sensitivity and high resolution analyzer - Schottky field emission electron gun - User-centric sample stage - High durability - Waveform separation software *For more details, please download the PDF or feel free to contact us.

  • Other electronic measuring instruments

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MFA 01 Set (Active Magnetic Field Probe)

MFA 01 Set (Active Magnetic Field Probe)

Each microprobe has a built-in preamplifier! The delivery includes correction data.

The "MFA 01 Set" includes three high-resolution magnetic field microprobes capable of measuring magnetic fields up to 6GHz in signal conductors (150μm), SMD components, or IC pins, along with a bias tee and a dedicated cable. Each microprobe has a built-in preamplifier. The preamplifier (9V, 100mA) is powered through a bias tee BT 706 with a 50-ohm impedance, and the magnetic field microprobes are connected to a spectrum analyzer or oscilloscope via the BT 706. 【Specifications】 ■ Type: PCB Emission Near-Field Microprobe ■ Supported Frequency Range: 1MHz to 6GHz *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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MFA-K 0.1-12 (Magnetic Field Microprobe)

MFA-K 0.1-12 (Magnetic Field Microprobe)

Equipped with a very small probe head that functions like a coupling clamp, it is suitable for measuring RF magnetic fields up to 6 GHz.

The "MFA-K 0.1-12 Magnetic Field Microprobe" is an active near-field microprobe that requires a BT 706 bias tee to operate. It is capable of measuring current on IC pins and fine conductive paths (150μm) on components. It has the same basic structure as the "MFA-K 0.1-30," but with different frequency characteristics. Thanks to its special probe head design, it does not detect magnetic field lines generated from adjacent conductors. 【Specifications】 ■ Type: Near-field Microprobe ■ Size: Microchip size ■ Supported Frequency Range: 100MHz to 6GHz ■ Connector: SMA female, Jack ■ Resolution: 200μm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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MFA-R 0.2-75 (Magnetic Field Microprobe)

MFA-R 0.2-75 (Magnetic Field Microprobe)

Equipped with a very small and high-resolution probe head, it is suitable for measuring RF magnetic fields up to 1 GHz.

The "MFA-R 0.2-75 Magnetic Field Micro Probe" is an active near-field microprobe that requires a BT 706 bias tee to operate. The probe head has a built-in preamplifier (9V, 100mA), and power is supplied through the BT 706 with an impedance of 50Ω, allowing connection to a spectrum analyzer or oscilloscope via the BT 706. Langer's near-field microprobes are ultra-compact and very easy to use, and they are electrically well-shielded due to the current-damping sheath. 【Specifications】 ■ Type: Near-field microprobe ■ Size: Microchip-like ■ Frequency range: 1MHz to 1GHz ■ Connector: SMA female, Jack ■ Resolution: 300μm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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MFA-K 0.1-30 (Magnetic Field Microprobe)

MFA-K 0.1-30 (Magnetic Field Microprobe)

Equipped with a very small probe head that functions like a coupling clamp, it is suitable for measuring RF magnetic fields up to 1 GHz.

The "MFA-K 0.1-30 Magnetic Field Microprobe" is an active near-field microprobe that requires a BT 706 bias tee to operate. The direction of the coil in the probe head is marked with a black dot, so please check the orientation before measurement. Additionally, the delivery includes calibration data. Please use the calibration data to convert the probe's output voltage to either the magnetic field or the current flowing through the conductor. 【Specifications】 ■ Type: Near-field Microprobe ■ Size: Microchip size ■ Supported Frequency Range: 1MHz to 1GHz ■ Connector: SMA female, Jack ■ Resolution: 200μm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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MFA 02 Set (Active Magnetic Field Probe)

MFA 02 Set (Active Magnetic Field Probe)

Please use the correction data to convert the probe's output voltage into either the magnetic field or the current flowing through the conductor.

The "MFA 02 Set" includes, for example, two high-resolution near-field microprobes capable of measuring low-frequency magnetic fields up to 1GHz in signal conductors (150μm), SMD components, or IC pins, along with a bias tee and a dedicated cable. The preamplifier (9V, 100mA) is powered through a bias tee BT 706 with an impedance of 50Ω, and the magnetic field microprobes are connected to a spectrum analyzer or oscilloscope via the BT 706. 【Specifications】 ■ Type: PCB Emission Near-Field Microprobe ■ Supported Frequency Range: 1MHz to 1GHz *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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MFA-R 0.2-6 (Magnetic Field Microprobe)

MFA-R 0.2-6 (Magnetic Field Microprobe)

Equipped with a very small and high-resolution probe head, it is suitable for measuring RF magnetic fields up to 6 GHz.

The "MFA-R 0.2-6 Magnetic Field Microprobe" is an active near-field microprobe that requires a BT 706 bias tee to operate. It detects magnetic fields from IC pins on components, thin conductive paths, and tiny SMD components. It has the same basic structure as the "MFA-R 0.2-75," but only the frequency characteristics differ. There is a black dot marked laterally on the coil opening of the probe head, so please check the orientation before measuring. 【Specifications】 ■ Type: Near-field Microprobe ■ Size: Microchip size ■ Supported Frequency Range: 100MHz to 6GHz ■ Connector: SMA female, Jack ■ Resolution: 300μm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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