We have introduced the FIB-SEM device Helios5 DualBeam.

We have introduced the latest model of the focused ion beam scanning electron microscope (FIB-SEM), the Thermo Scientific DualBeam Helios 5 CX manufactured by Thermo Fisher Scientific.
This device combines high-resolution imaging of the scanning electron microscope with milling capabilities of the focused ion beam, enabling high-quality subsurface analysis and 3D analysis. It also comes with an energy-dispersive X-ray spectroscopy (EDS) system, allowing for 3D analysis of detected elements.
If you would like to know more about this device, or if you have any requests or inquiries regarding analysis and processing, please feel free to contact us.
● Email: sfc-tr1@seiko-sfc.co.jp
● Phone number: 047-391-2298

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