Resistance Measuring Instrument - Company Ranking(17 companyies in total)
Last Updated： Aggregation Period:Jul 16, 2025〜Aug 12, 2025
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Display Company Information
| Company Name | Featured Products | ||
|---|---|---|---|
| Product Image, Product Name, Price Range | overview | Application/Performance example | |
| 【Lineup】 ■RT-70V/RG-7C ■RT-70V/RG-5 ■RT-70V/RG-7S ■RT-70V/TS-7D *For more details, please contact us or download the catalog. | For more details, please contact us or download the catalog. | ||
| 【Measurement Specifications】 ■Measurement Targets: Films, glass, paper materials, etc. In principle, any sample can be measured as long as it falls within the measurement range. - Thin film materials (ITO, TCO, etc.) - Low-E Glass - Carbon nanotubes, graphene materials - Metal materials (nanowires, grids, meshes) - Others ■Measurement Size: Can be measured regardless of size or thickness (Must be larger than the measurement spot size of each probe) 〔Measurement Spots〕 - Non-destructive probe (eddy current type): Φ25mm - Contact probe (4-point probe type): 9mm ■Measurement Range - Non-destructive probe (eddy current method): 0.5–200Ω/sq - Contact probe (4-point method): 0.1–4000Ω/sq *For more details, please contact us or download the catalog. | For more details, please contact us or download the catalog. | ||
| Compact and easy-to-use manual non-contact resistance meter ◆ Simple measurement condition settings with JOG dial ◆ Choose one type from four sensor types (SuperHigh, High, Middle, Low) based on the measurement range ◆ Space-saving and compact design ◆ A model with a handheld probe for the sensor part (EC-80P) is also available ● Applicable wafer sizes: 2 inches to 8 inches (*) For more details, please contact us. | Silicon wafers, GaAs epitaxial layers, GaN, GaP, ITO films, metal films, etc. | ||
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ナプソン
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- Featured Products
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Contact Resistance Tester "RT-70V Series"
- overview
- 【Lineup】 ■RT-70V/RG-7C ■RT-70V/RG-5 ■RT-70V/RG-7S ■RT-70V/TS-7D *For more details, please contact us or download the catalog.
- Application/Performance example
- For more details, please contact us or download the catalog.
Contact Resistance Tester "DUORES"
- overview
- 【Measurement Specifications】 ■Measurement Targets: Films, glass, paper materials, etc. In principle, any sample can be measured as long as it falls within the measurement range. - Thin film materials (ITO, TCO, etc.) - Low-E Glass - Carbon nanotubes, graphene materials - Metal materials (nanowires, grids, meshes) - Others ■Measurement Size: Can be measured regardless of size or thickness (Must be larger than the measurement spot size of each probe) 〔Measurement Spots〕 - Non-destructive probe (eddy current type): Φ25mm - Contact probe (4-point probe type): 9mm ■Measurement Range - Non-destructive probe (eddy current method): 0.5–200Ω/sq - Contact probe (4-point method): 0.1–4000Ω/sq *For more details, please contact us or download the catalog.
- Application/Performance example
- For more details, please contact us or download the catalog.
Resistance Rate / Sheet Resistance Meter 【EC-80】
- overview
- Compact and easy-to-use manual non-contact resistance meter ◆ Simple measurement condition settings with JOG dial ◆ Choose one type from four sensor types (SuperHigh, High, Middle, Low) based on the measurement range ◆ Space-saving and compact design ◆ A model with a handheld probe for the sensor part (EC-80P) is also available ● Applicable wafer sizes: 2 inches to 8 inches (*) For more details, please contact us.
- Application/Performance example
- Silicon wafers, GaAs epitaxial layers, GaN, GaP, ITO films, metal films, etc.
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ナプソン
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