Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.
451～480 item / All 721 items
The humidity accuracy is at the highest level of ±0.4% (accuracy at 15℃ to 30℃ for HT-EIS)!
It is a high-precision temperature and humidity sensor from Novasina. The humidity accuracy is at the highest level of ±0.4% (accuracy of HT-EIS at 15°C to 30°C). It is used in combination with a dedicated transmitter.
Ideal for the collection of "falling and adhering foreign substances" under a microscope.
■This is a tungsten probe (needle) optimized for handling micro-sized objects. ■You can choose the size according to the condition of the sample, ensuring stable operation at all times. ■Probes with a tip diameter of less than 1μm are particularly optimized for use with micromanipulators. ■It also has flexibility, allowing the tip to be bent for use. *For bending, the use of a probe bender is recommended. *For more details, please contact us via the link below.
Ideal for FIB processed thin film lift-out.
■It is a glass precision probe. ■It is optimized for the lift-out of thin sections for TEM processed by FIB. *For more details, please contact us via the link below.
![[For those in the semiconductor and electronic equipment industry] Product catalog for short probes and other items.](https://image.mono.ipros.com/public/product/image/9a0/2000476885/IPROS62501335801067437866.jpeg?w=280&h=280)
We will introduce product information by genre for various precision tools and fixtures used in semiconductor manufacturing, as well as individual product specifications.
This catalog features probes and other products handled by Rika Electronics. It includes a lineup of products designed primarily for inspecting semiconductor packages, such as the "short probe," as well as "IC sockets" that achieve a short conduction length with low-resistance contacts. You can choose according to your application. [Featured Products] ■ Short Probes ■ IC Sockets ■ Probe Guards for WLCSP ■ Test Fixtures ■ RDK Bonding Tools *For more details, please refer to the PDF document or feel free to contact us.
Introducing fine pitch probes for wafer inspection compatible with a 0.15mm pitch!
The "RI-010HA-05-PDH" is a fine pitch probe for wafer inspection. It is compatible with a 0.15mm pitch and is suitable for vertical inspection. Multiple options are available for the plunger material as well. In addition, we offer a wide range of special probes for high-frequency applications, high-temperature applications, and Kelvin applications. 【Materials】 ■A Plunger: Pd Alloy ■Barrel: Ni / Inner Au ■Spring: SWP / Au-Plated ■B Plunger: SK / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.
We also have a round conical type available! A probe with a frequency characteristic of 41.5GHz.
The "RI-028LA-03-A2" is a probe with excellent high-frequency characteristics. It has a frequency characteristic of 41.5GHz. Additionally, it can accommodate multiple materials for the plunger. We also offer the round conical type "RI-028IA-01-A2." 【Materials】 ■A Plunger: BeCu / Au-Plated ■Spring: SWP / Au-Plated ■B Plunger: BeCu / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.
Introducing fine pitch probes for wafer inspection compatible with a 0.13mm pitch!
The "RI-A90HA-01-PDH" is a fine-pitch probe for wafer inspection. It is compatible with a pitch of 0.13mm and is suitable for vertical inspection. In addition, we offer a variety of special probes for high-frequency applications, high-temperature applications, and Kelvin applications. 【Materials】 ■A Plunger: Pd Alloy ■Barrel: Ni / Inner Au ■Spring: SWP / Au-Plated ■B Plunger: BeCu / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.
DisplayPort analysis probe
DisplayPort Analysis Probe for Logic Analyzers ■ Capable of measuring DisplayPort packet data!! ■ Supports X1, X2, X4 DisplayPort ■ Data measurement up to 2.7 GT/s ■ Includes software for logic analyzers ■ Displays the status of the DisplayPort ■ Compatible with both display data and AUX channel
High Current Probes
Supports up to 600A; compatible with fine pitch (from a pitch of 0.5mm).
Fine Pitch Probes
Ideal for fixtures requiring ultra-fine pitch for the inspection of wafers, electronic components, substrates, panel displays, etc., where high-density and high integration are further advancing. Supports pitches from 0.3mm.
We are currently offering a free comprehensive catalog of spring contact probes!
Free catalog of spring contact probes available now!! ★If you are interested, please contact us★ ★Some catalogs can be viewed via download★ 【Overview】 The exclusive distributor in Japan for FEINMETALL, the world's largest manufacturer of wire harness testing probes (Germany). We provide a one-stop solution with a wide range of product lineup. Custom specifications are also accepted. For anything related to probes, including high current, high frequency, rotation, switches, non-magnetic, and heat-resistant... feel free to consult us. 【Product Examples】 ◆ Switch probe with an outer diameter of 1.0mm ◆ High current probe capable of handling up to 600A ◆ High frequency probe capable of handling up to 20GHz ◆ Semiconductor probe with a diameter of 0.20mm, total length of 3.3mm, spring pressure of 60g, and a lifespan of over 1 million cycles
General Probes (Normal Probes)
This series excels in cost-effectiveness and offers various shapes for probe tips and socket colors.
Probe for implementation board inspection
This is a series of probes for in-circuit testing and functional testing. We offer long-stroke specifications and probes that can adjust the height from the circuit board surface.
Lead-free compatible probe
This is a probe with a sharper tip and a higher initial load, featuring a special coating on the tip, ensuring reliable contact with lead-free solder pads and fillets.
High Frequency Probes (Coax Probes)
This is a contact probe equipped with shielding functionality against external noise, capable of measuring in the high-frequency range.
Switching Probes
It is a contact probe that incorporates a switch function and turns ON/OFF at a specified contact stroke. There is also a solder-free type that allows for easy probe replacement.
Screw-type probe
This is a probe that prevents the pins from falling out due to the spring's rebound force by being screwed into a threaded receptacle (socket).
Interface probe
This is a probe suitable for in-circuit tester systems such as Jenrad, Digital Test, Spare, and Agilent.
Completely non-magnetic (permeability < 1.01μ). Minimum pitch 0.35mm or more.
Completely non-magnetic (permeability < 1.01μ). Minimum pitch 0.35mm～
Probes With Endless Plunger
This is a low-resistance probe with a built-in plunger that does not use a socket.
Sturdy and economical. Reliability increases even in unfavorable environments.
Robust and economical. The compact tool setting probe is a highly cost-effective solution for high-speed breakage detection and high-precision tool length measurement within machine tools. The proven design utilizing linear motion principles and optical signal generation methods enhances reliability even in challenging environments. 【Features】 ○ Z-pico: For micron-level machining (capable of measuring φ50μm tools) ○ Z-Nano: Capable of measurement at a feed rate of 2m/min (capable of measuring φ0.1mm tools) ○ Options: Chip guard and air nozzle ○ Z-Nano IR and Z-Nano RC: Infrared communication types For more details, please contact us or download the catalog.
It features the proven shark360 mechanism, boasting precision and long lifespan.
Diverse and economical. The Tool Setting Probe 3D series can be used for a wide variety of applications including tool length and diameter measurement, as well as breakage detection within machine tools. Most probes in this series utilize the proven shark360 mechanism, which boasts unparalleled accuracy and longevity. 【Features】 ○ Z3D: Cable type ○ Z-MT: Cable type with shark360 mechanism ○ Communicates with two measuring devices using one receiver ○ Tool length measurement For more details, please contact us or download the catalog.
Automatic centering of workpieces with high speed and high precision, as well as measurement of workpiece dimensions, is possible.
The touch probes TC51 and TC61 are a globally unique measurement system that allows not only for Z-direction compression measurement but also for Z+ direction pull measurement. This measurement system, which combines high rigidity, is specifically designed for mass production equipment and high-speed machining, enabling automatic centering of workpieces and measurement of workpiece dimensions with high speed and precision. By using a high-precision, proven bidirectional measurement principle, it achieves the highest accuracy even at ultra-high measurement speeds. 【Features】 ○ Mechanism for pull measurement and compression measurement → Additional measurement in the Z+ direction → Bloom measurement principle with a two-direction fixed measurement unit ○ Optical signal generation method → Wear-free signal generation method using internal small optical sensor shielding → LED display for confirming the probe's status ○ Latest data communication technology → Reliable data communication using the latest infrared method or BRC radio wave technology → Long battery life due to low power consumption communication technology and robust design For more details, please contact us or download the catalog.
Complex work, free-form surfaces, and contour measurement times will be extremely shortened.
Digital log innovation. "Digital log" refers to high-precision digital measurement using touch signals and the ability to scan cyber speed using analog signals. The touch probe "TC76-DIGILOG" significantly reduces measurement time for complex workpieces, free-form surfaces, and contours through analog scanning. This touch probe can be applied to lathes, machining centers, and grinding machines. Accuracy is improved by applying filters to measurement values or adopting averages. 【Features】 ○ Detection of processing defects in gear grinding machines ○ Digital log: Skip signal measurement and analog signal measurement For more details, please contact us or download the catalog.
For those looking for an alternative of equivalent quality to the Olympus OMCL series, which has been discontinued! This is the most versatile AFM probe/cantilever.
This product is equivalent to the OMCL-AC200TS from Olympus, which has been discontinued. Therefore, it can be used in the same way as conventional Olympus AFM probes. <Features of SPM-AC200S-AS> 1. Compatible with a wide range of samples This product, with its mid-range cantilever mechanical properties, is suitable for measuring a wide variety of samples, from soft materials to hard materials, including silicon semiconductors, glass, metals, and plastics. It is also suitable for use as a screening tool when measuring samples for which optimal cantilever mechanical properties are not yet determined. 2. Stable tip structure A stable and sharp probe achieved through sharpening treatment and experience in manufacturing conventional probes. The adoption of a tetrahedral shape allows for easy confirmation of the positional relationship between the sample and the probe when measuring with an SPM device combined with an optical microscope, facilitating accurate positioning adjustments.
Introduction of A2LA accredited calibration! Featuring a field-replaceable battery-equipped electric field probe!
The "MODEL HI-6006" is a high-performance sensor that enables fast and accurate electromagnetic field measurements. Designed to read in a single range, this product can continuously read data across the entire dynamic range. With optical coupling for various readout options, it provides ideal support for a wide range of field monitoring applications. 【Features】 ■ Frequency response: 100 kHz to 6 GHz ■ Dynamic range: 0.5 to 800 V/m ■ Provides electric field values for each axis and composite values ■ Field-replaceable battery ■ A2LA certified calibration ■ Can be controlled by third-party control software *For more details, please refer to the PDF document or feel free to contact us.
You can evaluate the electrical properties of small conductive samples with AFM!
The ORCA conductive AFM probe holder allows for conductive AFM imaging and I-V measurements with all Asylum MFP-3D AFM/SPM systems. The standard module can measure currents ranging from approximately 1 pA to 20 nA. Models with different current measurement ranges and dual-gain models are also available. This conductive AFM can simultaneously measure the shape of the sample and the current distribution map. It provides valuable measurements across a wide range of material characteristics, including insulating thin films, ferroelectric films, nanotubes, and conductive polymers.
A versatile, high-performance, high-precision temperature and humidity sensor probe compatible with all temperature and humidity measurements!
The "HC2A-S" is a high-precision temperature and humidity sensor probe that achieves accurate temperature and humidity measurements and is equipped with a dew point calculation function. This product, which is the standard type temperature and humidity sensor probe of the HygroClip2 (HC2) series, combines ease of use with a simple structure integrated with the sensor body, along with high functionality and precision. In addition to being compatible with Rotronic temperature and humidity measurement devices, the sensor probe itself possesses all the necessary functions as a temperature and humidity sensor unit, making it ideal for OEM applications such as equipment integration. 【Features】 - Dew point measurement through internal calculation processing of relative humidity and temperature - Top-class accuracy and reproducibility - Integrated management of measurement data and calibration history - Alarm settings can be configured within the sensor probe - Enhanced and user-friendly calibration function For more details, please refer to the catalog or feel free to contact us.
High-precision temperature and humidity sensor probe capable of measuring temperature and humidity under high pressure.
The "HC2-IExxx-M" is a pressure-resistant type temperature and humidity sensor probe that enables temperature and humidity measurement under high pressure due to its pressure-resistant structure in the sensor section. It is ideal for temperature and humidity management in compressed air systems such as compressors and high-pressure gas piping in factories. It achieves high-precision temperature and humidity measurements and is equipped with a dew point calculation function. 【Features】 ■ Pressure-resistant structure in the temperature and humidity sensor section ■ Capable of measuring temperature and humidity under high pressure ■ High precision ■ Equipped with a dew point calculation function For more details, please refer to the catalog or feel free to contact us.
Ideal for combination with handheld temperature and humidity meters! Handheld type sensor probe.
The "HC2-HK25/40" is a handheld type temperature and humidity sensor probe that can accommodate wide-range measurements. It achieves high-precision temperature and humidity measurements and is equipped with dew point calculation functionality. Measurements can be taken in high-temperature environments while holding the handle. We offer two types based on temperature range and shape. 【Features】 ■ Ideal for combination with handheld temperature and humidity meters ■ Capable of wide-range measurements ■ Handheld type ■ Equipped with dew point calculation functionality For more details, please refer to the catalog or feel free to contact us.
