Dynamic Tester『ST-2400』
It is a device that measures the dynamic characteristics of semiconductors according to specified test conditions.
The "ST-2400" is a device designed for safely and efficiently conducting research and development, reliability testing, and destructive testing as a dynamic tester for power devices. It allows for the setting of up to 10 waveform analysis conditions with a single pulse application, enabling a reduction in evaluation time. The program for conducting tests requires only the input of necessary parameters for the condition items, making it easy to operate. Additionally, test results are saved in measurement data (CSV format) and waveform data (CSV format and JPG format), allowing for the creation of graphs and tables using commercial software (such as Excel). 【Features】 ■ Easy management of measurement data and waveform data ■ Top-class dynamic characteristic testing for power devices ■ Suitable for shortening product development time for power devices *For more details, please download the PDF or feel free to contact us.
- Company:嶺光音電機
- Price:Other