理化電子 List of Products and Services

The "RI-010HA-05-PDH" is a fine pitch probe for wafer inspection. It is compatible with a 0.15mm pitch and is suitable for vertical inspection. Multiple options are available for the plunger material as well. In addition, we offer a wide range of special probes for high-frequency applications, high-temperature applications, and Kelvin applications. 【Materials】 ■A Plunger: Pd Alloy ■Barrel: Ni / Inner Au ■Spring: SWP / Au-Plated ■B Plunger: SK / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

• probe

Probe card for inspecting W-CSP (WLCSP) with balls implemented at the wafer level 【Features】 ○ User-friendly customization (including probe pins) ○ High maintainability ○ High durability performance accumulated by probe pins For more details, please contact us.

• Semiconductor inspection/test equipment
• Other semiconductors
• Printed Circuit Board

The acceleration and miniaturization of high-end devices that continue to evolve day by day. Meanwhile, testing technologies are also evolving to keep up with this. Rika Electronics Co., Ltd. will assist you as an innovator in high-end device testing, with cutting-edge technology and a passionate heart. IC sockets and various probes are all produced in a consistent line from basic research to design, manufacturing, and inspection at our Kyushu office and Kumamoto factory. By centralizing these processes, we have achieved not only short delivery times and low prices but also total solutions tailored to our customers' needs and themes. We also accept the design and manufacturing of various boards related to IC sockets. For more details, please contact us.

• Semiconductor inspection/test equipment
• Other semiconductors
• socket

Consolidating decades of technology developed with contact probes for semiconductor testing! Short Probes 【Features】 ○ Quickly responds to fine pitch and high-speed testing environments ○ High-performance short probes highly rated by users worldwide ○ Easy customization ○ Main types ・Short probes for 1.0mm pitch ・Short probes for 0.8mm pitch ・Short probes for 0.65mm pitch ・Short probes for 0.5mm pitch ・Short probes for 0.4mm pitch ・Ultra-short short probes *Other types are also available. Please contact us for more details.

• Semiconductor inspection/test equipment
• Other semiconductors
• Printed Circuit Board

America, Paricon's anisotropic conductive sheet PariPoser 【Features】 ○ Electrical Characteristics ・High-frequency characteristics... Supports up to 40GHz, self-inductance 0.094nH ・Insertion loss... Less than 0.5dB at 25GHz, less than 1dB at 36GHz ・Resistance... Average resistance value 20mΩ ○ Physical Characteristics ・Operating temperature: -40℃ to 160℃ ・Durability... Over 500,000 cycles (for 1mm pitch against gold pads), achieving extremely high performance.

• Semiconductor inspection/test equipment
• Other semiconductors
• others

This catalog features probes and other products handled by Rika Electronics. It includes a lineup of products designed primarily for inspecting semiconductor packages, such as the "short probe," as well as "IC sockets" that achieve a short conduction length with low-resistance contacts. You can choose according to your application. [Featured Products] ■ Short Probes ■ IC Sockets ■ Probe Guards for WLCSP ■ Test Fixtures ■ RDK Bonding Tools *For more details, please refer to the PDF document or feel free to contact us.

• Semiconductor inspection/test equipment
• Other semiconductors
• Printed Circuit Board

The "RI-020ZC-01" is a Kelvin probe for Kelvin measurements. The horseshoe-shaped tip design ensures more reliable contact. It is suitable for measuring BGA packages with a 0.4mm pitch matrix and QFP packages with a 0.3mm pitch. Additionally, we also offer the 4-point type "RI-020ZC-02." 【Materials】 ■A Plunger: SK / Au-Plated ■Barrel: PB / Au Lined ■Spring: SWP / Au-Plated ■B Plunger: SK / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

• probe

The "RI-028LA-03-A2" is a probe with excellent high-frequency characteristics. It has a frequency characteristic of 41.5GHz. Additionally, it can accommodate multiple materials for the plunger. We also offer the round conical type "RI-028IA-01-A2." 【Materials】 ■A Plunger: BeCu / Au-Plated ■Spring: SWP / Au-Plated ■B Plunger: BeCu / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

• probe

The "RI-030II-28-WKG" is a probe with excellent high-temperature characteristics. It is suitable for high-temperature environments up to 200°C. In addition, to meet the high heat resistance temperature requirements of probes in reliability testing, we currently offer the HOTPIN that supports up to 175°C. 【Material】 ■A Plunger: BeCu / K3-Gold ■Barrel: Ni / Inner Au ■Spring: SUS / Au-Plated ■B Plunger: BeCu / K3-Gold *For more details, please refer to the PDF document or feel free to contact us.

• probe

The "RI-030LI-33-A2" is a standard design probe suitable for 0.4mm and 0.5mm pitch. It is versatile and can be used with various types of sockets. Additionally, you can choose from three different tip shapes according to your application. 【Material】 ■A Plunger: BeCu / Au-Plated ■Barrel: PB / Au-Plated ■Spring: SWP / Au-Plated ■B Plunger: BeCu / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

• probe

The "RI-035ZI-01-WKG" is a Kelvin probe for Kelvin measurements. The horseshoe-shaped tip design ensures more reliable contact. Additionally, this product is suitable for high-temperature environments up to 170°C and has a 2A CCC characteristic. We also offer a 4-point type, the "RI-035ZI-02-WKG." 【Materials】 ■A Plunger: SK / K3 Gold ■Barrel: NS / Au-Plated ■Spring: SUS / Au-Plated ■B Plunger: SK / K3 Gold *For more details, please refer to the PDF document or feel free to contact us.

• probe

The "RI-A90HA-01-PDH" is a fine-pitch probe for wafer inspection. It is compatible with a pitch of 0.13mm and is suitable for vertical inspection. In addition, we offer a variety of special probes for high-frequency applications, high-temperature applications, and Kelvin applications. 【Materials】 ■A Plunger: Pd Alloy ■Barrel: Ni / Inner Au ■Spring: SWP / Au-Plated ■B Plunger: BeCu / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

• probe

At Rika Electronics Co., Ltd., we handle "Test Fixtures." You can choose the press mechanism from "Hand Press" and "Air Press." Of course, it is also possible to manufacture the head part to match your existing press mechanism. The inspection environment surrounding components such as LCD cells, modules, TAB, and COF is changing day by day, but our company proposes and designs suitable inspection fixtures tailored to your inspection equipment and applications, from design to manufacturing. 【Features】 ■ Choose the press mechanism from "Hand Press" and "Air Press" ■ It is possible to manufacture the head part to match your existing press mechanism ■ Pin arrangement is possible with a spring probe pitch linear arrangement of 200μm or more ■ By using solid pins, a pin arrangement with a probe pitch linear arrangement of 100μm can be achieved *For more details, please refer to the PDF document or feel free to contact us.

• others

At Rika Electronics Co., Ltd., we handle "RDK Bonding Tools." We offer various products including "needles (pushing pins)" used for picking up chips, as well as "transfer pins" and "heater blocks" that can improve issues such as paste buildup and adhesion failures through their tip shapes. You can choose according to your needs. 【Products Available (Partial List)】 ■ Carbide die collets ■ Pickup tools ■ Collet holders ■ Various nozzles related to LCDs ■ Tie bar cut punches, etc. *For more details, please refer to the PDF materials or feel free to contact us.

• Other work tools