Industrial appearance inspection device for semiconductor wafers "L Series"
We would like to introduce a product that assists in identifying defects in semiconductor wafers!
In the manufacturing process of semiconductor wafers, identifying minute defects is directly linked to product quality. In particular, even slight scratches or foreign substances on the surface can potentially affect the performance of the wafer. High-precision inspection technology is required to accurately capture these defects. The "L Series" is equipped with PHASERAY, which applies medical lighting technology, and features special phase-polarization technology that cancels reflections, thereby assisting in the identification of fine defects on wafer surfaces. It can be retrofitted, supports visual inspections and inline responses, and allows for customization based on specific situations. 【Usage Scenarios】 - Identification of defects such as scratches, foreign substances, and coating irregularities on semiconductor wafer surfaces - Inline inspection on manufacturing lines - Assistance in visual inspections in quality control departments 【Benefits of Implementation】 - Reduced risk of overlooking defects - Improved inspection accuracy - Enhanced production efficiency
- Company：和田電機
- Price：Other
