Report on Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning [Joint Research with Ehime University]

Takaya Corporation is conducting joint research with the Graduate School of Science and Engineering at Ehime University on "Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning."
Recently, from June 12 (Wednesday) to June 14 (Friday), 2024, at the Tokyo Big Sight, during the exhibition "JPCA Show 2024 / 2024 Microelectronics Show," a report on this research was displayed and introduced at the Ehime University booth. Additionally, on June 14 (Friday), a seminar presentation regarding this topic was held at the venue.
For those who were unable to attend, we will also publish the report on this research on this page. It can be accessed from the related catalog pages below. We encourage everyone to take this opportunity to take a look.


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