イーエスジェー・プローブテクノロジー・ジャパン List of Products and Services

The "Micro Positioner MODEL 404R(L)" is a product that offers excellent operability and the ability to perform high-precision probing. It features a lever-type magnetic stand on the base plate, allowing for easy attachment and detachment with the lever ON/OFF. By rotating the micrometer, the needle tip can be finely adjusted in the XYZ directions, enabling simple and reliable alignment. Additionally, the stage moves on ball guides, allowing for extremely smooth positioning. 【Specifications (partial)】 ■404R ・Operation direction: Right-handed ・Stroke: 6mm in X, Y, and Z ・Travel amount: 500μm/rotation in X, Y, and Z *For more details, please refer to the PDF document or feel free to contact us.

• Other electronic parts

The "Micro Positioner MODEL 403R(L)" is a manipulator with enhanced stability. The base plate is made of rubber magnet, allowing for easy setup. By rotating the knob, the needle tip can be finely adjusted in the XYZ directions, enabling simple and reliable alignment. Please feel free to contact us if you have any inquiries. 【Specifications (partial)】 ■403R - Operation direction: Right-handed - Stroke: 10mm in X, Y, and Z - Travel amount: 500μm/rotation in X, Y, and Z *For more details, please refer to the PDF document or feel free to contact us.

• Other electronic parts

The "Model6200" is a manual prober designed for direct probing of devices on printed circuit boards. By using a push button to retract the probe base plate and microscope in the Z-axis upward direction, it prevents slight misalignment of the device and improves operability even when using a high-magnification microscope. As a result, it is capable of chucking large prototype wiring boards with many components and connections. 【Standard Configuration Example】 ○ Manual Prober: Model6200 ○ Microscope: FS-70Z ○ Vibration Isolation Table: TAPC-56 ○ Micromanipulator: XYZ-500 ○ X-Y Scanner: 5010B For more details, please contact us or download the catalog.

• Semiconductor inspection/test equipment
• Circuit Board Inspection Equipment
• probe

This is a manual prober compatible with 12-inch wafers. By changing the chuck, it can support LCD substrates up to 320×320. A hot chuck can be installed as an option.

• Semiconductor inspection/test equipment

This is a manual prober optimized for reliability testing and device characteristic evaluation, compatible with 8-inch wafers. We also offer manual probers compatible with 6-inch and 12-inch wafers.

• Semiconductor inspection/test equipment

This is a dedicated prober for TDDB measurement. By using a dedicated ceramic card, it enables full contact measurement of 8-inch wafers, significantly contributing to the reduction of measurement time.

• Semiconductor inspection/test equipment