Supports high-density testing with up to 64 lanes (128 differential pairs)!
The "B6064C" is a high-density, versatile solution that supports bit error rate (BER) testing for high-speed cables compliant with PCIe 6.0 and earlier standards. Equipped with automatic link training and up to 40dB of insertion loss compensation, it is ideal for research and development, verification, and manufacturing testing of high-speed PCIe cables. It enables comprehensive system-level signal integrity verification in data center interconnects, providing essential quality assurance for cable manufacturers and system integrators. 【Key Specifications (Partial)】 ■ Test Unit: 2 x 64 Pair TRx ■ Terminal: AC Coupled ■ Supported Rates: 64GT/s, 32GT/s, 16GT/s, 8GT/s, 5GT/s, 2.5GT/s ■ Protocol Compliance: PCIe 6.0/5.0/4.0/3.0/2.0 *For more details, please download the PDF or feel free to contact us.
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【Other Main Specifications】 ■ Test Pattern: PRBS7-31 ■ Device Under Test (DUT) Type: High-speed PCIe Data Rate Cable ■ System Loss Budget: Die-to-die 40dB @ 64 GT/s (BER < 1E-6) ■ TX Equalization: 4 Tap FIR *For more details, please download the PDF or feel free to contact us.
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Our company is a supplier that provides appropriate test solutions for advanced semiconductors such as CPOs and chiplets, utilizing high-speed optical/electrical measurement technology and wafer/chip-level handling technology. We offer test solutions that can consistently support everything from research and development to mass production processes, centered around three core technologies: high-speed signal processing technology, advanced handling technology, and high-precision analog signal processing technology. As a technology partner that creates the future together with our customers, we are always providing value that is one step ahead.
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