SOP device measurement inspection equipment. Supports RF measurement! High-speed, compact equipment for SOP, SSOP, and DIP.
The "TH285" is a test handler for SOP, SSOP, and DIP that has up to four measurement sections and can be connected to various test boxes. It individually retrieves ICs supplied by aluminum or plastic magazines, installs one or two at the same time into the measurement socket, and classifies and stores them into designated sticks based on the measurement results. It takes into account miniaturization, simplification of variety changes, simplification of maintenance, and enhancement of optional features. 【Features】 - Mass production type that can connect to large test boxes - Up to four measurement sections, compatible with various test boxes - Easy variety change - Simple operability via touch panel - Lead inspection mechanism available as an option *For more details, please refer to the PDF document or feel free to contact us.
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【Specifications (Excerpt)】 ■Device: SOP, SSOP, TSSOP, DIP ■Magazine: Aluminum multi-channel magazine ■Measurement Mode: Parallel/Single ■Utility ・Power Supply: 100V 1.5kVA max ・Compressed Air: Clean dry air of 0.5MPa (5.1kgf/cm2) or higher *For more details, please refer to the PDF document or feel free to contact us.
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【Usage】 ■For SOP, SSOP, and DIP *For more details, please refer to the PDF document or feel free to contact us.
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We design, manufacture, and sell semiconductor inspection equipment, particularly for power semiconductors. In addition to inspection equipment, we also design and manufacture production equipment tailored to our customers' needs. We can also accommodate equipment outside of the semiconductor field. Please feel free to contact us with your requests.