Prevents slight misalignment of devices, improving operability even when using high-magnification microscopes.
The "Model6200" is a manual prober designed for direct probing of devices on printed circuit boards. By using a push button to retract the probe base plate and microscope in the Z-axis upward direction, it prevents slight misalignment of the device and improves operability even when using a high-magnification microscope. As a result, it is capable of chucking large prototype wiring boards with many components and connections. 【Standard Configuration Example】 ○ Manual Prober: Model6200 ○ Microscope: FS-70Z ○ Vibration Isolation Table: TAPC-56 ○ Micromanipulator: XYZ-500 ○ X-Y Scanner: 5010B For more details, please contact us or download the catalog.
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basic information
【Device Specifications】 ○ Substrate holder clamp range: Maximum 170mm ○ Substrate mounting range: Maximum 170mm × approximately 300mm ○ Stage travel range: X ±25mm, Y ±25mm ○ Microscope scan range: X ±24mm, Y ±24mm ○ Microscope retraction travel: Maximum 80–90mm ○ Z stage adjustment range: Maximum 15mm ○ Main unit dimensions: Width 440 × Depth 500 × Height 300mm (excluding microscope) ● For more details, please contact us or download the catalog.
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ESJ Probe Technology Japan Co., Ltd. manufactures and sells probers essential for semiconductor testing. We have a track record of supplying all major electronics manufacturers. Additionally, we propose, design, and manufacture measurement and control devices using precision electric stages, tailored to our customers' applications. We also produce LAN network-type electronic bulletin boards that can accommodate multiple units.