Yonata Electronics Co., Ltd. Announcement of Exhibition at OPIE '26

Supports eye pattern testing of ultra-fast optical signals at 1.6T/800G/400G!

The DCA6065 is a high-performance 65 GHz sampling oscilloscope. It features a 65 GHz optical port bandwidth and offers selectable 1/2/4 channel configurations. It has a built-in TDECQ feed-forward equalizer (FFE) with a maximum of 64 taps. It supports flexible network configurations and includes a clock data recovery (CDR) system with 120 GBaud, or an independent CDR module can be added as an option. 【Key Specifications (Partial)】 ■ Optical Bandwidth: 65 GHz ■ Wavelength Range: 1250–1600 nm ■ Supported Standard Rates: 106.25/112 GBaud PAM4, 53.125/56 GBaud PAM4 ■ ADC Resolution: 14 Bit *For more details, please download the PDF or feel free to contact us.

• oscilloscope

Supports PAM4/NRZ signals and covers the 1.6TBASE/CEI-224G standard!

The B3224 is a high-performance Bit Error Rate Tester (BERT) for physical layer characteristic evaluation and consistency testing. With excellent signal quality, a wealth of features, and flexible testing modes (integrated MCB or remote head), it provides powerful performance and flexibility from research and development to manufacturing testing of high-speed serial circuit products. It supports data rates from 24.33 to 120 Gbaud. The test patterns include various PRBS, SSPRQ, JP03A/B, Square Wave, and custom-defined patterns. 【Key Specifications (Partial)】 ■ Output Signal: Differential PAM4/NRZ (AC Coupled) ■ Output Amplitude: 800 mVp-p (Differential) ■ Rise/Fall Time: < 4.5 ps ■ Input Signal: Differential PAM4/NRZ (AC Coupled) ■ Clock Mode: Built-in Clock Recovery *For more details, please download the PDF or feel free to contact us.

• Tester

Supports high-density testing with up to 64 lanes (128 differential pairs)!

The "B6064C" is a high-density, versatile solution that supports bit error rate (BER) testing for high-speed cables compliant with PCIe 6.0 and earlier standards. Equipped with automatic link training and up to 40dB of insertion loss compensation, it is ideal for research and development, verification, and manufacturing testing of high-speed PCIe cables. It enables comprehensive system-level signal integrity verification in data center interconnects, providing essential quality assurance for cable manufacturers and system integrators. 【Key Specifications (Partial)】 ■ Test Unit: 2 x 64 Pair TRx ■ Terminal: AC Coupled ■ Supported Rates: 64GT/s, 32GT/s, 16GT/s, 8GT/s, 5GT/s, 2.5GT/s ■ Protocol Compliance: PCIe 6.0/5.0/4.0/3.0/2.0 *For more details, please download the PDF or feel free to contact us.

• Testing Equipment and Devices

Compact and cost-effective single/dual channel benchtop SMU!

The "B0201 & B1201" is a high-precision benchtop SMU that can simultaneously output and measure voltage and current. It is an ideal choice for various IV measurement tasks that require high resolution and accuracy. It offers a wide voltage source (±200V) and current source (±1A DC, ±3A pulse) functionality, excellent precision, and a 6.5-digit display (minimum display resolution of 1fA/100nV). Additionally, it features an outstanding color LCD graphical user interface. 【Main Specifications (Partial)】 ■ Maximum Output Voltage: ±200V ■ Maximum Output Current: ±1A (DC), ±3A (Pulse) ■ Maximum Output Power (per channel): 20W ■ Minimum Measurement Resolution: 1fA/100nV ■ Maximum Sampling Rate: 1MS/s *For more details, please download the PDF or feel free to contact us.

• Other electronic measuring instruments

Compact and cost-effective 4-channel/8-channel desktop precision source/measurement unit!

The "B2031 & B3031" is a high-precision benchtop SMU that has the capability to output and measure voltage and current simultaneously. It can output a maximum of ±30V and ±500mA (DC/Pulse), and features an excellent color LCD graphical user interface (GUI). It also supports traditional SMU SCPI commands. Transitioning from existing test code can be done quickly and easily. 【Key Specifications (Partial)】 ■ Model: B2031 (4 channels) / B3031 (8 channels) ■ Maximum Output: Voltage ±30V, Current ±500mA (DC/Pulse) ■ Minimum Measurement Resolution: Voltage 60µV, Current 100pA ■ Maximum Sampling Rate: 500 kS/s *For more details, please download the PDF or feel free to contact us.

• Other electronic measuring instruments

High-performance wafer-level test system compatible with wafers from 8 inches to 12 inches!

The "SWT5100" is a high-performance wafer-level test system designed for automated testing of silicon photonics wafers. It offers a fully automated testing process from wafer loading to optical alignment. Equipped with a chuck capable of temperature control from 25°C to 150°C, it supports optical, DC, and RF testing. It accommodates both GC and EC coupling and can be flexibly configured from single fibers to fiber arrays. 【Main Specifications (Partial)】 ■ Supported Wafer Size: 8 to 12 inches ■ Supported Wafer Thickness: 200 to 2000 um ■ Chuck Temperature Range: 25°C to 150°C ■ Supported Tests: Optical, DC, RF ■ Coupling Method: Grating coupling and edge coupling *For more details, please download the PDF or feel free to contact us.

• Tester

Achieved over 50% higher throughput compared to conventional serial testers by adopting Per-Pin architecture!

The "PPT8200" is a high-performance parallel parametric test system designed with a "Per-Pin" architecture to optimize test efficiency. Equipped with SMUs and PGUs for each pin, it achieves over 50% higher throughput compared to traditional serial testers. The advanced software environment simplifies the development of test programs. It accelerates mass production launches, supports array testing, and provides a solution that balances high reliability and cost efficiency. 【Key Specifications (Partial)】 ■ Architecture: Per-Pin Architecture ■ Number of Pins: 48 Pins ■ Configuration: Per-Pin SMU, Per-Pin PGU ■ Voltage Range: ±200V ■ Current Range: ±1A ■ Throughput: >50% improvement compared to serial testers *For more details, please download the PDF or feel free to contact us.

• Tester

The pinhole inspection for packaging engineering is fully automated, eliminating packaging defects based on certain quality standards. The judgment results and operational status can be managed via a monitor screen. - Quantitative management of quality standards for the pinhole inspection process - Ensuring the quality of the product's shelf life - Establishing evaluation criteria for the manufacturing process, achieving quantitative quality assurance - Slim and space-saving design that can be connected to existing production lines - Quick changeover for product variety switching can be handled in a short time by exchanging chambers - Fully domestically produced, allowing for rapid maintenance and troubleshooting - Example target works: pillow packaging, packaged rice (packaged cooked rice), etc. *Please consult us regarding the use of this product for pharmaceuticals.

Fukuda Co., Ltd. has been pursuing leak detection for 60 years and is committed to advancing the future of leak testing. 【 Supporting Various Leak Tests: Air Leak Test / Gas Leak Test (Hydrogen Gas, Helium Gas) 】 We develop, manufacture, and sell leak testing equipment to inspect airtightness and sealing properties. We will propose the appropriate testers and devices for each inspection target. 【 Target Industries and Examples of Inspection Targets 】 - Automotive Industry: Engines, FC components, valves and piping, various parts - Electronic Components Industry: Smartphones, keyless switches, various small sensors - Pharmaceuticals / Food / Cosmetics Industry: Bottle containers, syringes, vials, eye drop containers, pillow packaging, PTP packaging We will propose the most suitable leak testers for each industry. 【 ISO Certification 】JIS Q 9001:2015 (ISO 9001:2015)

We will be closed from April 29, 2026 (Wednesday) to May 6, 2026 (Wednesday). We apologize for any inconvenience this may cause and appreciate your understanding. *Regarding inquiries made during the closure period, we will respond sequentially starting from May 7, 2026 (Thursday).

Thank you very much for your continued support. We, at Marpos Co., Ltd., regret to inform you that we will be closed during the following period. Closure Period: From Saturday, April 25, 2026, to Wednesday, May 6, 2025. Inquiries received during the closure period will be answered sequentially after Thursday, May 7. We apologize for any inconvenience this may cause and appreciate your understanding.

We would like to inform you about the business hours during the GW period, as well as order, shipping, and support services. Please download the PDF to check the schedule. ■ Regarding Orders 1) Orders can be placed at any time on the 【FOSS WEBSHOP】. Stock will be prioritized. 2) Please specify your "desired delivery date" when placing an order. 3) Due to expected high order volume and shipping delays before and after the holiday, please make your requests with ample time. ■ Regarding Customer Support For any malfunctions or issues during the holiday... Customers with maintenance contracts should contact the dedicated number for after-hours support. Other customers can reach us via email. Please provide details such as "model name," "serial number," "symptoms," and "contact person's name." Our customer support will contact you in the order of receipt. E-Mail: service@foss.co.jp