Semiconductor test solutions
Cutting-edge testing systems supporting the AI era! Solutions that achieve semiconductor testing with technology and quality.
The "Semiconductor Test Solution" is a system that supports a wide range of advanced semiconductor testing, including SiPh wafer testing and CPO testing. This product achieves high throughput and reliable evaluation through high-precision positioning and multi-site parallel measurement. By integrating temperature control, ultra-high precision measurement, and fully automated technology, it contributes to improved testing efficiency and stable quality assessment. 【Features】 ■ Supports a wide range of advanced tests including SiPh, CPO, WAT & RDL, HBM KGSD, and more ■ Achieves high throughput with up to 4-site parallel measurement and high-precision Pick & Place ■ Equipped with temperature testing from -40°C to 125°C and ultra-high precision measurement technology ■ Integrates fully automated handlers and flexible MES collaboration software *For more details, please download the PDF or feel free to contact us.
- Company：Yonata Electronics
- Price：Other
