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  3. TAKAYA Corporation
  4. Announcement of the 20th "JPCA Award" Winner
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  • May 30, 2024
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May 30, 2024

Announcement of the 20th "JPCA Award" Winner

TAKAYA Corporation TAKAYA Corporation
Takaya Corporation (Headquarters: Ihara Town, Okayama Prefecture; President: Ryuji Okamoto) has received the 20th "JPCA Award" (hereinafter referred to as "the Award") for its "Hybrid Inspection System Combining JTAG Testing and Flying Probe Testing." The awarded "Hybrid Inspection System Combining JTAG Testing and Flying Probe Testing" integrates the flying probe tester with JTAG boundary scan testing, allowing for the mutual complementarity of each inspection method. This maximizes the test coverage of high-density mounted circuit boards and enables more accurate fault diagnosis, introducing a new system. A panel introducing the Award will be displayed at the "JPCA Show 2024 (Total Solutions for Electronic Devices Exhibition 2024)" held at Tokyo Big Sight from June 12 (Wednesday) to June 14 (Friday). Our company will also have an exhibition booth at the event, showcasing a real flying probe tester. We invite you to come and see it.
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スクリーンショット 2023-02-24 112144.jpg

Collaboration with boundary scan testing using a flying probe tester.

We will create new value through the mutual complementarity of ICT and BST.

In-circuit testing with a flying probe tester excels at inspecting the electrical characteristics of implemented electronic components in analog circuits. However, components that cannot be probed make electrical testing difficult, and functional testing of digital circuits is challenging. On the other hand, boundary scan testing allows for quick interconnection testing between LSI pins and on-board programming for FPGAs, but it can only test digital circuits around ICs that comply with the boundary scan standard, and it also requires specialized fixtures for connections. At Takaya Corporation, we possess technology that uses flying probes instead of fixtures to connect 4 to 5 scan-compatible pins and measuring instruments required for boundary scan testing. This allows for boundary scan testing even when the counterpart of a boundary scan-compliant IC is a non-boundary scan-compliant IC or passive components (such as connectors) by enabling the flying probe to function as a virtual boundary scan cell. With a single flying probe tester, it is possible to conduct comprehensive testing of both digital and analog circuits, thereby significantly enhancing testing efficiency compared to before.

  • Circuit Board Inspection Equipment

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Flying Probe Tester: APT-1340J *Evaluation tests currently accepted

It is a board inspection device capable of ultra-fast in-circuit testing at a top-class level in the industry.

We have completely revamped the platform compared to the conventional model, increasing the probe movement speed by up to 50% and dramatically improving contact position accuracy. With a new high-precision, wide-range measurement system that offers great flexibility and a groundbreaking 4-head 6-flying probe mechanism, we can significantly reduce inspection costs and enhance quality in the assembly process, regardless of substrate variety or production volume. ★You can bring your own substrates for evaluation tests at our demo rooms in Okayama headquarters and Tokyo branch★ We can conduct a series of tests, including creating inspection programs, inspecting using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.

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Flying Probe Tester: APT-1400F-SL * Testing in progress

It is a board inspection device capable of ultra-fast in-circuit testing at a top-class industry level. (Supported board size for inspection: up to 985×610)

The APT-1340J maintains its basic performance while expanding the compatible board size to W635×D610mm. Additionally, by adding an optional split inspection function, it can inspect long boards up to W985×D610mm. It can accommodate components with a height of 60mm and board weights of up to 10kg, making it suitable for inspecting boards used in automotive, aerospace, and medical devices, as well as power boards and probe cards, which are larger and heavier. ★You can bring your boards to our demo room at our Okayama headquarters for evaluation tests★ We can conduct a series of tests including creating inspection programs, inspecting actual boards, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below. *For product information, please download the PDF or feel free to contact us.*

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Dual Side Flying Probe Tester: APT-1600FD

This is a flagship model that arranges probe heads on both the top and bottom, enabling simultaneous in-circuit testing of the front and back of the substrate.

Four probes are arranged on the top side of the substrate and two on the bottom side. Each probe can move freely and at high speed, achieving an astonishing inspection speed that is world-class in its category. By using the flying probes on both the top and bottom simultaneously, a combination inspection with up to six probes allows for simultaneous contact inspection at both points on the top and bottom sides of the substrate. This significantly expands the inspection range and further accelerates inspection time. It is equipped with a wealth of features and boasts world-class standards in speed and positioning accuracy. ★ You can bring your substrate to our demo room at our Okayama headquarters for evaluation testing ★ We can conduct a series of tests including the creation of inspection programs, inspections using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.

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Dual Side Flying Probe Tester APT-1600FD-SL

The probe head is arranged above and below, allowing for simultaneous in-circuit testing of both sides of the substrate. (Supported substrate size for inspection: up to 985×610)

The simultaneous use of upper and lower flying probes enables a combination inspection of up to 6 probes, allowing for the inspection of components that can make contact at both points on the top and bottom of the substrate. This model boasts world-class standards in speed and positioning accuracy while expanding the compatible substrate size to W635×D610mm. Furthermore, by adding an optional split inspection function, it is capable of inspecting long substrates up to W985×D610mm. It can accommodate component heights of up to 60mm and substrate weights of up to 10kg, making it suitable for inspecting substrates used in automotive, aerospace, and medical devices, as well as power boards and probe cards, which are larger and heavier. ★Evaluation tests can be conducted by bringing your substrates to the demo room at our Okayama headquarters★ The entire process from creating inspection programs, inspecting using actual substrates, to summarizing evaluation results can be tested in a single flow. If you are interested, please apply through the 'Contact Us' section below.

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スクリーンショット 2024-05-31 083855.png

Announcement of the 20th "JPCA Award" Winner

We have won the 20th "JPCA Award"!

Takaya Corporation (Headquarters: Ibara-cho, Ibara City, Okayama Prefecture; President: Ryuji Okamoto) has received the 20th "JPCA Award" for its "Hybrid Inspection System Combining JTAG Testing and Flying Probe Testing." The awarded "Hybrid Inspection System Combining JTAG Testing and Flying Probe Testing" integrates the flying probe tester with JTAG boundary scan testing, allowing for the mutual complementarity of each inspection method to maximize test coverage for high-density mounted boards and enable more accurate fault diagnosis. A panel introducing the award will be displayed at the "JPCA Show 2024 (Total Solution Exhibition for Electronic Devices 2024)" held at Tokyo Big Sight from June 12 (Wednesday) to June 14 (Friday). Our company will also have an exhibition booth at the event, showcasing a live flying probe tester. We invite you to come and see it.

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Thank you for attending the Total Solutions Exhibition for Electronic Devices 2024.

Thank you for visiting the Total Solutions Exhibition for Electronic Devices 2024 / JISSO PROTEC 2024.

Thank you to everyone who visited the Takaya Corporation booth at the "Electronic Equipment Total Solution Exhibition 2024 (JPCA Show 2024) / JISSO PROTEC 2024" held at Tokyo Big Sight from June 12 to June 14, 2024. We have made information about the products we exhibited available. If you have any questions or inquiries regarding the content, please feel free to contact us. Additionally, we received the 20th "JPCA Award" for our "Hybrid Inspection System combining JTAG testing and flying probe testers," and an introduction panel regarding this award was displayed at the venue.

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Related catalog(5)

Announcement of the 20th "JPCA Award" Winner

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Industrial Equipment Division Product Introduction

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Latest Trends in Hybrid Testing Systems Combining JTAG Testing and Flying Probe Testers

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TAKAYA Corporation
Industrial Electrical Equipment
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Electrical design dedicated CAD solution "ECAD DCX" / Panel manufacturing support system "WIRE CAM DX"

We will exhibit products at the Monozukuri Fair 2025: Electrical Design CAD / Panel Manufacturing Support System.

  • NEW
  • COMPANY

We are pleased to announce that our company will be exhibiting at the "Monozukuri Fair 2025" held in Fukuoka. ECAD is a dedicated CAD solution for electrical design, equipped with a wealth of features for control design and power distribution panel design, developed for domestic electrical designers over the past 40 years. It addresses challenges such as improving design quality, enhancing operational efficiency, and reducing labor. At the venue, we will introduce the "Panel Manufacturing Skill-less Solution," which utilizes the panel manufacturing support system "WIRE CAM DX" to create pre-manufacturing information as a solution to the labor shortage issues in panel manufacturing that have traditionally required skilled workers. This enables less experienced operators to achieve high-quality manufacturing in processes such as wire processing, component assembly, and wiring work. We invite you to visit our exhibition booth. ■ Exhibition Name: Monozukuri Fair 2025 ■ Location: Marine Messe Fukuoka Hall A & B ■ Booth Number: Hall B BN-9 ■ Dates: October 15 (Thursday) to October 17 (Saturday), 2025 (3 days) ■ Hours: 10:00 AM to 5:00 PM (last day until 4:00 PM) *For more information about the exhibited products, please download the materials. Feel free to contact us with any inquiries.

Oct 20, 2025

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[Free Materials Available] Introducing Useful Information on Vehicle Detection Sensors!

  • NEW
  • CATALOG

To customers considering the introduction of vehicle detection sensors for parking lot construction, design, and management: Are you facing any issues with the challenges you currently have or selecting the right sensors for parking lot management? Hotron offers free materials that explain how to utilize vehicle detection sensors and the benefits of their introduction! ▽ Here is the lineup of materials ◉ Basic Guide to Vehicle Detection Sensors This guide focuses on the challenges and solutions in parking lot operations, introducing the overview of vehicle detection sensors. ◉ Key Points for Introducing Vehicle Detection Sensors This material discusses the benefits of introduction based on installation locations and specific challenges. ◉ Case Studies of Vehicle Detection Sensor Implementation This document introduces the challenges before implementation and the results after introduction. For more details, please download from our website and check it out. https://www.hotron.co.jp/download/

Oct 20, 2025

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What is an ultra-hard alloy ultra-fine pin gauge? We have published a page explaining ultra-fine pin gauges that are thinner than a human hair!

  • NEW
  • PRODUCT

In the fields of precision machinery and medical devices, precision management at the micron and nano level is essential. A key component in this is the ultra-small diameter pin gauge. In particular, pin gauges made of carbide are excellent in wear resistance and strength, achieving stable measurements. This page explains the applications and benefits of introducing ultra-small diameter pin gauges, so please take a look.

Oct 20, 2025

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Isolite Industrial's developed product Isofil W

Dust collection filter for high temperature, high-performance ceramics, Isofil.

  • NEW
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Introducing the Isofill series from ISOLITE Industries. Utilization of waste heat from high-temperature clean gases generated during waste material processing and recycling is possible. We realize effective use of thermal energy. ISOLITE's products with fireproof insulation technology eliminate concerns about damage from sparks and flames. They have high collection performance and enable heat recovery with clean exhaust gases. We have a proven track record in sewage sludge incineration facilities and industrial waste incinerators, among others. Please feel free to contact us for inquiries.

Oct 20, 2025

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Product Information: Glass Tube Area Flow Meter / Metal Tube Area Flow Meter

  • NEW
  • PRODUCT

When measuring the flow rate of liquids or gases that are unsuitable for plastic due to high pressure or high temperature, our robust "glass tube variable area flow meter (rotameter)" allows for more accurate flow measurements. It offers a wider flow range and is suitable for various liquids and gases! 【Features】 ■ Glass tube variable area flow meter ・ Flow measurement technology with high durability, economy, and excellent operability ・ Capable of a wider flow range, suitable for various liquids and gases ■ Metal tube variable area flow meter ・ Durability and accuracy that withstands high pressure and harsh temperature environments 【Product Lineup】 ■ Glass tube variable area flow meter ・ Sho-Rate models 1350, 1355, 1358 ・ GT1600 series ■ Metal tube variable area flow meter ・ MT3750 series ・ MT3809 series ▼ For more details, visit https://www.brooksinstrument.com/ja-jp/products/variable-area-flow-meters

Oct 20, 2025

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