Resistance Rate / Sheet Resistance Measuring Instrument 【EC-80】
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
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basic information
Compact and easy-to-use manual non-contact resistance meter ◆ Simple measurement condition settings with JOG dial ◆ Choose one type from four sensor types (SuperHigh, High, Middle, Low) based on the measurement range ◆ Space-saving and compact design ◆ A model with a handheld probe for the sensor part (EC-80P) is also available ● Applicable wafer sizes: 2 inches to 8 inches (*) For more details, please contact us.
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Applications/Examples of results
Silicon wafers, GaAs epitaxial layers, GaN, GaP, ITO films, metal films, etc.
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We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.