We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Microscope.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

Microscope Product List and Ranking from 30 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

Microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. null/null
  3. null/null
  4. 4 null/null
  5. 5 null/null
Go to Company Ranking

Microscope Product ranking

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. Digital Microscope "VHX-X1 Series"
  2. Digital Microscope "VHX-D500/D510"
  3. USB microscope for monitor output (D-Sub/VGA)
  4. 4 Microscope PI640i
  5. 5 3D Microscope [Realistic 3D playback without wearing goggles or glasses]

Microscope Product List

76～90 item / All 142 items

Displayed results
Microscope "MXK-SCOPE 5.0M"

Microscope "MXK-SCOPE 5.0M"

A microscope that achieves high-resolution and stress-free magnified observation!

The "MXK-SCOPE 5.0M" is a microscope equipped with a class-leading 5-megapixel USB 3.0 camera. It also supports capturing still images and videos. Camera control can be performed via software. Additionally, it achieves high versatility in measurements with 13 commonly used measurement commands and an automatic edge detection function. 【Features】 ■ Live image display (full-size display available) ■ Abundant image processing functions ■ Automatic edge measurement ■ Image stitching function ■ Live focus synthesis *For more details, please download the PDF or feel free to contact us.

  • Microscope
  • Other microscopes

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Standard Version of Flat Field Halation Observation Microscope (Medium Magnification)

Standard Version of Flat Field Halation Observation Microscope (Medium Magnification)

Detection of scratches down to "4 microns" with a zoom magnification of 0.75 to 4.5 times.

This is a highly versatile microscope that allows for easy detection of defects through zooming in and magnified observation. It features a telecentric zoom lens with a magnification range of 0.75 to 4.5 times and high-brightness illumination that minimizes halation, achieving high-quality images. It excels in quality inspection as a microscope for planar observation, enabling the "seeing of the unseen."

  • Microscope

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
24mm field of view R illumination halation microscope

24mm field of view R illumination halation microscope

The Halation Microscope provides lossless images due to the direct reflection of external illumination.

This is a curved surface observation microscope that can be observed at a zoom magnification of 0.2 to 1.6 times. It is equipped with a unique halation R lighting system that provides a field of view of 24×18 mm, making it a microscope for surface observation without shadows, allowing you to "see the unseen." It is a versatile microscope that can be applied to a wide range of observations, including scratches and dents on φ16 shafts, lens scratches, bubbles, cracks, and chips in metal pipes, which could not be observed with conventional methods.

  • Microscope

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Haleration Microscope "PS-100-S6Z45C"

Haleration Microscope "PS-100-S6Z45C"

It comes with a height reading dial, allowing for depth measurement as well, making it highly versatile.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all elements that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left is a comparative image captured using the halation microscope "PS-100-S6Z45C" (medium magnification) for planar observation, showing the ITO of the LCD under halation lighting and incident lighting. The image under incident lighting does not show the ITO, while the image under halation lighting clearly reveals the ITO.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Halation Microscope "PS-100-S6Z90A"

Halation Microscope "PS-100-S6Z90A"

Since it is a specular reflection image due to external illumination, an image without loss can be obtained.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left shows a comparative image of dirt on an IC chip captured using the "PS-100-S6Z90A" halation microscope for planar observation (high magnification) with halation lighting and reflected lighting. The image taken with reflected lighting does not capture the dirt, while the image taken with halation lighting clearly shows the dirt.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Haleration Microscope "PS..S7Z16R100-2"

Haleration Microscope "PS..S7Z16R100-2"

With its unique lighting effect, it has become possible to observe curved and R surfaces.

The halation lighting system utilizing specular reflection allows for the capture of images of cracks, scratches, and dirt that are difficult to see with conventional incident lighting, achieving outstanding high-resolution images. Since a reflection image with a small angle can be obtained, it is now possible to observe surface irregularities "more easily," "more reliably," and "more quickly" than before, significantly simplifying tasks such as quality inspection. This is the optimal model for curved surface observation and will help resolve issues related to observing R surfaces. The image on the left is a comparison captured by the halation microscope "PS-100-S7Z16R100-2" for curved surface observation, showing scratches and mold on the lens surface using both halation and incident lighting. The incident lighting image captures only a small part of the scratches on the lens, while the halation lighting image clearly captures both the scratches and the mold.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Haleration Microscope "PS..S7Z16R100-2M"

Haleration Microscope "PS..S7Z16R100-2M"

Haleration Microscope with a maximum field of view of 24×18mm, designed for R illumination curved surface observation, equipped with an illumination controller.

Haleration Microscope "PS-100-S7Z16R100-2M" Wide Field Curved Surface Version, Maximum Field of View 24×18mm for R Lighting Curved Surface Observation (13x to 53x on a 15" monitor, with 11-column lighting selection controller). This is a microscope for curved surface observation that can be observed at a zoom magnification of 0.2 to 1.6 times. The R lighting features a controller that allows for selective illumination of 11 columns, cutting out unnecessary lighting and focusing on "seeing the unseen" for surface observation. It secures a field of view of 24×18mm, enabling wider field observations of scratches, dents on shafts and metal pipes, cracks, and chips in mounted components, and the effective use of lighting further enhances the capabilities of this imaging sensor tool. For more details, please download the catalog.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
New product! Halation Microscope

New product! Halation Microscope

"PS-100-S7Z45D" is an image with no loss due to specular reflection from external illumination.

The external illumination captures the specular reflection image. As a result, the color of the workpiece is lost, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The moving image shown below is a comparative image captured with the halation microscope "PS-100-S7Z45D" (medium magnification) for flat observation, using halation lighting and incident lighting on a metal painted surface. The image under incident lighting makes it difficult to capture scratches, while the image under halation lighting does not capture color but clearly reveals the scratches.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Halleation Microscope

Halleation Microscope

Observation of curved surfaces and R surfaces is also possible with unique lighting effects 'PS-100-S7Z45R100A'

The halation lighting system utilizing specular reflection allows for the capture of images of cracks, scratches, and dirt on cylindrical objects like shafts, which are difficult to see with conventional incident lighting, achieving outstanding high-resolution images. Since a specular reflection image can be obtained with external lighting, it enables observation of surface protrusions and other features "more easily," "more reliably," and "more quickly" than before, significantly simplifying tasks such as quality inspection. The halation microscope "PS-100-S7Z45R100A" is the optimal model for curved surface observation and will help resolve issues related to observing R surfaces. The moving image shown below is a comparative image captured using the halation microscope "PS-100-S7Z45R100A" (medium magnification) for curved surface observation, depicting a 2φ shaft illuminated with both halation lighting and incident lighting. The incident lighting image captures only the apex of the shaft, while the halation lighting image covers over 60°.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Haleration Microscope "PS-100-S7Z90A"

Haleration Microscope "PS-100-S7Z90A"

Since it is a specular reflection image due to external illumination, an image without loss can be obtained.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all elements that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left is a comparative image taken with the high-magnification halation microscope "PS-100-S7Z90A" for planar observation, capturing the ITO and spacers of the LCD using halation lighting and incident lighting. The image captured with incident lighting does not show the ITO, while the image captured with halation lighting clearly recognizes both the ITO and the spacers.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
【Special Campaign Price】Haleration Microscope

【Special Campaign Price】Haleration Microscope

Easily, quickly, and reliably inspect for dents, scratches, and dirt on surfaces! Achieve outstanding high-definition images!

※ Free distribution of sample evaluation images ※ Using a halation lighting system that utilizes specular reflection, we achieve outstanding high-definition images of cracks, scratches, and dirt on cylindrical objects such as shafts, which are difficult to see with conventional incident lighting. (Comparison images with incident lighting are available) Since a specular reflection image is obtained through external lighting, it is now possible to observe surface protrusions and conduct quality inspections "more easily," "more reliably," and "more quickly" than before. 【Reasons to Choose Us】 ■ Images are obtained without loss due to the specular reflection from external illumination. ■ We adopt a halation lighting system that divides a semicircle (140°) into ten parts. ■ The raised condition of dents, scratches, and dirt on the shaft surface can be confirmed. 【Limited-Time Campaign Benefits】 ■ Free provision of images taken of your work! ■ Special campaign price for a limited time! ■ We can visit for a demonstration if requested. For more details, please download the catalog or contact us. 【Information on Flat Observation and New Halation Three-Eye Tube Stereo Microscope】 ⇒ For more details, please refer to the 'Special Site.'

  • Microscope

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Low-cost microscope

Low-cost microscope

Low-cost microscope

Recommendation for Introducing an Image Magnification System Achieve high performance microscopes at low prices!! 20x to 110x magnification ● Enables quality inspection and verification report creation, as well as observations by multiple people ● Can be connected to a PC using the SL-62/CMOS camera (sold separately), allowing for easy measurement and image processing.

  • Microscope

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Search Keywords Related to Microscope

COPYRIGHT © 2001-2025 IPROS CORPORATION ALL RIGHTS RESERVED.