セブンシックス Product Lineup

This product is a portable high-resolution optical spectrum analyzer equipped with a 7-inch touchscreen monitor. When testing the effectiveness of LiDAR outdoors, such as in autonomous driving, it can be easily transported, unlike conventional spectrum analyzers. We provide support with our original software to maximize the potential of this product. 【Features】 ■ C-band high resolution bandwidth: 1.75GHz (15pm) ■ Equipped with a 7-inch touchscreen monitor ■ Real-time measurement 0.5 seconds @ full C-band scan ■ Ultra-compact and lightweight 1.25kg, 255mm × 140mm × 30mm * You can download the English version of the catalog. * For more details, please refer to the PDF document or feel free to contact us.

We would like to introduce our "Femtosecond and Picosecond Pulse Laser Measurement Device." The "AOWA," an ultra-short pulse measurement device with an all-fiber configuration for fiber lasers from Amonics, can be used in combination with an optical spectrum analyzer to determine the pulse width, chirp, and spectral width of ultra-short pulse lasers. Features include the ability to completely distinguish between positive and negative chirp, no need for measurement alignment, and short measurement times, unlike FROG. 【Features】 ■ User-friendly computer interface ■ Easy plug-and-play measurement ■ Low cost ■ Maintenance-free ■ High reliability and durability *For more details, please download the PDF (English version) or feel free to contact us.

We offer "PIC (Photonic Integrated Circuit) Test Solutions." We provide a wide range of PIC test environments, including passive and active component testing and BER testers. According to your requirements, we can customize the appropriate configuration for each photonic integrated circuit (PIC) you wish to measure. 【Features】 ■ We provide test environments for a wide range of photonic integrated circuits, including passive components, active components, quantum photonics chips (dies), AWGs, and transceivers (transmission, BER) at the wafer level, die level, and component level. ■ We offer a one-stop solution from automation software and probe systems to optical/electrical/performance measurement systems. *For more details, please download the PDF or feel free to contact us.

The "FTBx-8880x" series is a network tester compatible with 800Gb Ethernet. It is expected to support various optics such as 800G-ZR/LR/LR8/FR8/2FR4/2LR4/DR8/2DR4/SR8/2SR4. Additionally, it implements 800GbE × 2 ports in one module. However, simultaneous operation is not possible (switching is possible). 【Features】 ■ Two models with different port configurations are available: ・FTBx-88800: QSFP800G × 2 ports ・FTBx-88801: QSFP800G × 1 port + OSFP800G × 1 port ■ It is expected to support various optics such as 800G-ZR/LR/LR8/FR8/2FR4/2LR4/DR8/2DR4/SR8/2SR4. *For more details, please download the PDF or feel free to contact us.

The FTBx-8848x series is a 400GbE network tester that can be configured with multiple small ports and supports 112G Electrical lanes. Compared to the existing FTBx-88460 series, it achieves miniaturization and multi-port configuration (400GbE x 2 to 4). Additionally, the rack-mounted chassis LTB-8 (3U size) can accommodate up to 4 modules, equating to 400GbE x 8 ports. 【Features】 ■ Achieves miniaturization and multi-port configuration (400GbE x 2 to 4) compared to the existing FTBx-88460 series ■ DCO supports QSFP-DD and OSFP 400G ZR and OpenZR+ ■ TA (Terminal Adapter) supports TA-QSFP28, TA-SFP28, and TA-CFP4 ■ The rack-mounted chassis LTB-8 (3U size) can accommodate up to 4 modules, equating to 400GbE x 8 ports *For more details, please download the PDF or feel free to contact us.

The "MA-4000" is a tester specialized for bit error rate testing (BERT) of optical transceivers that support transmission standards such as 400GbE and 100GbE. It adopts a modular connector board (MCB) replacement method and supports QSFP-DD, OSFP, QSFP28, SFP28, and SFP-DD. There is no need for cumbersome and bulky RF cables for connection work (direct contact between circuit boards). Additionally, it features a powerful FEC simulation function that strongly supports burst error analysis. 【Features】 ■ 8 channels, 10–28GBd, supports PAM4/NRZ ■ Adopts MCB replacement method and supports QSFP-DD, OSFP, QSFP28, SFP28, and SFP-DD ■ Flexible support for future standards through MCB replacement ■ No need for cumbersome and bulky RF cables for connection work (direct contact between circuit boards) ■ Powerful FEC simulation function that strongly supports burst error analysis ■ Voltage test function with built-in power supply of 3.13–3.465V *For more details, please download the PDF or feel free to contact us.

The "BA-4000" is a bit error rate tester suitable for testing and evaluating high-speed transmission standards using PAM4 modulation methods such as 800GbE/400GbE, including devices like optical transceivers, OSAs, and FPGAs. In high-speed transmission standards applying PAM4 modulation like 400GbE/800GbE, it is stipulated that FEC (Forward Error Correction) must be used to ensure transmission quality, and evaluations of transmission quality also require assessments that include error correction by FEC. The FEC simulation function of this product provides various analysis capabilities for burst errors. 【Features】 ■ Full support for testing transmission standards of 800G/400G/200G/100G (up to 56GBd, NRZ/PAM4, up to 8 channels) ■ Essential FEC simulation function for burst error analysis ■ High-quality eye patterns of generated signals ■ Easy-to-remove O-SMPM connector for RF interface ■ Supports PRBS 7/9/11/13/15/23/31/13Q/31Q, SSPRQ *For more details, please download the PDF or feel free to contact us.

The "CD-4000" is a CDR (Clock Data Recovery) designed to achieve synchronization optimization when combined with EXFO's Bit Error Rate Tester "BA-4000" and Sampling Oscilloscope "EA-4000". Supports NRZ/PAM4. Integrated O/E with optical splitter. Suitable for testing and evaluating optical transceivers. Please feel free to contact us when you need assistance. 【Features】 ■ NRZ/PAM4 support ■ Integrated O/E with optical splitter ■ Ultra-low random jitter ■ Auto-locking *For more details, please download the PDF or feel free to contact us.

The "EA-4000" is a high-speed measurement optical sampling oscilloscope that supports 28G NRZ signals, with a full range of 830 to 1600nm and a wide bandwidth of 33GHz, capable of measuring over 1000 waveforms in under 2 seconds. With industry-leading high-speed measurements (1000 waveforms in under 2 seconds), it enables the reduction of inspection labor in the production lines of optical components and improves throughput. Please feel free to contact us when you need assistance. 【Features】 ■ Ultra-fast scope measuring over 1000 waveforms in 2 seconds at 1M samples/second (2000 samples/waveform) ■ Supports 28G NRZ signals ■ Supports low jitter mode ■ Supports full range model (830-1600nm) and single mode model (1250-1600nm) *For more details, please download the PDF or feel free to contact us.

We would like to introduce the "Handy OTDR Series" handled by Seven Six Co., Ltd. Wavelength: 1310 to 1650 nm. We offer a lineup of OTDRs with various functions and dynamic ranges. These optical measuring instruments are expected to perform well in various scenarios, including long-distance fiber optic line measurements, fault detection, OTDR measurements before and after PON, as well as power meter functions and core reference light sources. 【Specifications】 ■ Compatible Fiber: SMF, MMF ■ Compatible Core Count: 1 to 12 ■ Compatible Cladding Diameter (um): 125 ■ Compatible Wavelength (nm): 1310 to 1650 ■ Fiber Type: SMF *For more details, please download the PDF or feel free to contact us.

There are many types of methods used for three-dimensional measurement of objects. In this document, we will highlight non-contact measurement methods that use light and introduce their characteristics and applications. We will also explain points to consider when introducing three-dimensional measurement devices. [Contents] ■ Basic concepts and necessity of 3D measurement ■ Representative 3D measurement methods and their principles (triangulation method, ToF method) ■ Characteristics of 3D measurement using lasers ■ Main application fields and uses of 3D measurement technology *For more details, please download the PDF or feel free to contact us.