アルバック・ファイ 営業部 （国内・海外）
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アルバック・ファイ Company Profile
We respond to various requests with outstanding surface analysis technology and a comprehensive after-sales service system!
ULVAC-PHI, Inc. provides advanced surface analysis instruments, including X-ray Photoelectron Spectroscopy (XPS), Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS, D-SIMS), and Scanning Auger Electron Spectroscopy (AES) as a manufacturer of these devices. We take our customers' feedback seriously in all areas, from quality control to research and development, and we respond to various requests with our outstanding surface analysis technology and comprehensive after-sales service system. Additionally, by promoting innovative product development and cutting-edge surface analysis technology, we contribute to the development of next-generation technologies.
Business Activities
【Products Offered】 ■ X-ray Photoelectron Spectroscopy (XPS) Instruments ・ PHI Quantes ・ PHI 5000 VersaProbe III ・ PHI X-tool ・ PHI Quantera II(TM) ■ Scanning Auger Electron Spectroscopy (AES) Instruments ・ PHI 710 ・ PHI 4800 ■ Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Instruments ・ PHI nanoTOF II(TM) ・ MS/MS Option ■ Quadrupole Secondary Ion Mass Spectrometry (D-SIMS) Instruments ・ PHI ADEPT-1010(TM) ■ High-Speed Spectroscopic Ellipsometer ・ PHI QuickSE Series, etc.
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Detailed information
| Company name | アルバック・ファイ 営業部 （国内・海外） |
|---|---|
| Contact address | postalcode 253-8522 Kanagawa/ Chigasaki-shi/ Hagizono 2500View on map TEL：0467-85-4220 FAX：0467-85-4411 |
| Industry | Testing, Analysis and Measurement |
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