Notice of Participation in SEMICON JAPAN 2025

Achieving reduced cycle time in chip manufacturing and high quality! Sensors for blade monitoring during wafer cutting.

"VBI" monitors the blade during wafer cutting, ensuring high reliability and reducing waste. By measuring blade wear and shape in real-time, it achieves scrap reduction without stopping production. The interface unit connects two sensors. It is possible to perform the same function with both or to execute two different functions. *For more details, please refer to the PDF document or feel free to contact us.*

• Sensors
• Wafer
• Other measurement, recording and measuring instruments

Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

The "NCG" is a thickness measurement device using optical interference technology. It calculates and measures the thickness of layers through the interference caused by the reflection of light waves at the joint surface of the workpiece. It is designed to manage the thickness of different materials such as glass, plastic, and silicon wafers. This product can be connected to various machines, allowing for high-precision and high-speed management of component thickness, and can be used in dry or wet environments within the specified limits of the specifications, either on the machine or inside the machine. 【Features】 ■ Guarantees processing accuracy within the desired tolerance ■ Reduces cycle time ■ Control for maintaining stable production under controlled conditions ■ Compensation for mechanical variations ■ History of measurement results *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments
• Optical Measuring Instruments

Thickness measurement is possible from thick wafers to ultra-thin wafers (less than 1μm).

Non-contact measurements with high precision are achieved without damaging the measured object. Thickness measurements can be performed with extremely high resolution on all types of surfaces and materials, including highly reflective surfaces. The NCG-R system, equipped with a dedicated optical sensor, is designed with high protection performance (such as an enclosure compliant with IP standards), making it suitable for a wide range of applications from post-manufacturing inspections to in-process inspections. Thickness measurements of thin films, coatings, and nano-layers are the standout features of the NCG-R system, demonstrating exceptional performance. The NCG-R controller (visible light type) is compatible with all types of sensor heads, achieving optimized performance tailored to the measurement range and operating environment (such as working distance and spot size).

• Coating thickness gauge

Using interferometric (interferometer) technology, it is possible to measure the thickness of transparent and opaque films.

This is a series of controllers designed to measure thickness and distance in conjunction with optical sensor heads. Utilizing interferometric (interferometer) technology and a dedicated data processing software package, it provides a solution for accurate measurements even in situations where contact with the target area is not possible. With high precision and stability at the sub-micron level, it guarantees reliable measurements with excellent repeatability and accuracy. Additionally, it supports inline process control with real-time monitoring, contributing to improved production efficiency.

• Coating thickness gauge

It is possible to produce high-quality work without damaging delicate work and without destructive testing. It is a fully synchronized system that is resilient to variations in work and environment.

Sensors and controllers using chromatic confocal measurement technology. We offer various options tailored to your work and environment. They are utilized in industries such as automotive, semiconductor, and glass worldwide. <Advantages> - Non-contact technology suitable for measuring soft or opaque materials (e.g., aluminum rolls, copper rolls, lithium-ion battery separators) - Capable of measuring layer thickness from 5µm - Wide measurement range suitable for inline use - High sensitivity and high precision (the reproducibility range of total thickness in actual applications is within 1µm) - Provision of measurement forks or a complete set of gauging equipment - Quick-SPC software option enables statistical processing and data transfer If you have the following challenges, please download the PDF and consult with us. - Variations in work or environment - Synchronization using multiple sensors - Mechanical alignment (tilt or misalignment) - Detailed understanding of measurements - Special applications requiring customization *For more details, please refer to the PDF document or feel free to contact us.

• Sensors

Hexacore Inc. will exhibit at "Data Center Japan 2026," which will be held at the Tokyo Metropolitan Industrial Trade Center Hamamatsucho from March 24 to March 25, 2026. At the Hexacore booth, we will introduce various distribution boards, as well as measurement and monitoring systems and implementation support services. 【Main Exhibited Products and Services】 - IEC Distribution Boards / Aluminum Transformer Equipped Distribution Boards (Panel Display) We will showcase IEC-compliant distribution boards (PDP) for data centers. Additionally, we will display aluminum transformer equipped distribution boards. - Remote Monitoring System Implementation Support Service for Data Centers (Panel Display) We will provide support tailored to customer requirements, from consideration of monitoring system implementation to on-site construction and startup. - PAL-Plus / PAL-Plus Large Capacity Version An IoT sensor with built-in communication functionality that allows for easy and space-saving measurement of alternating current (60A, 125A to 630A). - CEW-M4 A management software that visualizes equipment status such as current, power, energy consumption, temperature, and humidity, enabling efficient management of power usage and remaining power capacity of distribution boards. We sincerely look forward to your visit.

[Speaker] Kei Konagai, Senior Manager, Strategy& at PwC Consulting LLC [Key Lecture Content] The use of generative AI is rapidly expanding among manufacturing companies. However, many companies fall into the trap of being unable to produce results after simply "implementing it for now." A survey conducted by Strategy& involving 247 European manufacturing companies revealed that while the effects of back-office utilization are limited, the introduction of generative AI into core operations such as R&D and sales is the key to improving profitability. In Japanese companies as well, those aiming for structural transformation tend to achieve results that exceed expectations compared to those that only focus on streamlining peripheral operations. However, currently, it is not common to consider results indicators such as sales and gross profit margin in conjunction with these efforts. In this lecture, we will elaborate on a generative AI utilization strategy aimed at maximizing revenue impact from three perspectives: "strengthening upstream (design and development)," "streamlining downstream (after-sales service)," and "building a promotion system."

In this seminar, we will introduce "Platio Connect," which allows you to easily create mobile applications and achieve data integration with internal systems and automation of data utilization tasks without coding. We will also share demonstrations and case studies of companies that have successfully improved their operational efficiency. If you want to effectively utilize on-site data as internal assets, or if you want to leverage internal data on-site, or if you are interested in promoting DX (digital transformation) in the field, please join us.

We would like to provide information about the annual schedule for the event planned for 2026. This year, we are planning a wide range of activities, including: - Technical training sessions to deepen understanding of analytical techniques - Open house events where you can see the equipment in person - Seminars and workshops categorized by field and theme These will be held online and in various locations. Details about the start of registration and the programs for each event will be provided as the event dates approach. Please note that the schedule may be subject to change, so we appreciate your understanding in advance. Our staff is looking forward to the opportunity to meet with all of you this year. Thank you for your continued support of FOSS Japan.

We will be exhibiting at the "43rd Air Purification and Contamination Control Research Conference" from April 21 (Tuesday) to April 22 (Wednesday), 2026. Planned exhibit models: 6000, 9000, 8506-30, MMS (Multi-Sensor Control Software) We will be showcasing the new model 6000 and MMS (Multi-Sensor Control Software).