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Test Handlers Product List and Ranking from 10 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Test Handlers Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. SYNAX Nagano//Industrial Electrical Equipment
  2. テセック Tokyo//Electronic Components and Semiconductors
  3. エム・イーシステム Oita//Industrial Electrical Equipment
  4. 4 澁谷工業 メカトロ統轄本部 Ishikawa//Other manufacturing
  5. 4 上野精機長野 Nagano//Electronic Components and Semiconductors
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Test Handlers Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. SYNAX Corporation Business Introduction SYNAX
  2. MEMS Test Handler "ULTRA P" テセック
  3. Film Frame Test Handler '4170-IH' テセック
  4. Multifunction Test Handler TM288P 澁谷工業 メカトロ統轄本部
  5. 4 Semiconductor manufacturing equipment horizontal transport test handler エム・イーシステム

Test Handlers Product List

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MEMS Test Handler "ULTRA P"

MEMS Test Handler "ULTRA P"

Ideal for measuring MEMS devices! Also compatible with measurements in temperature environments.

"ULTRA P" is a handler developed for the final testing of MEMS devices such as accelerometers and gyroscopes. By using a unique transport method, it achieves simultaneous measurements of up to 96 sites, enabling low-temperature and high-temperature measurements, as well as 6DOF (3 positions, 3-axis gyroscope) measurements. Additionally, we have prepared a measurement unit called "ULTRA L" that allows for manual measurements for research and development purposes. 【Features】 ■ Simultaneous measurement of many units (up to 96 DUT) ■ High-precision temperature control (within ±1℃) ■ Measurement at 60OF is possible ■ Achieves over 20,000 UPH ■ Magnetic testing (optional) is available *For more details, please refer to the catalog or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment

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Film Frame Test Handler '4170-IH'

Film Frame Test Handler '4170-IH'

Improved transport accuracy and load capacity of the measurement table! Compatible with WLCSP, multi-site, and batch contact.

The "4170-IH" is a film frame test handler that tests leadless devices such as QFN and CSP directly on the wafer after dicing. By performing visual position correction (xyzθ) before measurement, accurate position information of the device and optimal probe pin pressure are maintained across all devices on the strip, achieving stable measurements and high-speed indexing. 【Features】 ■ High throughput ■ High load capacity, high thrust table ■ Expanded strip attachment area - Within 260mm in length × 300mm in width (WLCSP within φ300mm) ■ LOT management compatible with barcode/2D code reader ■ Switching between varieties is a simple exchange involving only the measurement socket replacement and screen settings. *The downloadable PDF material is the English version of the catalog. For more details, please refer to the PDF material or feel free to contact us.

  • Other inspection equipment and devices

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Test Handler for Normal, High, and Low Temperatures

Test Handler for Normal, High, and Low Temperatures

A test handler that can perform inspections with an accuracy of ±3°C from low to high temperatures!

The "Test Handler" can perform inspections from low to high temperatures with a temperature accuracy of ±3°C. The loader can be replaced with user-specific trays, sticks, etc. Each measurement unit can also be freely swapped. Unnecessary measurement units can be removed, allowing for immediate measurement flow. 【Features】 ■ Consistent measurement possible at room temperature 23°C, high temperature 150°C, low temperature -40°C, with temperature accuracy of ±3°C ■ The loader can be replaced with user-specific trays, sticks, etc. ■ Each measurement unit can be freely swapped ■ Unnecessary measurement units can be removed, allowing for immediate measurement flow *For more details, please contact us.

  • Other inspection equipment and devices

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NS Technologies Inc. IC Test Handler NS-8040SH

NS Technologies Inc. IC Test Handler NS-8040SH

Middle-range model: A handler that thoroughly pursues excellent stability and significant reduction in working time.

A mid-range model that balances performance and cost-effectiveness - Easy setup (automatic transport adjustment feature): The transport adjustment time for supply/recovery robots during variety setting or variety switching can be reduced from about 1 hour to approximately 10 minutes. - Easy changeover: The nozzle replacement time can be shortened by about 30 minutes. Due to the magnetic fixation, no tools are required, leading to a reduction in setup time. *1: Time for parameter setting work to reduce jams *2: Compared to conventional models from NS Technology Co.

  • Tester
  • Circuit Board Inspection Equipment

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High-Temperature Test Handler 'TH233C'

High-Temperature Test Handler 'TH233C'

TO220 series device high temperature measurement inspection equipment

The "TH233C" is a high-temperature test handler for TO220 that is suitable for mass production and can connect to large test boxes. Devices supplied via aluminum or plastic tubes are individually sent to the measurement section after heating, measured in a high-temperature state, and classified into designated tubes based on the results. It has three measurement sections and can connect to various test boxes, and a lead inspection mechanism can be optionally installed. 【Features】 ■ High speed and compact size ■ Mass production type that can connect to large test boxes ■ Three measurement sections, compatible with various test boxes ■ Easy operation via a touch panel ■ Lead inspection mechanism available as an option *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
  • Automatic sorting machine

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Test Handler "TH285"

Test Handler "TH285"

SOP device measurement inspection equipment. Supports RF measurement! High-speed, compact equipment for SOP, SSOP, and DIP.

The "TH285" is a test handler for SOP, SSOP, and DIP that has up to four measurement sections and can be connected to various test boxes. It individually retrieves ICs supplied by aluminum or plastic magazines, installs one or two at the same time into the measurement socket, and classifies and stores them into designated sticks based on the measurement results. It takes into account miniaturization, simplification of variety changes, simplification of maintenance, and enhancement of optional features. 【Features】 - Mass production type that can connect to large test boxes - Up to four measurement sections, compatible with various test boxes - Easy variety change - Simple operability via touch panel - Lead inspection mechanism available as an option *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
  • Automatic sorting machine

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Crystal Test Handler (Inspection Classifier)

Crystal Test Handler (Inspection Classifier)

- High-speed processing of classification by frequency inspection and electrical characteristics inspection - Compatibility with various sizes through attachment exchange

■High-speed processing Stable high-speed processing has been achieved through index drive using servo motors and reducers, probe operation via direct motor drive, and direct drive in the sorting section. ■Supports various inspections ■Automatic recovery function from work jams By automatically discharging the disk entry section, the system can recover from work jams without operator intervention, thereby improving operational efficiency.

  • Automatic sorting machine
  • Other semiconductor manufacturing equipment
  • Oscillator

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Multifunction Test Handler TM288P

Multifunction Test Handler TM288P

It is a multifunctional test handler designed for SOPs and similar components! It can accommodate various supply forms!

The TM288P adopts a pick-and-place type indexing conveyor system. It can accommodate measurement positions (up to 8 locations), laser marking, and appearance inspection (top/side/bottom) within the index.

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  • Other electronic parts

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Semiconductor Gravity Test Handler C8/C9 Series

Semiconductor Gravity Test Handler C8/C9 Series

A device that transports parts to semiconductor inspection equipment. It is a gravity-based transport device. It is capable of performing transport and appearance inspection simultaneously.

To transport parts to semiconductor inspection equipment, throughput is an important selection criterion. CCTECH's C8 and C9 series are gravity-based transport devices and handlers. The C8 series is for transport only, while the C9 series supports both transport and appearance inspection. The appearance inspection uses two cameras to inspect the appearance of semiconductor packages.

  • Tester
  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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Semiconductor manufacturing equipment horizontal transport test handler

Semiconductor manufacturing equipment horizontal transport test handler

It is a device that automatically sorts good products and defective products in the inspection process after IC packaging.

M.E. System Co., Ltd. primarily engages in the design and manufacturing of jigs and tools used in the manufacturing processes of precision equipment, as well as the design and manufacturing of precision manufacturing devices used in the semiconductor back-end process, focusing on precision machining and precision sheet metal processing. The horizontal transport test handler is a device used in the inspection process after IC packaging, connected to a tester, which automatically sorts ICs into good and defective products based on the test result signals from the tester. For more details, please contact us or refer to the catalog.

  • Other semiconductor manufacturing equipment
  • Automatic sorting machine

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Support from inspection to analysis storage 'TR Room Temperature Handler'

Support from inspection to analysis storage 'TR Room Temperature Handler'

A high-speed test handler that performs everything from inspection of supplied devices to classification and storage!

The "TR Room Temperature Handler" performs electrical characteristic testing by connecting a designated tester to devices supplied from a parts feeder and stick at the measurement section, and classifies and stores them into specified sticks based on the measurement results. *For more details, please contact us.*

  • Other inspection equipment and devices

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SYNAX Corporation Business Introduction

SYNAX Corporation Business Introduction

We deliver products that make life simpler and more comfortable.

SYNAX Corporation is a company that develops and manufactures electronic application machinery primarily for the semiconductor and electronics industries. We offer high-temperature multi-handlers, low-temperature multi-handlers, and custom products. Since our establishment in 1986, we have been providing test handlers for semiconductor manufacturing, contributing to making your lives simpler and more comfortable. 【Business Activities】 ■ Development and manufacturing sales of electronic application machinery for the semiconductor and electronics industries *For more details, please refer to our catalog or feel free to contact us.

  • Company：SYNAX
  • Price：Other
  • Semiconductor inspection/test equipment

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Test handler

Test handler

Settings and adjustments can be made via the touch panel! There are various manufacturing achievements in high-temperature environments and more.

This product is a semiconductor test handler integrated device using contact probes. It retrieves strip-shaped lead frames from the stacker magazine, processes the products into individual pieces with a lead processing device, and tests them using contact probes. The products in the testing section are transported using suction hands, and most of the transportation is numerically controlled by servo motors, allowing for settings and adjustments via a touch panel. Additionally, our company has various manufacturing achievements in high-temperature environments and more. 【Features】 ■ Products are processed into individual pieces by the lead processing device ■ Tested using contact probes ■ Transportation by suction hands ■ Settings and adjustments possible via touch panel ■ Various manufacturing achievements, including in high-temperature environments *For more details, please refer to the PDF materials or feel free to contact us.

  • Contract manufacturing
  • Testing Equipment and Devices

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Small Test Handler "TH281"

Small Test Handler "TH281"

SOP system device high-temperature measurement inspection classification. High throughput, low jam rate, space-saving! Compact device for room temperature/high-temperature measurements.

The 『TH281』 is a compact test handler designed for room temperature/high temperature measurements compatible with devices such as SOP, SSOP, and TSSOP. It features a structure that allows for docking with large test heads and is compatible with various sockets including standard sockets, high-frequency sockets, and flat contacts. Additionally, each component has been modularized to achieve quick changeover between different types. 【Features】 ■ High throughput, low jam rate, space-saving ■ Large-capacity loader and unloader suitable for mass production ■ Structure compatible with docking large test heads ■ Modularized components for quick changeover ■ Compatible with various sockets *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
  • Automatic sorting machine

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High-Temperature Manual Chip Test Handler

High-Temperature Manual Chip Test Handler

Manual handler capable of high-temperature measurement inspection for chip devices, temperature up to 250℃.

Manual handler capable of measuring chip devices at high temperatures up to 250℃ Place the chip on the table and start Automatically measures and ejects the device Overheating of devices up to 250℃ is possible Contacts are made using probe pins Compatible if supplied contacts are available

  • Other inspection equipment and devices
  • Testing Equipment and Devices
  • probe

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