TDDB measurement probe
This is a dedicated prober for TDDB measurement. By using a dedicated ceramic card, it enables full contact measurement of 8-inch wafers, significantly contributing to the reduction of measurement time.
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basic information
This is a dedicated probe for TDDB measurement. By using a dedicated ceramic card, it enables full-area contact measurement of 8-inch wafers, significantly contributing to the reduction of measurement time.
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Applications/Examples of results
Equipped with a standard 8-inch hot chuck, it can measure temperatures from room temperature to 300°C. It comes with a standard safety feature to prevent damage to the dedicated card.
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Company information
ESJ Probe Technology Japan Co., Ltd. manufactures and sells probers essential for semiconductor testing. We have a track record of supplying all major electronics manufacturers. Additionally, we propose, design, and manufacture measurement and control devices using precision electric stages, tailored to our customers' applications. We also produce LAN network-type electronic bulletin boards that can accommodate multiple units.