Testing, Analysis and Measurement

ワイ・システムズ

EstablishmentAugust 14, 2002
capital350Ten thousand
number of employees13
addressTokushima/Tokushima-shi/1-3-4 Higashikōshū
phone088-660-7633
last updated：
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ワイ・システムズ List of Products and Services

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YWafer Mapper RD8-WL

Wafer mapping device with robot transport, multifunctional 200x200mm, RD8 series wafer PL

The RD8 series wafer mapping device is designed to accommodate various wafer sizes and shapes with a maximum measurement area of 200×200mm. Basic measurements include photoluminescence, epitaxial film thickness, wafer warpage, transmittance and reflectance, backside illumination phosphor analysis, and wafer thickness measurement, and we also offer customized solutions to meet customer needs.

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PL Mapping Device YWafer Mapper RD8

Customizable Wavelength Range: 200nm - 5nu Compatible Wafer Mapping Device Wafer PL Photoluminescence Multifunctional

The RD8 series wafer mapping device is designed to accommodate various wafer sizes and shapes with a maximum measurement area of 200×200 mm. Basic measurements include photoluminescence, epitaxial film thickness, wafer warpage, transmittance and reflectance, back-side illuminated phosphor analysis, and wafer thickness measurement. We also offer customized solutions to meet our customers' specific needs.

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YWafer Mapper GS4

Photoluminescence and film thickness mapping measurement equipment for 2, 3, and 4-inch wafers for LED/LD production Wafer PL

Y Systems was established based on its achievements in measurement and evaluation technologies in research environments for blue laser diodes (LD) and light-emitting diodes (LED). In 2001, we commercialized the first unit of our current flagship product, the Y-Wafer Mapper, with our staff. We will continue to play a part in the cutting-edge technology of solid-state lighting.

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