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  1. Home
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  3. プレシテック・ジャパン
  4. Nepcon Japan 2025
SEMINAR_EVENT
  • Nov 01, 2024
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Nov 01, 2024

Nepcon Japan 2025

プレシテック・ジャパン プレシテック・ジャパン
We will be exhibiting at NEPCON Japan, held at Tokyo Big Sight from January 22 to 24, 2025. If you are interested, please feel free to visit our booth. ■ Products to be exhibited - Spectral interference thickness sensor CHRocodile 2IT - Area scanner FSS80 - Chromatic aberration confocal sensor CHRocodile Mini - Chromatic aberration confocal line sensor CLS2 - Chromatic aberration confocal line camera CVC - Thickness measurement sensor for opaque materials Enovasense - Area sensor for internal defect inspection Field sensor
Date and time Wednesday, Jan 22, 2025 ~ Friday, Jan 24, 2025
10:00 AM ~ 05:00 PM
Capital 39th ElectroTest Japan - Electronics Inspection, Testing, and Measurement Exhibition Tokyo Big Sight East Hall 2, Booth Number #E14-18
Entry fee Free
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スクリーンショット 2024-08-15 152941.png

Laser welding/optical measurement solutions for electric vehicle batteries.

High-precision, high-speed optical measurement sensors, laser welding, monitoring during welding, and other product solutions necessary for battery development and production.

■ Optical Measurement Sensors ・Enovsaense - Measurement of thickness of opaque materials Thickness of graphite coating on batteries ・Field Sensor - Internal defect inspection Area inspection of defects inside welds (Cracks, blowholes, pinholes, etc.) ・Dual Point Sensor (DPS) - Measurement of electrode thickness High-speed and high-precision measurement using two distance sensors ・FSS - Measurement of insulation layer thickness Combination of galvanometer mirror and OCT to quickly obtain thickness profiles ・CVC (Line Camera) - Burr inspection Automatic inspection of burrs after cutting battery foil ・CLS (3D Line Sensor) - Battery weld joint shape Shape measurement using a high-speed 3D line sensor ■ Welding Monitoring ・LWM - Laser welding In Process monitoring Good product determination based on three types of light during welding Over 15,000 units in operation ■ Laser Welding ・Scan Master - Laser welding Welding head incorporating various functions

  • Defect Inspection Equipment

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Enovasense 写真.PNG

Non-contact thickness measurement of opaque materials using laser photothermal sensors - case studies available.

For high-precision thickness measurement of opaque materials, Enovasense's laser photo-thermal sensor can measure thickness from a minimum of 10nm, regardless of the material.

The sensors from the French company Enovasense are high-performance sensors that use laser photothermal technology to measure the thickness of opaque materials non-contactly. ■Features - Non-contact measurement of the thickness of opaque materials is possible, eliminating the need for destructive testing. - A wide measurement range from a minimum of 10nm to a maximum of 1mm. - High precision measurements of 0.5% to 3% or less are achievable, recommended for those lacking accuracy. - Capable of measuring various combinations of materials regardless of the base material. ■Applications Used in a wide range of fields including the automotive industry, aerospace industry, consumer goods, industrial products, medical industry, and semiconductors, for various applications such as coating thickness, metal plating thickness, and paint film thickness. *Currently, Enovasense is a group company of the German optical sensor manufacturer Precitec. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

  • Coating thickness gauge

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スクリーンショット 2024-06-05 113647.png

Non-contact small optical distance sensor [CHRocodile C/Mini]

Affordable distance sensors for measuring film and coating thickness, as well as non-contact thickness measurement. Strong performance on slopes, achieving a distance direction resolution of 20nm!

Our optical distance sensor/thickness sensor 'CHRocodile C / CHRocodile Mini' from PreciTech Japan is a compact non-contact sensor with a wide measurement range. It is robust against slopes and offers high resolution in the distance direction starting from 20nm, all at an affordable price of approximately 1 million yen (excluding tax). 【Examples of Use Cases】 ● Complete inspection through height and distance measurement of manufactured products within equipment ● Quality improvement through thickness management of glass, film, and graphite coatings ⇒ Adopted by manufacturers of production equipment, inspection equipment, and integrators. 【Features】 ・Combines high resolution with a price point that lowers the purchasing barrier ・Non-contact measurement of film and coating thickness ・Strong against slopes with an angle tolerance of up to ±45 degrees ・Distance direction resolution starting from 20nm ・Flexible software creation possible with the provided software development kit ・Can be embedded in equipment ・Compatible with rough and mirror surfaces, independent of surface or shape *For product details, please refer to the materials available for download in PDF format. Feel free to contact us for inquiries.

  • Distance measuring device

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Enovasenes field sensor.png

Enovasense Field Sensor

High-speed opaque film thickness mapping and area detection of internal defects using a laser photothermal sensor.

The sensors from the French company Enovasense are high-performance sensors that use laser photothermal technology to measure the thickness of opaque materials non-contactly. This new product is an area sensor that can simultaneously measure approximately 110,000 points, unlike conventional single-point sensors. It can detect not only the thickness mapping of opaque materials but also the presence of defects, chips, and delaminations beneath the surface layer. ■ Features - Non-contact measurement of the following: ☆ Thickness mapping of opaque materials ☆ Detection of defects beneath opaque surface material layers No destructive testing is required. - As an area sensor, it can measure approximately 110,000 points simultaneously in one second. - It can also be applied to detect defects in areas such as welds, where conventional X-ray or CT scans are typically required. - Measurement is possible with various combinations of materials, regardless of the base material. ■ Applications Automotive industry, aerospace industry, consumer goods, industrial products, medical industry, semiconductor field. It can be used in various applications such as coating thickness, metal plating thickness, paint films, and welds. *For more details, please check the PDF download or contact us.

  • Defect Inspection Equipment

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2LR.png

Thickness measurement - Optical sensor 'CHRocodile 2LR ver2'

Non-contact optical thickness measurement. Applicable even for thickness measurements of semiconductor wafers where high precision is required.

The new product "CHRocodile 2LR ver2" is a device that can non-contact measure the thickness of materials such as wafers and coatings. It adopts a new detector different from the previous "CHRocodile 2LR," allowing for approximately twice the thickness measurement range and more precise measurements. It can also be applied inline, and the CHRocodile 2LR has a proven track record with many customers. It is capable of measuring the thickness of semiconductor wafers like Si, as well as films, resins, glass, and solar cells. It supports interference film thickness of up to 16 layers. 【Features】  ■ Wide thickness measurement range, compatible with various materials    With a rich lineup of probes, it covers thicknesses from thin films (around 32μm) to thick films (3900μm). (The high-precision measurement range is 16~1900μm with linearity of 0.35μm)  ■ High resolution (sub-micron, minimum 1nm)  ■ Contributes to reducing development costs and shortening development lead times,    with a software development kit (DLL, etc.) available for device integration  ■ Extensive track record in the semiconductor industry *For more details, please refer to the documentation.

  • Coating thickness gauge
  • Other inspection equipment and devices

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1.JPG

High-speed and high-precision thickness measurement! Precitech non-contact sensor.

In addition to the conventional chromatic aberration confocal method and spectral interference method, a thickness measurement sensor utilizing laser heating has also emerged. It can measure the thickness of both transparent and opaque materials non-contactly.

Presitech is a German manufacturer of non-contact sensors. It develops and manufactures optical sensors using chromatic aberration confocal method and spectral interference method. At the end of 2022, it acquired the French company Enovasense, adding sensors that utilize laser heating to measure the thickness of opaque materials to its lineup. The company specializes in high-speed and high-precision thickness measurement, which is used for inspecting wafers, coatings, films, paint films, anti-corrosion coatings, and more. It offers a wide measurement range, tolerance angles, and can accommodate various materials, including line sensors and area scanners suitable for full surface measurement. There are numerous achievements in integrating these sensors into semiconductor manufacturing equipment, and they are also used in LCD manufacturing equipment and inline inspection of films. Additionally, they are utilized as embedded sensors for tabletop machines such as standalone units. Enovasense's sensors have also demonstrated success in measuring coating thickness for aerospace-related components. *For product details, please refer to the materials available for download in PDF format. Feel free to contact us with any inquiries.*

  • Sensors

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Related catalog(6)

High-power light source equipped CHRocodile 2S HP - Thickness measurement/Shape measurement

High-power light source equipped CHRocodile 2S HP - Thickness measurement/Shape measurement

APPLICATION_NOTE
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Non-contact small single-point sensors 'CHRocodile C' and 'CHRocodile Mini'

Non-contact small single-point sensors 'CHRocodile C' and 'CHRocodile Mini'

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Presitech CHRocodile Sensor Lineup Spectral Interference Thickness Measurement

Presitech CHRocodile Sensor Lineup Spectral Interference Thickness Measurement

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Welding Internal Defect Measurement Sensor Enovasense Field Sensor

Welding Internal Defect Measurement Sensor Enovasense Field Sensor

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Laser photo-thermal thickness measurement and internal defect inspection Enovasense field sensor

Laser photo-thermal thickness measurement and internal defect inspection Enovasense field sensor

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Case studies, applications, and measurement overview materials for Enovasense's laser photo-thermal sensors.

Case studies, applications, and measurement overview materials for Enovasense's laser photo-thermal sensors.

TECHNICAL
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[Seminar] Initiatives for the Construction of Automated Logistics Roads

  • NEW
  • SEMINAR_EVENT

[Speaker] Ministry of Land, Infrastructure, Transport and Tourism, Road Bureau, Planning Division, Road Economic Research Office Planning Specialist Yuki Endo [Key Lecture Content] The Ministry of Land, Infrastructure, Transport and Tourism is advancing discussions on the realization of automated logistics roads as a new form of logistics in response to recommendations from the "Interim Summary on the State of High-Standard Road Networks," addressing logistics crises and carbon neutrality. This lecture will introduce the final summary on the state of automated logistics roads published in July of the 7th year of Reiwa, as well as the demonstration experiments planned for the 7th year of Reiwa. [Lecture Items] 1. Final summary on automated logistics roads 2. Demonstration experiments for the 7th year of Reiwa 3. Q&A / Business card exchange

Mar 18, 2026

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[Seminar] The Core of Connectivity Supporting SDV

  • NEW
  • SEMINAR_EVENT

[Speaker] NTT Docomo Business Inc. 5G & IoT Services Department Director in charge of Global Connected Cars, Yuji Tamai [Key Lecture Content] The value of SDV lies in continuously cycling 'updates × data × cloud', and connectivity is a prerequisite for this. In this presentation, we will organize the barriers of quality, cost, and regulation faced in global expansion, and explain the design principles and operational models from roaming enhancement, eSIM/RSP (SGP.32), integrated management (CMP), NTN, to Network API. Additionally, we will delve into security aspects related to connectivity, introducing phenomena observed in actual service operations and their countermeasures, as well as exploring other operational updates (staged delivery, avoiding simultaneous activation, monitoring/observability). [Lecture Items] 1. Positioning of connectivity in SDV 2. Barriers to global connectivity 3. Designing to "strengthen" roaming 4. eSIM/RSP and SGP.32 5. Integrated connectivity management (CMP) and operations 6. Further connectivity - NTN and Network API 7. Security and update operations 8. Q&A

Mar 18, 2026

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Graduating from a workplace that doesn't move unless you say so. How to change the field with a system.

  • NEW
  • SEMINAR_EVENT

"Even though I'm communicating, nothing changes." "When I give a warning, the atmosphere gets worse." — Are you trying to solve these problems just by changing how you interact? What you need is not to move people, but to create a workplace that is easy to navigate. I will explain based on numerous examples of on-site improvements that I have supported. Held on May 27 (Wednesday). Please check the LP for more details. ▼ For more information and registration (free), see below.

Mar 18, 2026

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Free Dry Fog Humidification System Demo Experience Event

  • NEW
  • SEMINAR_EVENT

At the Dry Fog Humidification System Free Demo Experience, you will have the opportunity to actually experience our Dry Fog, as well as our single-fluid and dual-fluid humidifiers. We will explain the differences from conventional humidifiers and the effects of implementation. In addition to introducing the latest case studies, we will also provide time for you to consult directly with our specialized staff. Please select a convenient venue and date from the application page and apply. * The "morning session" and "afternoon session" contain the same content. Please participate at a time that suits you. * This event is intended for users only. Participation from trading companies, other companies in the same industry, or for sales purposes to our company is not permitted. Venues: ■ Yamagata Venue: 3/12 (Wed) at Yamagata International Exchange Plaza 3/13 (Thu) at Sakata Chamber of Commerce and Industry ■ Sendai Venue: 3/14 (Fri) at Kiri no Ikeuchi Sendai Branch ■ Tokyo Venue & Osaka Venue: 3/18 (Tue), 3/19 (Wed), 3/21 (Fri) at Kiri no Ikeuchi Tokyo Sales Office & Kiri no Ikeuchi Osaka Headquarters ■ Nagoya Venue & Fukuoka Venue: 4/9 (Wed), 4/10 (Thu), 4/11 (Fri) at Kiri no Ikeuchi Nagoya Sales Office & Kiri no Ikeuchi Fukuoka Sales Office

Mar 18, 2026

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A Thorough Explanation of How to Proceed with AS/400 Rewrite through Q&A! - The Path to Project Success Revealed through On-Site Questions -

  • NEW
  • SEMINAR_EVENT

In recent years, as many companies are considering modernization, exploring methods for system renewal has become an important issue. This seminar will focus on "Rewrite," one of the solutions to such challenges, and will explain questions and issues encountered during project promotion in a Q&A format. <Program> - Opening - How to advance system renewal through "Rewrite" and key points for problem-solving - Introduction of unique tools to support migration <Recommended for> - Those who are struggling with specific methods for system renewal - Those who are concerned about the continuity of maintenance for existing systems and a shortage of personnel - Companies that own IBM i (AS/400) *We may refuse applications from competing companies or those not eligible to participate.

Mar 18, 2026

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