Application of XPS analysis to tablets
You can obtain information about the chemical composition, bonding state, and valence of the outermost surface!
We would like to introduce the application of XPS analysis to tablets. X-ray photoelectron spectroscopy (XPS) is an analytical method that observes electrons emitted when X-rays are irradiated onto a sample, allowing us to extract information about the electrons present within the sample. This technique provides information on the chemical composition, bonding states, and valence of the surface. Please feel free to contact us if you have any inquiries. 【Features】 ■ Composition analysis of the topmost surface at a few nm (Li～) is possible ■ Sensitivity is approximately 0.1 atomic% ■ Electronic state analysis (chemical bonding, valence, gap, etc.) is possible ■ Measurement of insulators and organic materials is possible (non-destructive analysis) ■ Measurement area ranges from several tens to several hundred μm in diameter *For more details, please download the PDF or feel free to contact us.
- Company：東芝ナノアナリシス
- Price：Other
