ファインシス List of Products and Services

**[Needs]** Currently, we are using a microscope for visual inspection of appearance, but we want to build a system to improve the working environment of operators and inspection efficiency. **[Improvement Example]** The mapping software TeleMatri can manage the position of the stage and the input of pass/fail judgment results on the map, which can improve inspection efficiency. We can also provide only the controller (including software), allowing for combinations with XY stages from other manufacturers or custom-made ones. This increases the flexibility of system design and reduces the effort required for software development.

• Optical Measuring Instruments
• Other FA equipment
• Other microscopes

You can attach it to the top surface of the precision lab jack to increase the size of the top surface of the lab jack.

• Other physicochemical equipment
• Analytical Equipment and Devices

This is a device for probing and measuring/testing surface-emitting lasers (VCSEL) and photodiodes (PD/APD) in wafer form. ■ VCSEL - I-L-V measurement - V-I measurement - Wavelength measurement - High-frequency characteristics ■ PD/APD - V-I measurement (dark current, photocurrent) - High-frequency characteristics ■ Features - Peak search function for optical axis alignment - Back contact compatible with flip chips - Measurement items and content can be customized in the software to meet customer specifications.

• Semiconductor inspection/test equipment

**[Needs]** I want to obtain data for the entire workpiece using measuring instruments such as spectrometers, film thickness gauges, contact angle meters, and laser displacement meters. **[Improvement Example]** By linking various measuring instruments with an XY stage, automatic measurement of the entire workpiece will be performed. It is also easy to create I/O control programs for the measurement start output and end input of the measuring instruments. Even if the measurement target or measurement pitch changes, it can be quickly accommodated by simply changing the map shape. (The function for acquiring and saving measurement data will be required on the measuring instrument side.)

• Optical microscope
• Inspection fixture
• Other microscopes

【Issues】 When saving images of the entire workpiece, it was necessary to repeatedly perform "save image → move to adjacent view area → save image → ..." which was time-consuming and labor-intensive. 【Improvement Proposal】 By linking a CCD camera that saves images with an XY stage through a capture trigger signal, images of the entire workpiece can be automatically acquired. An I/O control program for image acquisition can also be easily created. This will free us from labor-intensive tasks and improve productivity. (The CCD camera will need to have an image saving function.)

• Optical microscope
• Other FA equipment
• Other microscopes

**[Needs]** We are developing a program to link the marker printer and the XY stage using a sequencer, but due to the small-batch production of various types, we frequently have to change the program when the types of parts change. **[Improvement Example]** We link the marker printer and the XY stage to mark each part. We can easily create I/O control programs for the marker printer's marking start output and end input. Even if the inspection target changes, we can respond immediately by simply changing the map shape.

• Optical microscope
• Other FA equipment
• Other microscopes

**[Needs]** I want to mark only the defective parts on the pallets that were judged as good or bad in the inspection of the previous process with an NG mark using a dispenser. **[Improvement Example]** By linking the dispenser with the XY stage, we will move only to the specified locations on the map for NG marking. It is also easy to create I/O control programs for the measurement device's start output and end input. Even if the measurement target or measurement pitch changes, we can respond immediately by simply changing the map shape.

• Optical microscope
• Other FA equipment
• Other microscopes

【Issues】 The standard stage that comes with the microscope is too small, making it impossible to observe large workpieces. We were wasting time cutting the workpieces down to size or preparing them for observation. 【Improvement Example】 We have prepared a gantry-style XY stage (with a travel range of 200mm). By fixing the microscope on the X-axis and setting the workpiece on the Y-axis, you can observe the entire workpiece. Please consult us regarding the stage's travel range.

• Optical microscope
• Other FA equipment
• Other microscopes

【Issues】 When inspecting elements such as wafers and electronic components arranged in an orderly manner under a microscope, it is often the case that even if a defective area is found, it becomes unclear which element it is. 【Improvement Example】 The mapping software TeleMatri allows for the management of the stage's position on the map, eliminating the possibility of making mistakes about the current inspection location. By color-marking defective areas on the map and later outputting a report, the results can be accurately recorded, thereby improving work efficiency.

• Optical microscope
• Other FA equipment
• Image Processing Equipment

Equipped with software optimized for microscope and micro-scope observation and inspection. ■ Mapping Function The movement range of the stage is displayed in a map format, allowing for instant movement to the desired cell and sequential indexing of work by cell units. This is ideal for combining images in a magnified field of view. Additionally, to support report creation after observation and inspection, features such as comment input, linking with captured observation images, and report output are available. ■ Joystick and Foot Switch A joystick and foot switch are provided to allow operation without taking your eyes off the microscope. ■ Programming Function You can program the movement of the stage for automated movement. By combining it with measuring instruments or image processing devices, you can easily build an automation system. *We support installation with various microscopes and micro-scopes. Please consult us.

• Semiconductor inspection/test equipment
• Microscope
• others

This is a controller for XY stages that dramatically improves the observation and inspection efficiency of microscopes and micro scopes. ◆ Mapping Function ◆ With a unique mapping function, efficient operation is possible through color marking. ◆ Check and Image Capture Efficiency is Significantly Enhanced! ◆ - With a dedicated joystick and footswitch, continuous observation is possible without taking your eyes off the screen. - Cells can be color-coded and stored, allowing for instant movement to desired locations or back to the original position with a double-click. ◆ Features ◆ - Easy and effortless operation for anyone, not just experts. - Dramatically improves work efficiency when retrofitted to existing XY stages. - Simply double-clicking on the desired cell instantly moves the work. - Positions can store and output text, observation image locations, etc. - Inspection results can be output in an Excel report. - Programs for linking with external control devices can be easily created. ⇒⇒ You can watch a demo video from the URL in the catalog.

• Optical microscope
• Microscope
• Video Recorder

【Background】 We were conducting inspections by programming the image processing device with a sequencer. Due to the production of various small quantities, we frequently had to change the program. 【Improvement Example】 We linked the image processing device with the XY stage to color mark defective areas on the map. It is also easy to create I/O control programs for the processing start output and pass/fail judgment input of the image processing device. Even if the inspection target changes, we can respond immediately by simply changing the map shape.

• Other FA equipment
• Image Processing Equipment
• Other microscopes

A lab jack ideal for height adjustment of large and heavy workpieces. The movement mechanism is a pantograph type, making it effective for height adjustment of heavy items such as laser oscillators, optical components, and various assemblies. By rotating the handle, the stage surface moves horizontally in relation to the base. 【Note】 Due to the pantograph movement mechanism, the amount of movement per handle rotation varies. ☆ For more details, please request the documentation for confirmation.

• Other physicochemical equipment
• Analytical Equipment and Devices

The software, which has been well-received as an integrated solution with the XY stage, is now available as a tool software at a low price! Just attach it to your current microscope or microscope! "I didn't know such a convenient thing existed!" This "highly regarded" mapping software dramatically enhances the efficiency of visual inspections and supports zero inspection omissions. □■Features■□ ● Displays the observation points in real-time and manages the displayed locations with the software. You can easily identify the inspected points, supporting zero inspection omissions. ● One-click OK/NG results! Inspection results can be output as files. ● Can be retrofitted to your existing microscope! ● Displays your current location without losing sight of the observation position! ⇒ You can watch the demo video from the URL in the catalog.

• Image Processing Equipment