Notice of Participation in SEMICON JAPAN 2025

Achieving reduced cycle time in chip manufacturing and high quality! Sensors for blade monitoring during wafer cutting.

"VBI" monitors the blade during wafer cutting, ensuring high reliability and reducing waste. By measuring blade wear and shape in real-time, it achieves scrap reduction without stopping production. The interface unit connects two sensors. It is possible to perform the same function with both or to execute two different functions. *For more details, please refer to the PDF document or feel free to contact us.*

• Sensors
• Wafer
• Other measurement, recording and measuring instruments

Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

The "NCG" is a thickness measurement device using optical interference technology. It calculates and measures the thickness of layers through the interference caused by the reflection of light waves at the joint surface of the workpiece. It is designed to manage the thickness of different materials such as glass, plastic, and silicon wafers. This product can be connected to various machines, allowing for high-precision and high-speed management of component thickness, and can be used in dry or wet environments within the specified limits of the specifications, either on the machine or inside the machine. 【Features】 ■ Guarantees processing accuracy within the desired tolerance ■ Reduces cycle time ■ Control for maintaining stable production under controlled conditions ■ Compensation for mechanical variations ■ History of measurement results *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments
• Optical Measuring Instruments

Thickness measurement is possible from thick wafers to ultra-thin wafers (less than 1μm).

Non-contact measurements with high precision are achieved without damaging the measured object. Thickness measurements can be performed with extremely high resolution on all types of surfaces and materials, including highly reflective surfaces. The NCG-R system, equipped with a dedicated optical sensor, is designed with high protection performance (such as an enclosure compliant with IP standards), making it suitable for a wide range of applications from post-manufacturing inspections to in-process inspections. Thickness measurements of thin films, coatings, and nano-layers are the standout features of the NCG-R system, demonstrating exceptional performance. The NCG-R controller (visible light type) is compatible with all types of sensor heads, achieving optimized performance tailored to the measurement range and operating environment (such as working distance and spot size).

• Coating thickness gauge

Using interferometric (interferometer) technology, it is possible to measure the thickness of transparent and opaque films.

This is a series of controllers designed to measure thickness and distance in conjunction with optical sensor heads. Utilizing interferometric (interferometer) technology and a dedicated data processing software package, it provides a solution for accurate measurements even in situations where contact with the target area is not possible. With high precision and stability at the sub-micron level, it guarantees reliable measurements with excellent repeatability and accuracy. Additionally, it supports inline process control with real-time monitoring, contributing to improved production efficiency.

• Coating thickness gauge

It is possible to produce high-quality work without damaging delicate work and without destructive testing. It is a fully synchronized system that is resilient to variations in work and environment.

Sensors and controllers using chromatic confocal measurement technology. We offer various options tailored to your work and environment. They are utilized in industries such as automotive, semiconductor, and glass worldwide. <Advantages> - Non-contact technology suitable for measuring soft or opaque materials (e.g., aluminum rolls, copper rolls, lithium-ion battery separators) - Capable of measuring layer thickness from 5µm - Wide measurement range suitable for inline use - High sensitivity and high precision (the reproducibility range of total thickness in actual applications is within 1µm) - Provision of measurement forks or a complete set of gauging equipment - Quick-SPC software option enables statistical processing and data transfer If you have the following challenges, please download the PDF and consult with us. - Variations in work or environment - Synchronization using multiple sensors - Mechanical alignment (tilt or misalignment) - Detailed understanding of measurements - Special applications requiring customization *For more details, please refer to the PDF document or feel free to contact us.

• Sensors

The highly acclaimed program "Basic Course Series on Analog ICs" by Nisshinbo Micro Devices, which received over 300 applications last time, is back. This time, we will hold the very popular "Operational Amplifier Classroom - What is an Operational Amplifier?" We will introduce the basic functions of operational amplifiers. The difficulty level is beginner, so whether you are new to analog ICs or have some questions, we encourage you to participate! With the latest 2026 recorded lectures and live Q&A sessions with engineers, even busy engineers can learn efficiently. ● Target Participants New employees, young designers Those who want to relearn about analog ICs Those who are about to engage in circuit design, etc. ● Agenda 1. What is an Operational Amplifier - What is an operational amplifier - What is an ideal operational amplifier - Application circuits of operational amplifiers - Typical amplification circuits and gain 2. Structure of Operational Amplifiers 3. Classification of Operational Amplifiers - Dual power supply/single power supply/full swing input/output - High precision/high speed/broadband/high output/low noise/low consumption We look forward to your participation!

Extracting essential information, data analysis for prediction, cause analysis, reduction, and classification: A Practical Introduction ~Multivariate Analysis Specialized for the Manufacturing Industry: Basics and Implementation Procedures/Know-how for Analytical Practice~ [Includes Software Distribution and PC Exercises] -------------------------------------------------- https://www.science-t.com/seminar/B260522.html ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━ We will inform you about upcoming technical seminars with discounted participation fees. If you would like to apply for each seminar with a discount, please contact ikuma.fukui@wmjplab.com. * The discount on participation fees is available to anyone. * However, we do not accept participation from technical consultants or instructors. * If you wish to have an in-house training session for the same seminar, please contact me directly. ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━

Method for Determining Inspection Standards, Standard Values, and Safety Factors According to the Severity of Market Complaints ~ Fundamentals and Applications of Loss Functions that Balance Quality and Economic Efficiency ~ 【Includes PC Exercises (Templates that can also be used for in-house issue discussions)】 ------------------------------------------------------------ https://www.thplan.com/seminar/114398/ ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━ We will inform you about upcoming technical seminars with discounts on participation fees. If you would like to apply for each seminar with a discount on the participation fee, please contact ikuma.fukui@wmjplab.com. * The discount on the participation fee is available to anyone. * However, we do not accept participation from technical consultants or instructors. * If you wish to have the same seminar as an in-house training, please contact me directly. ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━

Introduction to Artificial Intelligence Application Development Led by Element Technologists Basics of Deep Neural Network Models and MT Systems, Minimization of Training Data, Development Implementation Procedures ~ Learning AI Application Know-How through "Automation of Development, Virtual Inspection, and Detection of Unknown Anomalies" ~ 【AI Construction Demo Included, Excel Materials on AI Construction and Calculation Methods Provided to Interested Parties】 ------------------------------------------------------------ https://johokiko.co.jp/seminar_chemical/AD260103.php ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━ We will inform you about upcoming technical seminars with discounted participation fees. If you would like to apply for each seminar with a discount, please contact ikuma.fukui@wmjplab.com. * The discount on participation fees is available to anyone. * However, we do not accept applications from technical consultants or instructors. * If you wish to have an in-house training session for the same seminar, please contact me directly. ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━

Robust Optimization Development Method to Solve the Four Major Challenges in Technology and Product Development: A Practical Introduction ~ Learning through Comparison with Conventional Development Methods and Experimental Design Methods [Quality Engineering Parameter Design] ~ [Software and Discussion Template Available for Interested Parties] ------------------------------------------------------------ https://www.rdsc.co.jp/seminar/260316 ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━ We will inform you about upcoming technical seminars with discounted participation fees. If you would like to apply for each seminar with a discount, please contact ikuma.fukui@wmjplab.com. * The discount on participation fees is available to anyone. * However, we do not accept participation from technical consultants or instructors. * If you wish to have this seminar as an in-house training, please contact me directly. ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━