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Electret Capacitor Sensor (ECS) Acoustic and Ultrasonic Measurement

This is a technology for an electret condenser sensor (ECS) that is thin and flexible, capable of wideband sensing of sound and ultrasound.

Introducing the "Electret Capacitor Sensor (ECS)." It is possible to manufacture thin and flexible electret capacitors using silica aggregate electrets. Even in contact with the target object, it can measure acoustic and ultrasonic waves, making it applicable for monitoring plant activities and bioacoustic sensing. 【Technical Features】 - Capable of wideband sensing (from below 1 Hz to above 200 kHz) - Pressure resistance, heat resistance, and moisture resistance - Suitable for air, biological systems, soft materials, and can also be applied underwater - Thin and flexible

  • Other measurement, recording and measuring instruments

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Surface shape measurement (surface inspection) using a light comb.

It is a technology that allows for extensive and rapid measurement of the three-dimensional structure of surfaces.

In manufacturing production lines, it is necessary to detect surface and coating defects in all individual items. However, conventional inspection devices have faced challenges in achieving extensive and high-speed high-resolution sampling measurements. This technology realizes extensive and high-speed measurement of three-dimensional surface structures through optical frequency comb (optical comb) single-shot tomographic imaging technology. 【Features of the Technology】 - The optical comb enables measurement of three-dimensional structures over a wide area and at high speed. - The optical comb allows for non-contact measurement of object shapes. - It is possible to simultaneously measure attribute information of the measurement target (such as refractive index, transmittance, reflectance, etc.). - High-speed one-dimensional scanning is unnecessary, making it resistant to vibrations. 【Verification Examples in the Laboratory】 - Verification of surface structure measurements using various materials. - Measurement of two-dimensional cross-sectional images (in the depth direction) of laminated materials and compositional analysis, etc. This technology is expected to lead to the development of inspection devices capable of extensive and high-speed surface defect detection while simultaneously measuring optical properties such as reflectance.

  • Defect Inspection Equipment

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