Optical semiconductor prober
This is a device for probing and measuring/testing surface-emitting lasers (VCSEL) and photodiodes (PD/APD) in wafer form. ■ VCSEL - I-L-V measurement - V-I measurement - Wavelength measurement - High-frequency characteristics ■ PD/APD - V-I measurement (dark current, photocurrent) - High-frequency characteristics ■ Features - Peak search function for optical axis alignment - Back contact compatible with flip chips - Measurement items and content can be customized in the software to meet customer specifications.
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basic information
This is a device for probing and measuring/testing surface-emitting lasers (VCSEL) and photodiodes (PD/APD) in wafer form. ■ VCSEL - I-L-V measurement - V-I measurement - Wavelength measurement - High-frequency characteristics ■ PD/APD - V-I measurement (dark current, photocurrent) - High-frequency characteristics ■ Features - Peak search function for optical axis alignment - Back contact compatible with flip chips - Measurement items and content can be customized in the software to meet customer specifications.
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Applications/Examples of results
Optical semiconductor devices (VCSEL/PD/APD)
Company information
We will assist in the "improvement" of research and development and manufacturing fields based on precision motion control and software technology.
![[Example of Problem Solving] "There is simply not enough space in the production area."](https://image.mono.ipros.com/public/product/image/e0d/2001058796/IPROS48326759216327322836.png?w=280&h=280)
