オーケーラボ List of Products and Services

We would like to introduce the "Laser Ablation System" handled by Okera Lab. It is compatible with various microscopes and features uniform ablation. Our company has been involved in the development and manufacturing of optical devices for many years, accumulating expertise in optical technology. Additionally, our experienced staff in lens design and optical simulation can cover a wide range of optical device development and manufacturing. Please feel free to entrust us with your needs. 【Features】 ■ Optical system compatible with femtosecond lasers ■ Optical systems for near-infrared 800nm, ultraviolet 266nm, and 200nm ■ Optical systems compatible with excimer lasers at 193nm ■ Uniform ablation ■ Compatible with various microscopes ■ Compatible with YAG and other lasers *For more details, please refer to the PDF materials or feel free to contact us.

• Other physicochemical equipment

The "HSSR-1500 Rainbow / OKL-HSSR1300" is a spectral radiometer designed for pulse solar simulators that respond to 1 msec pulse light. Continuous light measurement is also acceptable. It can accommodate other wavelength ranges as well. The wavelength range for "HSSR-1500 Rainbow" is 250–1500 nm, while "OKL-HSSR1300" covers 350–1300 nm. 【Features】 ■ Supports 1 msec pulse light ■ Measurement available with demo units ■ All original design and manufacturing by OK Lab ■ Capable of accommodating other wavelength ranges ■ Continuous light measurement is also acceptable *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

The "OKL-CPM・PDS-500" is a compact integrated measurement device that allows for the measurement of both CPM and PDS with a single unit. Using a transmission light measurement method and adopting a technique to eliminate the effects of film interference, it enables accurate calculation of defect density. Additionally, for PDS, a separate grating for infrared spectroscopy is provided to allow measurements in the long wavelength range. 【Features】 ■ Utilizes our unique method for CPM measurement, enabling accurate defect density calculation by suppressing interference ■ PDS can measure up to a long wavelength of 0.4[eV] ■ Compact and economical integrated CPM and PDS ■ Fully automated measurement with no hassle *For more details, please download the PDF or feel free to contact us.

• Other measurement, recording and measuring instruments