Non-Destructive Testing Comprehensive Exhibition 2023 - Announcement of Inspection Demonstration by the Japan Non-Destructive Testing Association

I want to meet the needs of everyone involved in flaw detection. A digital ultrasonic flaw detector equipped with standard JSNDI functionality.

The "UI-27" is a digital ultrasonic flaw detector equipped with 12 types of frequency band filters, capable of high-sensitivity detection in suitable receiving bands. It adopts a sampling frequency of 200MHz, improving distance measurement accuracy across the entire measurement range, making it suitable for precise thickness measurements and axial force measurements. This single device consolidates the technologies required for portable flaw detectors. It is a sophisticated multi-use flaw detector, ranging from R-type functions to manual detection, automatic detection, and special applications. 【Features】 ■ Complies with JSNDI specifications: R-type function is standard ■ SD card (standard 2GB included): Compatible with SDHC up to 32GB ■ Stepless adjustment handle ■ Improved operability with left and right key operations ■ Photo function: Save images with one touch ■ Abundant interfaces *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments
• Flaw detection testing
• Other inspection equipment and devices

This is a new technology that enables bolt fastening using axial force. It can accommodate small diameter screws starting from M6. *Exhibited at JIMA 2024 Comprehensive Inspection Equipment Exhibition.

We would like to introduce our development technology, the "Direct Axial Force Measurement System," in collaboration with our company and related companies. It enables optimization of the specifications for the bolt body and the components being fastened, achieving cost reduction. The stabilization of axial force, prevention of incorrect assembly, and traceability enhance quality. Additionally, it allows for a reduction in the man-hours required for development maturation and torque checks during mass production. 【Value Provided】 ■ Cost Reduction: Optimization of specifications for bolt body and components being fastened ■ Reduction in Man-Hours: Development maturation man-hours / Torque check man-hours during mass production ■ Quality Improvement: Axial force stabilization / Prevention of incorrect assembly / Traceability *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

For those considering certification exams for ultrasonic flaw detectors! It is possible to purchase level 1 and 2 test piece sets simultaneously.

We would like to introduce our practical exam preparation set <UI-27> that we handle. We offer Level 1 and Level 2 of JSNDI, along with the "UI-27," which includes a carrying case, battery, and PC software. This is a must-see for those considering certification exams for ultrasonic flaw detectors. Additionally, it is possible to purchase the Level 1 and Level 2 specimen sets simultaneously. Please feel free to contact us if you have any requests. 【Set Contents】 ■ UI-27 ■ Carrying Case ■ Battery ■ PC Software ■ Calibration Certificate *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments
• Flaw detection testing

Pursuing even greater usability! A digital ultrasonic flaw detector that allows intuitive operation with direct keys.

We would like to introduce our digital ultrasonic flaw detectors, the 'UI-S9/UI-R1'. The "UI-S9" has further pursued ease of use, catering to a wide range of needs from various sites to qualification training R-type functions. The "UI-R1" complies with the basic operational specifications of JSNDI digital ultrasonic flaw detectors. Additionally, we provide all the necessary equipment for UT qualification exam preparation as common options. Please feel free to contact us when needed. 【Features】 ■ Compliant with JSNDI specifications ■ Screen visible even outdoors ■ Approximately 10 hours of operation on a single charge ■ Data saved to USB memory ■ Intuitive operation with direct keys ■ Stepless stand *For more details, please refer to the PDF materials or feel free to contact us.

• Other measurement, recording and measuring instruments
• Flaw detection testing

We have JSNDI Level 1 and Level 2 available! A must-see for those considering certification exams for ultrasonic flaw detectors.

We would like to introduce our practical exam preparation set 'UI-S9/UI-R1' that we handle. This set includes Level 1 and Level 2 JSNDI, featuring the standard model (JSNDI specifications standardly equipped) "UI-S9" and the JSNDI specification specialized model "UI-R1." Additionally, the JSNDI Level 1 includes vertical prism test specimens for UT Level 1 and vertical flat plate test specimens, while the JSNDI Level 2 includes vertical test specimens for UT Level 2 and angled T-joint test specimens as part of the preparation set. 【Set Contents】 ■UI-S9 ■UI-R1 ■Carrying case ■Soft case and hand strap ■PC software ■Calibration certificate *For more details, please refer to the PDF document or feel free to contact us.

• Flaw detection testing

We would like to extend our heartfelt congratulations on the continued prosperity of your esteemed company. Our company will be exhibiting at the following trade show, where we will introduce a number of products, including our new product, the Pillow Packaging Full Air Tightness Inspection Machine MSQ-2003. We sincerely apologize for the inconvenience during your busy schedule, but we would like to invite you to visit us at this opportunity. 【 Exhibition Name 】 JAPAN PACK 2025 Japan Packaging Industry Exhibition https://www.japanpack.jp/ 【 Dates 】 October 7 (Tuesday) to October 10 (Friday), 2025 *4 days 10:00 AM to 5:00 PM 【 Venue / Booth Number 】 Tokyo Big Sight / East Hall 8, Booth 8-505

Sanei Hitec Co., Ltd. will exhibit at SENSOR EXPO JAPAN 2025, which will be held from September 10 (Wednesday) to September 12 (Friday), 2025. At this Sensor EXPO 2025, we will showcase our semiconductor design technology and high-performance IP (Intellectual Property) that support the evolution of sensors.

Sanei Hightex Co., Ltd. will exhibit at the "Student Formula Japan Championship 2025" at the Shizuoka Prefecture booth in Aichi Sky Expo Exhibition Halls E and F from September 11 to 13, 2025.

We would like to inform you that we will be exhibiting our products at the 63rd Annual Meeting of the Biophysical Society of Japan. If you are planning to attend, please be sure to stop by. ❚ Products to be Exhibited - Auto Patch Clamp System | Port-a-Patch mini This compact system eliminates the need for a microscope, vibration isolation table, manipulator, and Faraday cage, which are typically required for conventional patch clamp experiments. It does not require specialized skills or experience, allowing for easy data acquisition and verification. - Artificial Lipid Bilayer Experiment Device | Orbit mini This device allows for easy measurement of channel activity at the single-molecule level. It enables the formation of lipid membranes, reconstitution of membrane proteins, and single-channel measurements using only a micropipette in experiments utilizing artificial lipid bilayers, facilitating functional and structural analysis of target membrane proteins and evaluation of drug effects. - Liposome Preparation Device | Vesicle Prep Pro This is the world's first device capable of producing giant unilamellar vesicles (GUVs) with diameters ranging from 1 to 30 μm without the use of organic solvents, utilizing the electroporation method (vibrating hydrated lipid films in an alternating electric field).

The success or failure of an AI project depends on the quality and immediacy of the "data infrastructure." By combining no-code and low-code products, it is possible to achieve a seamless process from data collection to integration and AI utilization, efficiently building a data infrastructure that supplies high-quality data to AI. We will explain specific methods for flexibly and quickly constructing a data infrastructure, incorporating case studies and demos, and introduce key points of a data strategy to lead to successful AI utilization.