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probe Product List and Ranking from 155 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 08, 2025～Nov 04, 2025
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 08, 2025～Nov 04, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テイエスエスジャパン Tokyo//Industrial Electrical Equipment
  3. ウェーブクレスト Saitama//Industrial Electrical Equipment
  4. 4 日本オートマティック・コントロール 電子システム部 Tokyo//Industrial Electrical Equipment
  5. 4 TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
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probe Product ranking

Last Updated： Aggregation Period:Oct 08, 2025～Nov 04, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社
  5. 5 AC Current Probe "CWT Mini50HF" 日本オートマティック・コントロール 電子システム部

probe Product List

226～240 item / All 657 items

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Single Compression Test Head / Universal Test Head

Single Compression Test Head / Universal Test Head

Test head suitable for very large components.

The "Single Indenter Test Head/Universal Test Head" is a high-precision depth measurement system (durometer) that measures the indentation of a plastic ball according to ISO 2039/1. The "Single Indenter Test Head" is a test head that descends with a single indenter position and work clamp, while the "Universal Test Head" is a descending test head equipped with a turret with 6, 7, and 8 positions, standard three indenters, and three targets. It features a load cell, force feedback, and a closed-loop system, complying with ISO, ASTM, and JIS standards. 【Main Features】 ■ Indentation depth of plastic ball according to ISO 2039/1 ■ 15-inch industrial HD touchscreen ■ Built-in powerful fanless system controller ■ Double 80GB SSD data storage drive ■ Indenter zoom function *For more details, please refer to the PDF document or feel free to contact us.

  • Testing Equipment and Devices
  • Other measurement, recording and measuring instruments

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[Demo unit available] TFC Spring Separator

[Demo unit available] TFC Spring Separator

Automatically separates without damage! A spring separator that contributes to work efficiency.

The "TFC Spring Separator" is a device that automatically separates entangled springs without damaging them by rotating them. Thanks to our uniquely developed control technology, it can be designed to accommodate various supply conditions, significantly contributing to the efficiency of operations through appropriate processing. 【Features】 ■ The separator demonstrates high-precision separation capabilities regardless of the size, pitch, or shape of the springs. ■ Excellent processing capacity enables speedy spring supply. ■ The variable rotation speed helps to reduce noise. ■ By combining with a standard feeder, it achieves low costs and allows for the selection of controls suitable for the supply conditions. *For more details, please refer to the PDF document or feel free to contact us.

  • Separation device

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Introduction of contact probes | Compatible with tip diameters down to 1μ!

Introduction of contact probes | Compatible with tip diameters down to 1μ!

Contact probe for prototyping and research!

At Seiko Gokou Contact Metal Co., Ltd., we manufacture contact probes tailored to customer specifications for prototyping and research, as well as for small lot production. We specialize particularly in tungsten needles. Additionally, as an agent for various material manufacturers, we can also assist in selecting and proposing materials that match the circuit's requirements. *For more details, please feel free to contact us.*

  • Other machine elements
  • probe

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Bear Board Tester Probe "C-0.38 Series"

Bear Board Tester Probe "C-0.38 Series"

Introducing contact probes compatible with a 0.7mm pitch, highly regarded worldwide!

At Nippon Denshin, we mainly manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" provide highly reliable products to the electronics industry, backed by many years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-0.38 series' is a probe for bare board testers compatible with a 0.7mm pitch. 【Features】 ■ Compatible with 0.7mm pitch ■ Five types of tip shapes ■ Lead wire processing for sockets is also possible ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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Probe for Bear Board Tester "C-0.72 Series"

Probe for Bear Board Tester "C-0.72 Series"

Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!

At Nippon Denshin, we primarily manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" supply highly reliable products to the electronics industry, backed by years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-0.72 series' is a probe for bare board testers compatible with a 1.27mm pitch. 【Features】 ■ Compatible with 1.27mm pitch ■ 9 types of tip shapes ■ Thorough quality control ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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Selection Guide "Probe Selection Method"

Selection Guide "Probe Selection Method"

We are currently offering a guide that clearly explains the method for selecting probes with illustrations.

Japan Electric Needle offers a variety of contact probes for printed circuit board inspection, ranging from ultra-fine types to large types, and is distributing a "Probe Selection Method." 【Selection Procedure】 1. Check the pitch 2. Confirm the total length and distance to the target 3. Choose the tip shape 4. Determine the spring pressure We provide clear explanations with illustrations and tables. *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Inspection fixture
  • Processing Jig

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High current probe "HC100 series" with a rated current of 12A.

High current probe "HC100 series" with a rated current of 12A.

Introducing a high current probe compatible with a 2.54mm pitch and rated for a current of 12A.

This is a new product from Nippon Denshin Co., Ltd., which has contributed to the development of the electronics industry, including contact probes, through years of experience, achievements, and a wealth of accumulated technology. It has a rated current of 12A and a shape similar to the commonly used 100mil probes. 【Specifications】 <Material and Surface Treatment> ■ Plunger: BeCu with Ni undercoating and Au plating ■ Spring: SUS ■ Sleeve: Phosphor bronze with Ni undercoating and Au plating ■ Socket: BST or Pb with Ni undercoating / Au plating <Compatible Sockets> ■ C-07-S8-N ■ C-1.37Q-S-1A Au *For more details, please request documentation or view the PDF data available for download.

  • Processing Jig
  • probe

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Wire Probe "NW Series"

Wire Probe "NW Series"

Supports a minimum pitch of 0.11mm. Specification changes to match the shape of the device are also acceptable.

The "NW Series" is a wire probe designed for ultra-narrow pitch contacts. We offer three types: Φ0.07mm, Φ0.09mm, and Φ0.11mm. It strokes through "flexibility" and does not have a complex mechanism, enabling contact in narrow pitches that are difficult to achieve with spring probes. We also accommodate specification changes to match the shape of the device. It can be provided as a single unit or as a complete set with fixtures. 【Features】 ■ Compatible with wiring extraction ■ Two types of tip shapes available ■ Wide range of needs addressed from design to manufacturing *For more details, please refer to the documentation. Feel free to contact us with any inquiries.

  • others

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Needle Probe [For Printed Circuit Boards and Semiconductor Package Continuity Testing Tool!]

Needle Probe [For Printed Circuit Boards and Semiconductor Package Continuity Testing Tool!]

Needle probes suitable for continuity testing fixtures for substrates (printed circuit boards and semiconductor packages)! Precision machining with a focus on quality!

The "NP (Needle Probe)" is a probe used for continuity testing fixtures of substrates (printed circuit boards and semiconductor packages). We offer a wide variety of tip shapes backed by reliable processing technology. Additionally, we have applied a plating treatment that is resistant to peeling. 【Features】 ■ Meticulous fine processing ■ Sharp edges ■ Step coating that pursues uniqueness (optional) *For more details, please request our materials or view the PDF data available for download.

  • probe

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NMR probe for narrow gaps 'EFM-150P/EFS-150F'

NMR probe for narrow gaps 'EFM-150P/EFS-150F'

A product that allows for the absolute measurement of magnetic field strength using proton solid samples!

The "EFM-150P/EFS-150F" is an ultra-thin NMR probe designed for narrow gaps, achieving a thickness of 1.5mm using a newly developed ultra-flat sensor coil. It enables NMR measurements in gaps that were previously difficult to insert into. By inserting it into a small gap, measurements can be taken in areas with good magnetic field uniformity, significantly improving measurement accuracy and stability. Additionally, it can be combined with general-purpose magnetic field measuring instruments (Tesla meters and Gauss meters) such as the EFM-2000AX and EFM-3000AX, as well as the EFS-800 NMR sensor. 【Features】 ■ Newly developed ultra-flat sensor coil ■ Can be inserted into narrow magnetic pole gaps ■ Can be inserted into areas with good magnetic field uniformity ■ Measures absolute magnetic field using proton samples ■ Compatible with various NMR magnetic field measuring instruments (Tesla meters and Gauss meters) *For more details, please download the PDF or feel free to contact us.

  • 超薄型狭隙間用NMRプローブ『EFM-150PEFS-150F』2.JPG
  • probe

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Optional probe for magnetic field measuring device

Optional probe for magnetic field measuring device

With a thickness of 6mm at the tip, it is suitable for cases where the gap for inserting the probe is narrow!

This product is an optional probe for magnetic field measurement devices (teslameters and gaussmeters) consisting of a transmission amplifier, a sample coil, and a modulation coil. The modulation coil is arranged to generate a modulation magnetic field parallel to the measured magnetic field. The sample coil is fixed in a direction that generates a high-frequency magnetic field orthogonal to this. The modulation coil comes in standard and axial types depending on the orientation, while the sample coil is available in a single-coil type and a multi-coil type arranged in proximity with 2 to 4 coils. 【Lineup (excerpt)】 ■ Standard probe EFM-1P ■ Thin probe EFM-2P ■ Low magnetic field probe EFM-20P ■ High magnetic field probe EFM-30P ■ Axial measurement probe EFM-10P *For more details, please download the PDF or feel free to contact us.

  • 磁場測定器用オプションプローブ2.JPG
  • 磁場測定器用オプションプローブ3.JPG
  • 磁場測定器用オプションプローブ4.JPG
  • 磁場測定器用オプションプローブ5.JPG
  • 磁場測定器用オプションプローブ6.JPG
  • 磁場測定器用オプションプローブ7.JPG
  • probe

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Contact Probe

Contact Probe

Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!

We offer a wide variety of "contact probes," including high-frequency compatible probes, heat-resistant probes, coaxial probes, and ultra-fine probes (φ0.2 and above). Additionally, we can manufacture custom-made probes that are optimal for the shape of your device, so please feel free to consult us if you have any requests. 【Product Lineup】 ■ KHP-001 to 30 Series ■ KHS Series ■ KH-007 Series ■ KH-700 Series ■ KH-2000 Series, etc. *For more details, please download the PDF or feel free to contact us.

  • probe

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Vane-type wind speed smart probe 'testo410i' [Rental]

Vane-type wind speed smart probe 'testo410i' [Rental]

Wireless probe capable of measuring and recording wind speed and temperature via Bluetooth communication.

Equipped with convenient calculation modes for various applications such as duct air volume measurement, it allows for easy input of duct information. 【Features】 ■ Displays measurement values on Android/iOS devices (smartphones and tablets) ■ Connects up to 6 probes with a single device for simultaneous measurements ■ Capable of graphing measurement data, saving (Android only), and sending via email ■ Easy setting of duct information in air volume calculation mode ■ Dedicated app available for download from Google Play and the App Store (free)

  • Wind Speed/Volume Meter

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Contract assembly and processing of semiconductors: LED chip probe

Contract assembly and processing of semiconductors: LED chip probe

We measure electrical characteristics, brightness, wavelength, and ESD. Inspections are conducted in wafer and sheet states, accommodating various specifications such as top surfaces and upper and lower electrodes!

Measurement of electrical characteristics, brightness, wavelength, and ESD. Depending on the supply form, inspections can be conducted in wafer or sheet state, accommodating various specifications such as top surface and upper and lower electrodes. Additionally, if probe testing is required from mass production to small quantities of prototypes, please feel free to consult us. 【Overview】 ■ Top surface and upper/lower electrodes: 2 to 4 inches ■ Back surface: 2 to 4 inches ■ Integrating sphere: 2 to 4 inches *For more details, please refer to the PDF document or feel free to contact us.

  • Chip type LED

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