Temperature characteristic evaluation at extreme low to ultra-high temperatures, measurements in vacuum and gas environments.
◎It is very compact, making it easy to measure on a desk. ◎It can be moved with an external operation-type positioner (probe) even in a vacuum. ◎It has excellent shielding effects, blocking light and noise. ◎The MJ-8 is slim, designed with Hall effect measurements in mind.
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basic information
For detailed specifications, please download the catalog.
Price range
P5
Delivery Time
Applications/Examples of results
Semiconductor device measurement Material evaluation
Company information
We sell probe cards, manual probers, and hot chucks used for on-wafer measurements of semiconductor devices. We particularly offer products for high-frequency (RF), low current (low leakage), and high-temperature (thermal resistance) measurements. Please feel free to contact us with any inquiries or questions.
