Thank you for attending the Total Solutions Exhibition for Electronic Devices 2024.

From July 12 to 14, 2024, Takaya Corporation's Industrial Equipment Division exhibited at the "Electronic Equipment Total Solution Exhibition 2024 (JPCA Show 2024)" held at Tokyo Big Sight. During the event, we were interviewed by the PCB information site "Kiban no Madoguchi," and the footage has been published on the Kiban no Madoguchi YouTube channel. Please take a look!

Takaya Corporation is conducting joint research with the Graduate School of Science and Engineering at Ehime University on "Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning." Recently, from June 12 (Wednesday) to June 14 (Friday), 2024, at the Tokyo Big Sight, during the exhibition "JPCA Show 2024 / 2024 Microelectronics Show," a report on this research was displayed and introduced at the Ehime University booth. Additionally, on June 14 (Friday), a seminar presentation regarding this topic was held at the venue. For those who were unable to attend, we will also publish the report on this research on this page. It can be accessed from the related catalog pages below. We encourage everyone to take this opportunity to take a look.

Thank you to everyone who visited the Takaya Corporation booth at the "Electronic Equipment Total Solution Exhibition 2024 / JISSO PROTEC 2024" held at Tokyo Big Sight from June 12 (Wednesday) to June 14 (Friday), 2024. If you have any questions or inquiries regarding the exhibits, please feel free to contact us. Additionally, the explanatory panels displayed at the venue are now available on Ipros, so please take a look at those as well.

Takaya Corporation (Headquarters: Ihara Town, Okayama Prefecture; President: Ryuji Okamoto) has received the 20th "JPCA Award" (hereinafter referred to as "the Award") for its "Hybrid Inspection System Combining JTAG Testing and Flying Probe Testing." The awarded "Hybrid Inspection System Combining JTAG Testing and Flying Probe Testing" integrates the flying probe tester with JTAG boundary scan testing, allowing for the mutual complementarity of each inspection method. This maximizes the test coverage of high-density mounted circuit boards and enables more accurate fault diagnosis, introducing a new system. A panel introducing the Award will be displayed at the "JPCA Show 2024 (Total Solutions for Electronic Devices Exhibition 2024)" held at Tokyo Big Sight from June 12 (Wednesday) to June 14 (Friday). Our company will also have an exhibition booth at the event, showcasing a real flying probe tester. We invite you to come and see it.