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JMT

addressSaitama/Hidaka-shi/Saruta 289-1
phone042-985-8855
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last updated:Jun 18, 2025
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Test socket Test socket
class="retina-image"

LID Less Socket

We can propose a socket structure that does not require LID for measurements of image sensors that need optical testing.

In measurements such as those involving image sensors, it is essential to incorporate light; however, in a typical socket structure, the presence of a pressurized LID can create a situation where light has difficulty entering. To address this issue, PCR has developed a LID LESS socket that distorts the contactor by attracting the package from the backside in a vacuum, allowing for conduction. The absence of a pressurized LID enables free light intake, eliminating constraints in socket design. Additionally, the lack of a LID simplifies and reduces the cost of the socket, making it feasible for cost-reduction efforts beyond just image sensor measurement applications. However, since the pressure is determined by atmospheric pressure, there may be cases that cannot be accommodated depending on the package size and pin count. For detailed specifications, we conduct individual designs for each project, so please feel free to contact our company for inquiries.

  • Other electronic measuring instruments

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Socket for System Level Testing (SLT)

By leveraging the advantages of short-distance connections, it is possible to conduct characteristic verification in a state close to the implementation status.

The PCR socket is a sheet contact type, allowing for short-distance connections that make contact with the target object over a surface (area). The connection state is close to that of the implementation state, and with minimal characteristic loss, it enables stable measurements that are closer to the actual equipment. Therefore, it can be applied in applications that require detailed characteristic data verification, such as design validation, system-level testing, and failure analysis. The shape can also be freely designed, allowing measurements on actual products where socket installation is difficult (a pressure mechanism needs to be considered separately). For detailed specifications, individual designs will be conducted for each project, so please feel free to contact our company representative.

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Short-distance connection connector

Leveraging the advantages of short-distance connections, we will replace the connections that only had implementation solutions with a socket-based approach.

We will replace the top and bottom connections of the circuit board, which were previously soldered, with a socket method. This allows for easy insertion and removal, making maintenance simpler. Additionally, since soldering will not be performed, there will be no damage to the circuit board from heat, allowing for an extended lifespan of the board. The connection length will be comparable to that of soldered connections, and there are no concerns regarding characteristic loss. We will improve the variability of manual soldering with a contact sheet that has absorption capabilities. For detailed specifications, we will conduct individual designs for each project, so please feel free to contact our company representative.

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IC measurement substrate damage protection tool

Protects the measurement board from damage to the pad of the probe pin socket. Enables the operation of expensive measurement boards without the need for maintenance.

When probe pin sockets are applied, there may be situations where damage occurs to the terminals of the measurement board, necessitating pad repairs. Pad repairs require both cost and time, and there may be cases where spare boards need to be prepared. By applying JMT's board damage protection tool, we can eliminate damage to important measurement boards and reduce the costs and time associated with repair work. Additionally, we can propose stable contacts by applying distributed PCR at the connection points between the socket board and the measurement board. The board damage protection tool receives the connection with the probe pin through a socket board (top and bottom conductive board), and by replacing this socket board, we eliminate damage to the measurement board. *The board damage protection tool is approximately 0.3mm thick and can be used without significant characteristic loss. For detailed specifications, we will conduct individual designs for each project, so please feel free to contact our company representative.

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High-frequency IC measurement PCR sheet (distributed PCR)

Distributed PCR is a sheet-type contactor that can connect to all points in the plane without the need for positioning.

This is a conductive sheet that randomly mixes conductive particles within a thin silicone rubber. By applying pressure (distorting it), the conductive particles inside the sheet come into contact and conduct in the vertical direction. Since the areas that are pressed (distorted) conduct, the entire surface acts as an electrode, allowing it to be used without positioning. Additionally, when combined with a ProbePin socket, it is expected to reduce pin damage to the measured object. However, please understand that the operating environment is limited to room temperature, and there may be differences in resistance values depending on the connection points. For more details, please feel free to contact our company.

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Characteristic verification socket

PCR sockets leverage the advantages of short-distance connections and can be applied in various applications that require detailed characteristic data verification.

The PCR socket is a sheet contact type, allowing for short-distance connections that make contact with the target object over a surface (area). The connection state is close to the condition during implementation, and the small characteristic loss enables stable measurements that are closer to the actual device. Therefore, it can be applied in cases where detailed characteristic data verification is necessary, such as design verification, system-level testing, and failure analysis. The shape can also be freely designed, allowing measurements on actual products where socket installation is difficult (a pressure mechanism needs to be considered separately). For detailed specifications, individual designs will be conducted for each project, so please feel free to contact our company representative.

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High-frequency measurement test socket

As communication generations progress with 5G, 5G-Advanced, and 6G, the PCR socket addresses the challenges of high-frequency measurements in the demand for increased speed.

Various devices are connecting to the internet, and high-speed communication is becoming necessary. Additionally, the era of advanced driver assistance systems (ADAS) is approaching, leading to an increasing demand for high-speed semiconductors. Testing these high-spec semiconductors presents many challenges, and more reliable testing methods are required. The PCR socket takes advantage of the ability to freely design electrode diameters and the benefits of short-distance connections to address these challenges and achieve stable measurements. We can also propose solutions for millimeter-wave measurement requirements without any issues. For detailed specifications, we conduct individual designs for each project, so please feel free to contact our company representative.

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Socket for advanced packages

We can offer affordable measurements of high-performance, multi-pin packages that integrate various chips.

Advanced packages that handle AI and big data are expected to become even more high-performance and see increased demand due to chiplets. The measurement of these high-performance advanced packages requires stable contacts with high-speed operation and multiple pins. The only method that can achieve both is PCR. PCR sockets leverage the advantages of sheet contact to realize stable connections over short distances while offering cost benefits for multiple pins. To address warping issues common in large packages, we adjust the contact positions at the center and outer edge on the PCR side, alleviating concerns about insufficient stroke length. For detailed specifications, we conduct individual designs for each project, so please feel free to contact our office. (We can also accommodate packages exceeding 10,000 pins.)

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IC test socket

IC testing is possible from fine pitch to large packages using a test socket with a sheet-type contactor that can be easily attached.

This is a high-performance test socket using a sheet-type contactor (PCR). It can be proposed for various applications, ranging from small ICs with fine pitches to large advanced packages. By using PCR, the structure becomes simpler, making maintenance easier. The socket's pressure structure can be customized to meet customer requirements, including clam-shell type, dual-side latch, and screw-fixed types. We can accommodate requests starting from one unit and provide it in a short delivery time (approximately three weeks after the request). For detailed specifications, we conduct individual designs for each project, so please feel free to contact our company representative.

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Contactors for semiconductor package testing PCR

This is a sheet-type contactor that achieves advanced measurements at a low cost. It allows stable connections without damaging the measurement object or the measurement board.

PCR is a pressure-sensitive conductive contact sheet that aligns conductive particles in the thickness direction of the sheet using a special method. By applying pressure to the electrode part where the conductive particles are arranged, the particles come into contact with each other, forming multiple conduction paths that maintain stable electrical characteristics. Since the main material is silicone rubber, it can be operated without damaging the IC package and measurement board during contact. Additionally, because PCR has surface contact, it allows for a large tolerance for positional misalignment. Leveraging the advantages of short-distance connections, it is ideal for measuring high-end products with high-frequency requirements. The PCR test socket can be custom-designed, allowing us to propose shapes and structures tailored to the customer's requirements.

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Test solution "PCR"

Test solution that does not damage solder balls or measurement substrates with soft contact!

"PCR" is an optimal test solution for high-spec packages aimed at the upcoming 5G and IoT era. It demonstrates excellent performance in high-frequency testing that requires low inductance, low resistance, and low contact characteristics. Additionally, its simple structure allows for easy maintenance, reducing downtime during socket replacement and enabling productivity improvements. 【Features】 ■ Does not damage measurement substrates, etc. ■ Excellent price competitiveness ■ Easy maintenance ■ Potential for productivity improvement *For more details, please request documentation or view the PDF data available for download.

  • Semiconductor inspection/test equipment
  • Printed Circuit Board

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