Semiconductor tester for high-speed testing of MLCCs and IPDs.
Expansion of measurement conditions and built-in 64 LCR meters enable faster and more accurate inspections!
Our "R-5920MK2" and "R-5940A" are multi-pin high-speed testers that achieve overwhelming efficiency and speed in the inspection of electronic components such as MLCCs (Multi-Layer Ceramic Capacitors) and IPDs (Integrated Passive Devices). We offer two new models tailored to our customers' inspection needs. 【R5920MK2】 ■ 4W inspection speed increase: Added "designated point output pull-in function" to the scanning unit for reliable judgment in bulk. ■ Improved contamination cleaning function: Cleaning current can be freely modulated and controlled from 100mA to 200mA. ■ Simultaneous parallel inspection with 64 LCR meters: LCR meters are directly built into the scanner card itself. ■ Significant increase in measurement speed: Achieved faster capacitance measurement speed compared to conventional testers. ■ Supports measurement of direct current consumption: Capable of controlling MEMS microphone ICs, allowing for measurement of power consumption.
- Company：ニデックアドバンステクノロジー 本社、東京営業所、名古屋営業所
- Price：Other
