Causes and Countermeasures of Ion Migration: Preventing Invisible Defects on the Substrate
What is ion migration? An explanation of invisible defects that threaten the reliability of electronic devices.
Modern electronic devices are highly advanced, and even minor malfunctions can lead to significant incidents. Events that undermine insulation threaten the reliability of products, and one phenomenon that can contribute to this is ion migration, which has been considered a past issue. It has been said that this has been overcome due to the evolution of various insulating materials such as coatings and resists, as well as the advancement of no-clean technologies. However, as the miniaturization and high density of electronic substrates progress rapidly, ensuring insulation has become increasingly difficult, and the risk of ion migration is once again rising. This article will explain why ion migration has become a trend again, exploring its mechanisms, specific countermeasures, and evaluation methods to assess the potential for occurrence. *For more detailed information, please refer to the related links. For further inquiries, feel free to download the PDF or contact us.*
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