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  1. Home
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  3. プレシテック・ジャパン
  4. Nepcon Japan 2025
SEMINAR_EVENT
  • Nov 01, 2024
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Nov 01, 2024

Nepcon Japan 2025

プレシテック・ジャパン プレシテック・ジャパン
We will be exhibiting at NEPCON Japan, held at Tokyo Big Sight from January 22 to 24, 2025. If you are interested, please feel free to visit our booth. ■ Products to be exhibited - Spectral interference thickness sensor CHRocodile 2IT - Area scanner FSS80 - Chromatic aberration confocal sensor CHRocodile Mini - Chromatic aberration confocal line sensor CLS2 - Chromatic aberration confocal line camera CVC - Thickness measurement sensor for opaque materials Enovasense - Area sensor for internal defect inspection Field sensor
Date and time Wednesday, Jan 22, 2025 ~ Friday, Jan 24, 2025
10:00 AM ~ 05:00 PM
Capital 39th ElectroTest Japan - Electronics Inspection, Testing, and Measurement Exhibition Tokyo Big Sight East Hall 2, Booth Number #E14-18
Entry fee Free
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スクリーンショット 2024-08-15 152941.png

Laser welding/optical measurement solutions for electric vehicle batteries.

High-precision, high-speed optical measurement sensors, laser welding, monitoring during welding, and other product solutions necessary for battery development and production.

■ Optical Measurement Sensors ・Enovsaense - Measurement of thickness of opaque materials Thickness of graphite coating on batteries ・Field Sensor - Internal defect inspection Area inspection of defects inside welds (Cracks, blowholes, pinholes, etc.) ・Dual Point Sensor (DPS) - Measurement of electrode thickness High-speed and high-precision measurement using two distance sensors ・FSS - Measurement of insulation layer thickness Combination of galvanometer mirror and OCT to quickly obtain thickness profiles ・CVC (Line Camera) - Burr inspection Automatic inspection of burrs after cutting battery foil ・CLS (3D Line Sensor) - Battery weld joint shape Shape measurement using a high-speed 3D line sensor ■ Welding Monitoring ・LWM - Laser welding In Process monitoring Good product determination based on three types of light during welding Over 15,000 units in operation ■ Laser Welding ・Scan Master - Laser welding Welding head incorporating various functions

  • Defect Inspection Equipment

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Enovasense 写真.PNG

Non-contact thickness measurement of opaque materials using laser photothermal sensors - case studies available.

For high-precision thickness measurement of opaque materials, Enovasense's laser photo-thermal sensor can measure thickness from a minimum of 10nm, regardless of the material.

The sensors from the French company Enovasense are high-performance sensors that use laser photothermal technology to measure the thickness of opaque materials non-contactly. ■Features - Non-contact measurement of the thickness of opaque materials is possible, eliminating the need for destructive testing. - A wide measurement range from a minimum of 10nm to a maximum of 1mm. - High precision measurements of 0.5% to 3% or less are achievable, recommended for those lacking accuracy. - Capable of measuring various combinations of materials regardless of the base material. ■Applications Used in a wide range of fields including the automotive industry, aerospace industry, consumer goods, industrial products, medical industry, and semiconductors, for various applications such as coating thickness, metal plating thickness, and paint film thickness. *Currently, Enovasense is a group company of the German optical sensor manufacturer Precitec. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

  • Coating thickness gauge

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スクリーンショット 2024-06-05 113647.png

Non-contact small optical distance sensor [CHRocodile C/Mini]

Affordable distance sensors for measuring film and coating thickness, as well as non-contact thickness measurement. Strong performance on slopes, achieving a distance direction resolution of 20nm!

Our optical distance sensor/thickness sensor 'CHRocodile C / CHRocodile Mini' from PreciTech Japan is a compact non-contact sensor with a wide measurement range. It is robust against slopes and offers high resolution in the distance direction starting from 20nm, all at an affordable price of approximately 1 million yen (excluding tax). 【Examples of Use Cases】 ● Complete inspection through height and distance measurement of manufactured products within equipment ● Quality improvement through thickness management of glass, film, and graphite coatings ⇒ Adopted by manufacturers of production equipment, inspection equipment, and integrators. 【Features】 ・Combines high resolution with a price point that lowers the purchasing barrier ・Non-contact measurement of film and coating thickness ・Strong against slopes with an angle tolerance of up to ±45 degrees ・Distance direction resolution starting from 20nm ・Flexible software creation possible with the provided software development kit ・Can be embedded in equipment ・Compatible with rough and mirror surfaces, independent of surface or shape *For product details, please refer to the materials available for download in PDF format. Feel free to contact us for inquiries.

  • Distance measuring device

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Enovasenes field sensor.png

Enovasense Field Sensor

High-speed opaque film thickness mapping and area detection of internal defects using a laser photothermal sensor.

The sensors from the French company Enovasense are high-performance sensors that use laser photothermal technology to measure the thickness of opaque materials non-contactly. This new product is an area sensor that can simultaneously measure approximately 110,000 points, unlike conventional single-point sensors. It can detect not only the thickness mapping of opaque materials but also the presence of defects, chips, and delaminations beneath the surface layer. ■ Features - Non-contact measurement of the following: ☆ Thickness mapping of opaque materials ☆ Detection of defects beneath opaque surface material layers No destructive testing is required. - As an area sensor, it can measure approximately 110,000 points simultaneously in one second. - It can also be applied to detect defects in areas such as welds, where conventional X-ray or CT scans are typically required. - Measurement is possible with various combinations of materials, regardless of the base material. ■ Applications Automotive industry, aerospace industry, consumer goods, industrial products, medical industry, semiconductor field. It can be used in various applications such as coating thickness, metal plating thickness, paint films, and welds. *For more details, please check the PDF download or contact us.

  • Defect Inspection Equipment

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2LR.png

Thickness measurement - Optical sensor 'CHRocodile 2LR ver2'

Non-contact optical thickness measurement. Applicable even for thickness measurements of semiconductor wafers where high precision is required.

The new product "CHRocodile 2LR ver2" is a device that can non-contact measure the thickness of materials such as wafers and coatings. It adopts a new detector different from the previous "CHRocodile 2LR," allowing for approximately twice the thickness measurement range and more precise measurements. It can also be applied inline, and the CHRocodile 2LR has a proven track record with many customers. It is capable of measuring the thickness of semiconductor wafers like Si, as well as films, resins, glass, and solar cells. It supports interference film thickness of up to 16 layers. 【Features】  ■ Wide thickness measurement range, compatible with various materials    With a rich lineup of probes, it covers thicknesses from thin films (around 32μm) to thick films (3900μm). (The high-precision measurement range is 16~1900μm with linearity of 0.35μm)  ■ High resolution (sub-micron, minimum 1nm)  ■ Contributes to reducing development costs and shortening development lead times,    with a software development kit (DLL, etc.) available for device integration  ■ Extensive track record in the semiconductor industry *For more details, please refer to the documentation.

  • Coating thickness gauge
  • Other inspection equipment and devices

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1.JPG

High-speed and high-precision thickness measurement! Precitech non-contact sensor.

In addition to the conventional chromatic aberration confocal method and spectral interference method, a thickness measurement sensor utilizing laser heating has also emerged. It can measure the thickness of both transparent and opaque materials non-contactly.

Presitech is a German manufacturer of non-contact sensors. It develops and manufactures optical sensors using chromatic aberration confocal method and spectral interference method. At the end of 2022, it acquired the French company Enovasense, adding sensors that utilize laser heating to measure the thickness of opaque materials to its lineup. The company specializes in high-speed and high-precision thickness measurement, which is used for inspecting wafers, coatings, films, paint films, anti-corrosion coatings, and more. It offers a wide measurement range, tolerance angles, and can accommodate various materials, including line sensors and area scanners suitable for full surface measurement. There are numerous achievements in integrating these sensors into semiconductor manufacturing equipment, and they are also used in LCD manufacturing equipment and inline inspection of films. Additionally, they are utilized as embedded sensors for tabletop machines such as standalone units. Enovasense's sensors have also demonstrated success in measuring coating thickness for aerospace-related components. *For product details, please refer to the materials available for download in PDF format. Feel free to contact us with any inquiries.*

  • Sensors

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Related catalog(6)

High-power light source equipped CHRocodile 2S HP - Thickness measurement/Shape measurement

High-power light source equipped CHRocodile 2S HP - Thickness measurement/Shape measurement

APPLICATION_NOTE
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Non-contact small single-point sensors 'CHRocodile C' and 'CHRocodile Mini'

Non-contact small single-point sensors 'CHRocodile C' and 'CHRocodile Mini'

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Presitech CHRocodile Sensor Lineup Spectral Interference Thickness Measurement

Presitech CHRocodile Sensor Lineup Spectral Interference Thickness Measurement

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Welding Internal Defect Measurement Sensor Enovasense Field Sensor

Welding Internal Defect Measurement Sensor Enovasense Field Sensor

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Laser photo-thermal thickness measurement and internal defect inspection Enovasense field sensor

Laser photo-thermal thickness measurement and internal defect inspection Enovasense field sensor

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Case studies, applications, and measurement overview materials for Enovasense's laser photo-thermal sensors.

Case studies, applications, and measurement overview materials for Enovasense's laser photo-thermal sensors.

TECHNICAL
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[Webinar on 12/18] What are the Appropriate Methods to Protect Intellectual Property? - Explaining Technical Options to Achieve Evidence Strength, Tampering Prevention, and Operational Efficiency -

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  • SEMINAR_EVENT

We will hold a webinar on the theme "What are the appropriate methods to protect intellectual property?" This seminar will explain the key points of intellectual property document management to achieve evidential strength, tampering prevention, and operational efficiency. We will also introduce the solution "WWDS Intellectual Property Archive," which automatically clarifies the location of documents and ensures authenticity through timestamps. ■ Date and Time: December 18, 2025 (Thursday) 13:30 - 14:30 ■ Location: Online Webinar (scheduled to be held via Zoom Webinar)

Dec 11, 2025

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[Seminar] Latest Trends in Domestic and International Collaboration with Watt-Bit

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  • SEMINAR_EVENT

[Speaker] Yoshimitsu Umabashi, Senior Researcher, Smart Resilience Network Ambassador, Research Coordination Office, Grid Innovation Research Headquarters, Central Research Institute of Electric Power Industry (Former Vice President of TN Cross Corporation) [Lecture Items] 1. What is Watt-Bit? (1) Current state of power supply capacity (2) Changes in power demand and their causes (3) Integration of communication and electricity (the essence of Watt-Bit) 2. Impact of changes in power demand (1) Data centers as a significant factor (2) Supply chain surrounding data centers 3. Data centers as large-scale demand (1) Demand control and data centers (2) Perspectives of stakeholders surrounding data centers (3) Impact of data centers on the grid (4) Expectations from stakeholders surrounding data centers (5) New technologies anticipated in data centers 4. Current state and future of Watt-Bit (1) Watt-Bit Public-Private Liaison Council (2) Direction of international initiatives (3) Relation to the MESH concept (4) What can be achieved with Watt-Bit 5. Q&A / Business card exchange

Dec 11, 2025

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[Seminar] Latest Trends in Neurotech and Strategies for Business Applications

  • NEW
  • SEMINAR_EVENT

[Speaker] Mr. Kei Nishishita, Senior Researcher, Advanced Technology Lab, Japan Research Institute, Ltd. [Key Lecture Content] Neurotech is a collective term for technologies that utilize insights from neuroscience, and in recent years, it has also been referred to as brain tech, with accelerated research and development and commercialization efforts both domestically and internationally. This seminar will systematically organize the foundational technologies and latest trends in the neurotech field, while also highlighting advanced initiatives underway in Japan and abroad, explaining their characteristics and implications. Additionally, considering the current state of neurotech being implemented in society, we will also address changes in the surrounding environment, such as ethics, legal frameworks, and social acceptance. Furthermore, as the integration with the AI field progresses, we will explore what developments can be anticipated in the future and what opportunities and risks may arise in business development from a multifaceted perspective. [Lecture Items] 1. Overview and Current Status of Neurotech 2. Advanced Examples of Neurotech 3. Social Trends Surrounding Neurotech 4. Future Outlook and Strategies for Business Applications 5. Q&A

Dec 11, 2025

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[Seminar] Toyota and the Sources of Strategy and Competitiveness of Chinese EVs

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  • SEMINAR_EVENT

[Speaker] Takuki Nakani, Representative and Analyst, Nakanishi Automotive Industry Research Co., Ltd. Author of "Toyota vs. Chinese EVs" [Key Lecture Content] A powerful group of the strongest EV manufacturers in the Chinese market and their robust supporting ecosystem are emerging prominently. This is organically linked to China's digital national strategy. As the competitive landscape of the global automotive industry changes with the evolution of SDVs and AI, can Japanese manufacturers chart a path to victory? With an eye on the fragmentation of industrial hegemony, we will examine the future structure of the automotive industry. [Lecture Items] 1. The structure of the battle over intelligence 2. Competitiveness of the strongest Chinese EV manufacturers 3. Japan's OEM strategy against China 4. Japan's path to victory – SDV value chain strategy 5. Evolution of manufacturing accompanying the SDV shift 6. Q&A / Business card exchange

Dec 11, 2025

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Notice of Participation in "SURTECH 2026 Surface Technology Elements Exhibition" from January 28 (Wednesday) to January 30 (Friday), 2026.

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  • SEMINAR_EVENT

Sansin Manufacturing Co., Ltd. will be exhibiting at the "SURTECH 2026 Surface Technology Elements Exhibition" held at Tokyo Big Sight. At our booth, we plan to showcase wastewater treatment equipment utilizing IoT technology. We look forward to your visit. <Event Overview> ■ Venue: Tokyo Big Sight, South Hall 4 ■ Address: 3-11-1 Ariake, Koto-ku, Tokyo 135-0063 ■ Booth Number: 3S-U22 ■ Nearest Stations: - Rinkai Line: Kokusai Tenjijo Station (approximately 7 minutes on foot) - Yurikamome: Tokyo Big Sight Station (approximately 3 minutes on foot)

Dec 11, 2025

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