Industrial CT micromelx neo/nanomelx neo
Introduction of efficient and compact 2D X-ray and 3D CT scanners for on-site use.
The "micromelx neo/nanomelx neo" provides high-resolution 2D X-ray technology and 3D computed tomography (CT) scanning capabilities in a single system, enabling non-destructive testing (NDT) of electronic components such as semiconductors, PCBAs, and lithium-ion batteries. In addition to innovative engineering, it features extremely high positioning accuracy, making it suitable for X-ray inspection of industrial electronic components in process and quality control, failure analysis, and research and development. 【Features】 ■ Automation of inspections is possible within a micrometer measurement range using a CAD-based μAXI that is easy to program. ■ Achieves high dynamic live imaging with active cooling at a 180 kV setting. ■ Clear live imaging and high-speed data acquisition. ■ A highly dynamic DXR flat panel detector achieves 30 frames per second. ■ Offers optional 3D CT scanning in under 10 seconds. *For more details, please refer to the PDF materials or feel free to contact us. Please note that personal information registered with Ipros may be shared and contacted by our authorized distributors. Thank you for your understanding.
- Company：日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社 ＆ GEエナジー・ジャパン株式会社
- Price：Other
