アポロウエーブ　 Product Lineup

The "MBP-55" is a compact prober suitable for chip-level IV/CV measurements. It accommodates sample sizes up to 50mm square and is an integrated unit equipped with a shield box. Additionally, it supports microcurrent IV, micro-capacitance CV measurements, and high-frequency measurements. Its compact size and lightweight design make it easy to transport. 【Features】 ■ Ideal for chip-level IV/CV measurements ■ Supports sample sizes up to 50mm square ■ Integrated unit equipped with a shield box *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

The "AP-150/AP-200" is a semi-automatic prober that supports wafer sizes of up to 6 and 8 inches, respectively. Thanks to the effect of the compact shield, stable microcurrent measurements are possible. The compact shield mechanism allows for the replacement of dry air, preventing condensation even at low temperatures. Additionally, it can be equipped with features such as automatic wafer alignment and automatic individual chip alignment utilizing image recognition. 【Features】 ■ Supports power device measurements of over 20kV and 200A ■ Compatible with wafer sizes of up to 6 and 8 inches, respectively ■ Stable microcurrent measurements are possible due to the effect of the compact shield ■ Control software that is easy for operators to understand and excels in usability ■ Can be equipped with automatic wafer alignment and automatic individual chip alignment *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

-60℃ to +350℃ temperature characteristic evaluation, microcurrent measurement Compatible with power device measurements over 20kV and 200A ◎ A compact shield mechanism that can replace dry air prevents condensation even at negative temperatures. ◎ The compact shielding effect enables stable microcurrent measurements. ◎ The control software is user-friendly and excels in operability for operators. ◎ It can be equipped with automatic wafer alignment and automatic individual chip alignment utilizing image recognition. ◎ The control software is designed with icons arranged in process order to prevent operators from getting lost during operation, enhancing usability. ◎ It has a wafer alignment function that allows for angle adjustment and fine-tuning of XY positions using a model. ◎ After registering the die origin position, it features automatic detection of characteristic patterns through image processing, registering them as reference models. ◎ It is also possible to automatically align registered individual chips placed in a registered tray using image recognition. (Optional) ◎ It can be equipped with auto XYZ to accommodate wafer expansion, etc. (Optional)

• Other inspection equipment and devices

◎It is very compact, making it easy to measure on a desk. ◎It can be moved with an external operation-type positioner (probe) even in a vacuum. ◎It has excellent shielding effects, blocking light and noise. ◎The MJ-8 is slim, designed with Hall effect measurements in mind.

• Other inspection equipment and devices

The "α series" is a manual prober that meets a wide range of evaluation and analysis needs with comfortable operability. You can choose from multiple types of stages and optical systems. The wafer loading and unloading can be easily performed in an open-front configuration. The Z drive features a three-stage action operated by a lever. Alignment is performed approximately 300μm away from the wafer, allowing the stage to move without losing focus from the microscope. 【Features】 ■ Selectable stages/optical systems ■ Three-stage switching for Z ■ Easy stage movement ■ Reliable alignment *For more details, please refer to the catalog. Feel free to contact us with any inquiries.

• Other physicochemical equipment

Apollo Wave Co., Ltd. is a company primarily engaged in the manufacturing and sales of various types of probe cards. We handle manual probers that accommodate chip sizes up to 300mm wafers, as well as high-frequency probe cards and DC multi-contact probes that strongly support the upcoming era of wafer testing. Focusing on high frequency, temperature, and microcurrent, we contribute to cost reduction through wafer-level inspection. 【Business Activities】 ■ Manufacturing and sales of various probe cards ■ Manufacturing and sales of manual probers and hot chucks *For more details, please refer to our catalog or feel free to contact us.

• Other inspection equipment and devices