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  5. Other measurement, recording and measuring instruments
  6. Semi-Automatic Prober 'AP-150/AP-200'

Semi-Automatic Prober 'AP-150/AP-200'

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last updated:Apr 07, 2021

アポロウエーブ  本社
アポロウエーブ  本社
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Temperature characteristic evaluation from -60℃ to +350℃, suitable for microcurrent measurement! No condensation even at negative temperatures.

The "AP-150/AP-200" is a semi-automatic prober that supports wafer sizes of up to 6 and 8 inches, respectively. Thanks to the effect of the compact shield, stable microcurrent measurements are possible. The compact shield mechanism allows for the replacement of dry air, preventing condensation even at low temperatures. Additionally, it can be equipped with features such as automatic wafer alignment and automatic individual chip alignment utilizing image recognition. 【Features】 ■ Supports power device measurements of over 20kV and 200A ■ Compatible with wafer sizes of up to 6 and 8 inches, respectively ■ Stable microcurrent measurements are possible due to the effect of the compact shield ■ Control software that is easy for operators to understand and excels in usability ■ Can be equipped with automatic wafer alignment and automatic individual chip alignment *For more details, please refer to the PDF document or feel free to contact us.

    Other measurement, recording and measuring instruments
2021-04-07_16h55_45.png

Semi-Automatic Prober 'AP-150/AP-200'

2021-04-07_16h55_45.png
2021-04-07_16h55_45.png
  • Related Link - https://www.apollowave.co.jp/lineup_cat/lineup05/

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basic information

【Expected Measuring Instruments for Connection】 ■ Semiconductor Parameter Analyzer ■ Power Device Analyzer ■ Source Measure Unit ■ Curve Tracer ■ LCR Meter ■ Digital Multimeter ■ Impedance Analyzer ■ Network Analyzer ■ Various measuring instruments from other manufacturers *For more details, please refer to the PDF document or feel free to contact us.

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【Applications】 ■ Microcurrent IV measurement (fA level) ■ CV measurement ■ High power measurement at 20kV/200A level ■ High-frequency measurement ■ Temperature characteristic testing in high and low temperature environments ■ Reliability testing such as TDDB *For more details, please refer to the PDF document or feel free to contact us.

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アポロウエーブ 

アポロウエーブ  本社

Testing, Analysis and Measurement

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We sell probe cards, manual probers, and hot chucks used for on-wafer measurements of semiconductor devices. We particularly offer products for high-frequency (RF), low current (low leakage), and high-temperature (thermal resistance) measurements. Please feel free to contact us with any inquiries or questions.

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