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Solar cell tester. We provide light sources, I-V testers, and transport systems!
A solar cell tester that conducts measurements in accordance with JISC8913/IEC60904-1 for crystalline silicon solar cell output measurement, and performs quality assessment and ranking of the tested cells.
Standard features include manual measurement mode and automatic illumination configuration function.
The "DKSMT Series" is a measurement device for the output characteristics of crystalline solar cell modules. It can be used in R&D and mass production lines. It complies with the solar simulator standards "IEC60904-9/JIS C 8912" and the output measurement method for crystalline modules "IEC60891/JIS C 8914." The standard configuration includes a Class AAA solar simulator, monitoring cells (with temperature control function), and temperature measurement units. 【Features】 ■ Complies with the output measurement method for crystalline modules "IEC60891/JIS C 8914" ■ Complies with the solar simulator standards "IEC60904-9/JIS C 8912" ■ Measurement device for the output characteristics of crystalline solar cell modules ■ Usable in R&D and mass production lines *For more details, please refer to the PDF document or feel free to contact us.
Solar cell module tester. It determines the quality of the measured module.
Measurement in accordance with JISC8914/IEC60891 for crystalline solar cell module output!
Using an EM-CCD camera, it is possible to sensitively capture images of the EL emission state of PV cells and modules.
Using a 1 million pixel high-sensitivity EM-CCD, it is possible to detect microcracks, chipping, back-side burn-in, defects, and dirt generated during the process. EM-CCD cameras have lower noise compared to cooled CCD cameras and can achieve shorter shutter speeds, making them suitable for integration into inline devices.
It is possible to sensitively capture images of the EL emission state of PV cells and modules!
The 『DKELT-1320E』 is a micro-crack inspection device for crystalline solar cell modules. Using a 1-megapixel high-sensitivity EM-CO, it can detect micro-cracks, chipping, back-side burning, defects, and dirt generated during the process, making it easy to save and reference images and defect location data. The EM-CCD camera can be integrated into inline devices because it has lower noise and shorter shutter speeds compared to cooled CCD cameras. 【Features】 ■ Assists in judgment with colored display of defect locations ■ Displays the entire module on a 32-inch large screen ■ Easy to save and reference images and defect location data ■ Capable of sensitively capturing images in EL emission state ■ Fully automatic work transport and pitch conversion of the work transport section *For more details, please refer to the catalog or feel free to contact us.
