I uploaded a video titled "Slice & View and 3D Construction of Plating Defects by FIB" on YouTube.

The focused ion beam (FIB) device irradiates a focused ion beam onto a sample for processing and observation. Additionally, the FIB-SEM is equipped with a high-resolution FE-SEM (field emission scanning electron microscope), allowing for simultaneous high-resolution observation and processing.
This video demonstrates the observation of "plating defects" using the Slice & View and 3D construction functions of the FIB-SEM (Thermo Fisher Scientific: Helios 5 CX). The Slice & View function shows how the defects spread from their origin, while the 3D construction allows for confirmation of the shape of the defects.

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The focused ion beam (FIB) device is a tool that irradiates a focused ion beam onto a sample for processing and observation. Additionally, the FIB-SEM (Helios5) is equipped with a high-resolution FE-SEM (field emission scanning electron microscope), allowing for simultaneous high-resolution observation and processing. This video demonstrates the "state of plating defects" using Slice & View with the FIB-SEM, showing how the defects spread from their origin and confirming the shape of the defects through 3D construction.