Optical waveguide/CPO propagation loss measurement device/loss measurement device prism coupler
Next-generation device CPO applicable for optical waveguide loss measurement.
In addition to being used solely as a three-dimensional light refractive index and film thickness measurement device, it can also perform next-generation device CPO optical waveguide loss measurement. Based on the matching oil method, it allows for high-precision evaluation. Of course, it is suitable for general transparent films, thin films on transparent films, quartz, liquids, and applications such as three-dimensional birefringence measurement of FPD films and SiO2. The installed lasers can range from 405nm to 1550nm, with up to four types available. Birefringence measurement is conducted by rotating between the X and Y axes with an accuracy of 0.05° and measuring at any position. Additionally, for multilayer thin films, it is possible to simultaneously measure the optical refractive index and film thickness of two layers individually without any assumptions.
- Company：マツボー
- Price：Other
